Abstract:
A sample investigation system (ES) in functional combination with an alignment system (AS), and methodology of enabling calibration and very fast, (eg. seconds), sample height, angle-of-incidence and plane-of-incidence adjustments, with application in mapping ellipsometer or the like systems.
Abstract:
The present invention relates to a real-time PCR monitoring apparatus for real-time monitoring production of reaction product produced during the reaction while performing nucleic acid amplification such as PCR for various kinds of trace samples. Specifically, the present invention relates to an apparatus for real-time monitoring biochemical reaction for efficiently dividing interference between an excitation light and a fluorescence, which includes a polarizer, a polarizing beam splitter, a polarization converter and so on.
Abstract:
A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a detector. The PSG and the PSA have respective elements for modulating the polarization of the light beam. The elements of the PSG for modulating polarization are suitable for generating a sequence of m polarization states with m>4 at each measurement wavelength, the elements of the PSA for modulating polarization are suitable for determining a sequence of n polarization states with n>4 for each measurement wavelength, and the detector elements are suitable for acquiring a sequence of N measurements with 16
Abstract:
A moisture sensor for detecting moisture content of an object includes a light source to emit light having an infrared wavelength that is absorbed by water; an optical system to receive the light from the light source and output linearly polarized light having a first polarization direction in a direction toward the object, and to receive light scattered from the object and output linearly polarized light having a second polarization direction perpendicular to the first polarization direction in another direction other than the direction toward the object; and a photodetector to receive the linearly polarized light having the second polarization direction output from the optical system.
Abstract:
This invention relates to the manufacture of semiconductor substrates such as wafers and to a method for monitoring the state of polarization incident on a photomask in projection printing using a specially designed polarization monitoring reticle for high numerical aperture lithographic scanners. The reticle measures 25 locations across the slit and is designed for numerical apertures above 0.85. The monitors provide a large polarization dependent signal which is more sensitive to polarization. A double exposure method is also provided using two reticles where the first reticle contains the polarization monitors, clear field reference regions and low dose alignment marks. The second reticle contains the standard alignment marks and labels. For a single exposure method, a tri-PSF low dose alignment mark is used. The reticles also provide for electromagnetic bias wherein each edge is biased depending on that edge's etch depth.
Abstract:
Provided is a laser light deflection amount detecting apparatus that accurately measures deflection of the optical axis of laser light in two directions orthogonal to the optical axis.
Abstract:
An apparatus is provided for determining a target wavelength λ of a target photon beam. The apparatus includes a photon emitter, a pre-selection polarizer, a prism composed of a Faraday medium, a post-selection polarizer, a detector and an analyzer. The photon emitter projects a monochromatic light beam at the target wavelength λ substantially parallel to a magnetic field having strength B. The target wavelength is offset from established wavelength λ′ as λ=λ′+Δλ by wavelength difference of Δλ
Abstract:
The present invention provides a tool for and method of using an infrared transmission technique to extract the full stress components of the in-plane residual stresses in thin, multi crystalline silicon wafers including in situ measurement of residual stress for large cast wafers. The shear difference method is used to obtain full stress components by integrating the shear stress map from the boundaries. System ambiguity at the boundaries is resolved completely by introducing a new analytical function. A new anisotropic stress optic law is provided, and stress optic coefficients are calibrated for different crystal grain orientations and stress orientations.
Abstract:
A device for determining the volume fraction of at least one component of a multi-phase medium on the basis of the running time of an electromagnetic desired signal emitted in the multi-phase medium, having at least one emitting device for emitting the desired signal into the multi-phase medium, having at least one receiving device for receiving the desired signal, and having an evaluation device for determining the running time of the desired signal between the emitting device and the receiving device, and at least one polarization device arranged between the emitting device and the receiving device. The desired signal is emitted at least indirectly from the emitting device through the multi-phase medium to the polarization device, the polarization device influences the polarization of the desired signal and the polarization-influenced desired signal is emitted at least indirectly from the polarization device to the receiving device which receives it.
Abstract:
Measurement of the rotating angle of two objects rotating in relation to each other is achieved with a transmitter assigned to one of the objects. The transmitter emits light that is either polarized or becomes polarized by means of a polarization filter, and with a polarization-sensitive polarizer such that the transmitter and the polarizer rotate relative to each other as dependent on the rotating angle. A receiver measures the luminosity of light passing through the polarizer in order to create a signal that is dependent on the rotating angle, and where the receiver has at least two receiver elements which detect light of differing polarization.