公开(公告)号：US07364696B1

公开(公告)日：2008-04-29

申请号：US11469934

申请日：2006-09-05

Applicant: Armen P. Sarvazyan

Inventor： Armen P. Sarvazyan

IPC: B01L3/00 ,  G01N21/00

CPC classification number: G01N21/27 ,  G01N21/21 ,  G01N21/272 ,  G01N21/33 ,  G01N21/35 ,  G01N21/64 ,  G01N2201/0627 ,  G01N2201/0634

Abstract: Disclosed devices and methods for droplet microchromatograhy are aimed at optical monitoring and rapid analysis of a drying droplet. The device includes droplet deposition component preferably made as a modified disk adapted to fit in a modified CD disk drive, an optical recorder, and a computer control and image analysis. Recorded timed sequence of images of the process of drying of the droplet is digitally filtered and analyzed using windows selected in each image. Changes of predetermined parameters in each window for each image are calculated to assess temporal and spatial dynamics within the sequence of images reflecting sedimentary pattern formation of a drying droplet. Humidity can be selectively controlled to slow down the drying process allowing “zooming” onto the critical periods of drying of the droplet. Various chemical coatings of the deposition means can be used to enhance the test further. If used with biological fluids, the devices and methods of the invention can provide for rapid diagnosis of a variety of conditions and diseases.

Abstract translation: 用于液滴微量色谱的公开的装置和方法旨在光学监测和快速分析干燥液滴。 该装置包括液滴沉积部件，优选地制成为适于装配在改进的CD盘驱动器，光学记录器以及计算机控制和图像分析中的修改盘。 使用在每个图像中选择的窗口数字滤波和分析干燥液滴的图像的记录的定时序列。 计算每个图像的每个窗口中的预定参数的变化，以评估反映沉积图案形成干燥液滴的图像序列内的时间和空间动力学。 可以选择性地控制湿度以减缓干燥过程，从而允许“放大”到液滴干燥的关键时期。 可以使用沉积装置的各种化学涂层来进一步增强试验。 如果与生物流体一起使用，本发明的装置和方法可以提供各种条件和疾病的快速诊断。

公开(公告)号：US07289646B2

公开(公告)日：2007-10-30

申请号：US10861076

申请日：2004-06-04

Applicant: Ed Hirahara ,  Paul Spencer

Inventor： Ed Hirahara ,  Paul Spencer

IPC: G06K9/00

CPC classification number: G02B27/022 ,  A01H4/006 ,  G01N21/84 ,  G01N2021/177 ,  G01N2021/8466 ,  G01N2201/0634

Abstract: The invention provides a method and system for simultaneously imaging multiple views of a plant embryo. First, the method provides a camera for receiving a first view of a plant embryo (e.g., the top view). Second, the method provides a first reflecting surface for receiving and reflecting a second view of the plant embryo (e.g., the side view) toward the camera. Thus, the method permits simultaneously imaging both the first and second views of the plant embryo. In one embodiment, the method further provides a second reflecting surface for receiving and reflecting a third view (e.g., the end view) of the plant embryo toward the camera, so that the camera can simultaneously image the first, second, and third views of the plant embryo. The invention reduces the time required to obtain multiple views of an embryo, which can then be analyzed to classify the embryos according to their germination vigor.

Abstract translation: 本发明提供了一种用于同时成像植物胚胎多个视图的方法和系统。 首先，该方法提供用于接收植物胚胎的第一视图（例如，顶视图）的照相机。 第二，该方法提供了第一反射表面，用于接收并反射植物胚胎的第二视图（例如，侧视图）朝向照相机。 因此，该方法允许同时成像植物胚胎的第一和第二视图。 在一个实施例中，该方法还提供了一个第二反射表面，用于接收和反射植物胚胎朝向相机的第三视图（例如，端视图），使得相机可以同时成像第一，第二和第三视图 植物胚胎。 本发明减少获得胚胎多次视图所需的时间，然后可以根据其发芽势对胚胎进行分类分类。

公开(公告)号：US07289211B1

公开(公告)日：2007-10-30

申请号：US11103726

申请日：2005-04-11

Applicant: Joseph T. Walsh, Jr. ,  Paul Wu

Inventor： Joseph T. Walsh, Jr. ,  Paul Wu

IPC: G01J4/00

CPC classification number: G01J4/04 ,  A61B5/0086 ,  A61B5/4325 ,  A61B5/444 ,  A61B5/4519 ,  A61B5/4533 ,  G01N21/21 ,  G01N2201/0634

Abstract: A method of visually quantifying a test material along with an imaging apparatus for practicing the method is disclosed. The method comprises: (a) illuminating the test material at a known angle of incidence with diffuse light of a known and adjustable polarization state; (b) receiving light from the test material with a polarization state modified by the test material; (c) measuring an intensity of the polarization components of the received light for each illuminated pixel substantially simultaneously; (d) calculating the Stokes Vector in two dimensions for each illuminated pixel; and (e) creating an image map for the known polarization state. The method may also include adjusting the known polarization or the incident angle of the diffuse light to create additional image maps. The method and apparatus are intended for use in medical imaging including minimally invasive surgery.

