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公开(公告)号:US20160380150A1
公开(公告)日:2016-12-29
申请号:US15257316
申请日:2016-09-06
Applicant: Sensor Electronic Technology, Inc.
Inventor: Remigijus Gaska , Maxim S. Shatalov , Michael Shur , Alexander Dobrinsky
CPC classification number: H01L33/06 , B82Y20/00 , H01L33/0025 , H01L33/0075 , H01L33/04 , H01L33/10 , H01L33/145 , H01L33/22 , H01L33/32 , H01L33/38 , H01L33/385 , H01L33/405 , H01L33/46 , H01L2933/0058
Abstract: A method of fabricating a light emitting diode, which includes an n-type contact layer and a light generating structure adjacent to the n-type contact layer, is provided. The light generating structure includes a set of quantum wells. The contact layer and light generating structure can be configured so that a difference between an energy of the n-type contact layer and an electron ground state energy of a quantum well is greater than an energy of a polar optical phonon in a material of the light generating structure. Additionally, the light generating structure can be configured so that its width is comparable to a mean free path for emission of a polar optical phonon by an electron injected into the light generating structure.
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公开(公告)号:US20160359031A1
公开(公告)日:2016-12-08
申请号:US15137772
申请日:2016-04-25
Applicant: Sensor Electronic Technology, Inc.
Inventor: Grigory Simin , Michael Shur , Remigijus Gaska
IPC: H01L29/778 , H01L29/205 , H01L29/20 , H01L29/06 , H01L23/66
CPC classification number: H01L29/7787 , H01H59/0009 , H01H2001/0078 , H01L23/66 , H01L27/0605 , H01L29/0692 , H01L29/2003 , H01L29/205 , H01L29/8605 , H01L2223/6627 , H01L2924/0002 , H01L2924/12044 , H01L2924/19032 , H01L2924/19051 , H01L2924/3011 , H01P1/15 , H01L2924/00
Abstract: A switch includes an input contact and an output contact to a conducting channel. At least one of the input and output contacts is capacitively coupled to the conducting channel. A control contact is located outside of a region between the input and output contacts, and can be used to adjust the switch between on and off operating states. The switch can be implemented as a radio frequency switch in a circuit.
Abstract translation: 开关包括输入触点和与导电通道的输出触点。 输入和输出触点中的至少一个电容耦合到导电沟道。 控制触点位于输入和输出触点之间的区域之外,可用于在开关状态之间调整开关。 该开关可以实现为电路中的射频开关。
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公开(公告)号:US09437774B2
公开(公告)日:2016-09-06
申请号:US14935988
申请日:2015-11-09
Applicant: Sensor Electronic Technology, Inc.
Inventor: Remigijus Gaska , Maxim S. Shatalov , Michael Shur , Alexander Dobrinsky
IPC: H01L33/06 , H01L33/32 , H01L33/04 , H01L33/10 , G06F17/50 , H01L33/00 , H01L33/14 , H01L33/46 , H01L33/22 , H01L33/38 , H01L33/40
CPC classification number: H01L33/06 , G06F17/5068 , H01L33/0025 , H01L33/0075 , H01L33/04 , H01L33/10 , H01L33/145 , H01L33/22 , H01L33/32 , H01L33/38 , H01L33/385 , H01L33/405 , H01L33/46 , H01L2933/0058
Abstract: A method of fabricating a light emitting diode, which includes an n-type contact layer and a light generating structure adjacent to the n-type contact layer, is provided. The light generating structure includes a set of quantum wells. The contact layer and light generating structure can be configured so that a difference between an energy of the n-type contact layer and an electron ground state energy of a quantum well is greater than an energy of a polar optical phonon in a material of the light generating structure. Additionally, the light generating structure can be configured so that its width is comparable to a mean free path for emission of a polar optical phonon by an electron injected into the light generating structure.
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公开(公告)号:US09406840B2
公开(公告)日:2016-08-02
申请号:US14984342
申请日:2015-12-30
Applicant: Sensor Electronic Technology, Inc.
Inventor: Michael Shur , Rakesh Jain , Maxim S. Shatalov , Alexander Dobrinsky , Jinwei Yang , Remigijus Gaska , Mikhail Gaevski
CPC classification number: H01L33/06 , H01L33/007 , H01L33/18 , H01L33/30 , H01L33/32 , H01L33/382 , H01L2224/14 , H01L2933/0016 , H01S5/3209 , H01S5/3413 , H01S5/34333
Abstract: A device comprising a semiconductor layer including a plurality of compositional inhomogeneous regions is provided. The difference between an average band gap for the plurality of compositional inhomogeneous regions and an average band gap for a remaining portion of the semiconductor layer can be at least thermal energy. Additionally, a characteristic size of the plurality of compositional inhomogeneous regions can be smaller than an inverse of a dislocation density for the semiconductor layer.
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公开(公告)号:US09397260B2
公开(公告)日:2016-07-19
申请号:US13647885
申请日:2012-10-09
Applicant: Sensor Electronic Technology, Inc.
Inventor: Rakesh Jain , Wenhong Sun , Jinwei Yang , Maxim S. Shatalov , Alexander Dobrinsky , Michael Shur , Remigijus Gaska
IPC: H01L27/15 , H01L31/072 , H01L33/22 , H01L33/12 , H01L33/32 , H01L21/02 , H01L29/66 , H01L29/20 , H01L29/34 , H01L29/778 , H01L33/24
CPC classification number: H01L33/22 , H01L21/0242 , H01L21/0243 , H01L21/02458 , H01L21/0254 , H01L21/02639 , H01L21/0265 , H01L21/02658 , H01L29/2003 , H01L29/205 , H01L29/34 , H01L29/66462 , H01L29/778 , H01L29/7787 , H01L33/007 , H01L33/06 , H01L33/10 , H01L33/12 , H01L33/24 , H01L33/32 , H01L2933/0091
Abstract: A device having a layer with a patterned surface for improving the growth of semiconductor layers, such as group III nitride-based semiconductor layers with a high concentration of aluminum, is provided. The patterned surface can include a substantially flat top surface and a plurality of stress reducing regions, such as openings. The substantially flat top surface can have a root mean square roughness less than approximately 0.5 nanometers, and the stress reducing regions can have a characteristic size between approximately 0.1 microns and approximately five microns and a depth of at least 0.2 microns. A layer of group-III nitride material can be grown on the first layer and have a thickness at least twice the characteristic size of the stress reducing regions.
Abstract translation: 提供具有具有用于改善半导体层的生长的图案化表面的层的器件,例如具有高浓度铝的III族氮化物基半导体层。 图案化表面可以包括基本上平坦的顶表面和多个减压区域,例如开口。 基本上平坦的顶表面可以具有小于约0.5纳米的均方根粗糙度,并且应力减小区域可以具有在约0.1微米至约5微米之间的特征尺寸和至少0.2微米的深度。 III族氮化物材料层可以在第一层上生长并且具有至少是应力减小区域的特征尺寸的两倍的厚度。
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公开(公告)号:US09349848B2
公开(公告)日:2016-05-24
申请号:US14082998
申请日:2013-11-18
Applicant: Sensor Electronic Technology, Inc.
Inventor: Grigory Simin , Michael Shur , Remigijus Gaska
IPC: H01L29/06 , H01L29/772 , H01L23/66 , H01L27/06 , H01L29/8605 , H01P1/15 , H01H59/00 , H01H1/00 , H01L29/20
CPC classification number: H01L29/772 , H01H59/0009 , H01H2001/0078 , H01L23/66 , H01L27/0605 , H01L29/0692 , H01L29/2003 , H01L29/8605 , H01L2223/6627 , H01L2924/0002 , H01L2924/12044 , H01L2924/19032 , H01L2924/19051 , H01L2924/3011 , H01P1/15 , H01L2924/00
Abstract: A switch includes an input contact and an output contact to a conducting channel. At least one of the input and output contacts is capacitively coupled to the conducting channel. A control contact is located outside of a region between the input and output contacts, and can be used to adjust the switch between on and off operating states. The switch can be implemented as a radio frequency switch in a circuit.
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公开(公告)号:US09337387B2
公开(公告)日:2016-05-10
申请号:US14297656
申请日:2014-06-06
Applicant: Sensor Electronic Technology, Inc.
Inventor: Maxim S. Shatalov , Alexander Dobrinsky , Michael Shur , Remigijus Gaska
CPC classification number: H01L33/22 , F21V5/002 , G06F17/5009 , G06F17/5045 , H01L33/007 , H01L33/10 , H01L33/20 , H01L2933/0058 , H01L2933/0083 , Y10T29/49
Abstract: A profiled surface for improving the propagation of radiation through an interface is provided. The profiled surface includes a set of large roughness components providing a first variation of the profiled surface having a characteristic scale approximately an order of magnitude larger than a target wavelength of the radiation. The set of large roughness components can include a series of truncated shapes. The profiled surface also includes a set of small roughness components superimposed on the set of large roughness components and providing a second variation of the profiled surface having a characteristic scale on the order of the target wavelength of the radiation.
Abstract translation: 提供了用于改善辐射通过界面的传播的异型表面。 成形表面包括一组大的粗糙度部件,其提供成型表面的第一变化,其特征标度比辐射的目标波长大大大大约一个数量级。 该组粗糙度较大的部件可包括一系列截头形状。 成形表面还包括一组小的粗糙度部件,叠加在该组粗糙度较大的部件上,并提供具有辐射目标波长级的特征刻度的成型表面的第二变型。
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公开(公告)号:US09330906B2
公开(公告)日:2016-05-03
申请号:US14266900
申请日:2014-05-01
Applicant: Sensor Electronic Technology, Inc.
Inventor: Maxim S. Shatalov , Jinwei Yang , Wenhong Sun , Rakesh Jain , Michael Shur , Remigijus Gaska
CPC classification number: H01L29/158 , H01L21/0237 , H01L21/02458 , H01L21/02505 , H01L21/02507 , H01L21/02513 , H01L21/0254 , H01L21/0262 , H01L21/02639 , H01L21/0265 , H01L29/0657 , H01L29/2003 , H01L29/205 , H01L33/007 , H01L33/12
Abstract: A semiconductor structure, such as a group III nitride-based semiconductor structure is provided. The semiconductor structure includes a cavity containing semiconductor layer. The cavity containing semiconductor layer can have a thickness greater than two monolayers and a multiple cavities. The cavities can have a characteristic size of at least one nanometer and a characteristic separation of at least five nanometers.
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公开(公告)号:US20160118531A1
公开(公告)日:2016-04-28
申请号:US14944538
申请日:2015-11-18
Applicant: Sensor Electronic Technology, Inc.
Inventor: Rakesh Jain , Maxim S. Shatalov , Jinwei Yang , Alexander Dobrinsky , Michael Shur , Remigijus Gaska
CPC classification number: H01L33/002 , H01L31/022408 , H01L31/035236 , H01L31/105 , H01L33/0062 , H01L33/025 , H01L33/04 , H01L33/145 , H01L33/32 , H01L2933/0008
Abstract: An improved heterostructure for an optoelectronic device is provided. The heterostructure includes an active region, an electron blocking layer, and a p-type contact layer. The p-type contact layer and electron blocking layer can be doped with a p-type dopant. The dopant concentration for the electron blocking layer can be at most ten percent the dopant concentration of the p-type contact layer. A method of designing such a heterostructure is also described.
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公开(公告)号:US09312347B2
公开(公告)日:2016-04-12
申请号:US14576310
申请日:2014-12-19
Applicant: Sensor Electronic Technology, Inc.
Inventor: Grigory Simin , Michael Shur , Remigijus Gaska
IPC: H01L29/02 , H01L29/40 , H01L29/417 , H01L29/423 , H01L29/778 , H01L29/872 , H01L29/06 , H01L29/20
CPC classification number: H01L29/404 , H01L29/0619 , H01L29/2003 , H01L29/405 , H01L29/41725 , H01L29/42368 , H01L29/7786 , H01L29/872
Abstract: A circuit including a semiconductor device having a set of space-charge control electrodes is provided. The set of space-charge control electrodes is located between a first terminal, such as a gate or a cathode, and a second terminal, such as a drain or an anode, of the device. The circuit includes a biasing network, which supplies an individual bias voltage to each of the set of space-charge control electrodes. The bias voltage for each space-charge control electrode can be: selected based on the bias voltages of each of the terminals and a location of the space-charge control electrode relative to the terminals and/or configured to deplete a region of the channel under the corresponding space-charge control electrode at an operating voltage applied to the second terminal.
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