Abstract translation: 公开了一种视觉量化测试材料以及用于实施该方法的成像设备的方法。 该方法包括：（a）以已知和可调偏振状态的漫射光以已知的入射角照射测试材料; （b）以测试材料改性的极化状态接收来自测试材料的光; （c）基本上同时测量每个照明像素的接收光的偏振分量的强度; （d）为每个照明像素计算二维的斯托克斯矢量; 和（e）创建已知偏振状态的图像映射。 该方法还可以包括调整漫射光的已知偏振或入射角以产生附加的图像映射。 该方法和装置旨在用于包括微创手术在内的医学成像。

公开(公告)号：US20070178012A1

公开(公告)日：2007-08-02

申请号：US11488901

申请日：2006-07-18

Applicant: Anthony Ferrante ,  David Rosen ,  R. Daniel Ferguson

Inventor： Anthony Ferrante ,  David Rosen ,  R. Daniel Ferguson

IPC: G01N21/00

CPC classification number: G01N21/253 ,  B01L3/5085 ,  B01L9/523 ,  B01L2300/0654 ,  B01L2300/0829 ,  B01L2300/0851 ,  G01N21/0303 ,  G01N21/55 ,  G01N21/6428 ,  G01N21/6452 ,  G01N21/6458 ,  G01N2021/0382 ,  G01N2201/0634

Abstract: Methods and apparatus for imaging a sample using a microwell array are provided. The methods and apparatus allow side view imaging of a sample to acquire fluorescence or bright field images.

Abstract translation: 提供了使用微孔阵列成像样品的方法和装置。 所述方法和装置允许样品的侧视图成像以获取荧光或明场图像。

公开(公告)号：US07227166B2

公开(公告)日：2007-06-05

申请号：US10970780

申请日：2004-10-21

Applicant: Don W. Cochran ,  Dennis S. Bradley ,  Steven D. Cech ,  Frederick F. Awig, II ,  Terry L. Graves ,  Thomas H. Palombo ,  Michael L. Yoder

Inventor： Don W. Cochran ,  Dennis S. Bradley ,  Steven D. Cech ,  Frederick F. Awig, II ,  Terry L. Graves ,  Thomas H. Palombo ,  Michael L. Yoder

IPC: G01N21/88 ,  G01N21/90 ,  G01N21/00

CPC classification number: G01N21/909 ,  G01N21/8806 ,  G01N21/9036 ,  G01N2201/0634

Abstract: This application relates to an apparatus and method for automated inspection of formed metal containers. More specifically, it pertains to the use of machine vision systems to identify and correlate manufacturing defects occurring in formed food and beverage containers to specific manufacturing paths or sources of origin (e.g., body makers) used in the container forming process. The disclosed invention is enabled by the placement of a machine-readable code on specific portions of the can body during the forming process and the use of machine vision reading techniques.

Abstract translation: 本申请涉及用于形成的金属容器的自动检查的装置和方法。 更具体地说，它涉及使用机器视觉系统来识别并将形成的食品和饮料容器中出现的制造缺陷与在容器成型过程中使用的具体制造路径或原始来源（例如身体制造者）相关联。 所公开的发明是通过在机器视觉阅读技术的成形过程和机器视觉阅读技术的使用期间将机器可读代码放置在罐体的特定部分上而实现的。

公开(公告)号：US20060024746A1

公开(公告)日：2006-02-02

申请号：US10890604

申请日：2004-07-14

Applicant: Armen Sarvazyan

Inventor： Armen Sarvazyan

IPC: G01N33/53 ,  C12M1/34

CPC classification number: G01N21/27 ,  G01N21/21 ,  G01N21/272 ,  G01N21/33 ,  G01N21/35 ,  G01N21/64 ,  G01N2201/0627 ,  G01N2201/0634

Abstract: Abstract of the DisclosureDevices for optical monitoring and rapid analysis of a drying droplet are presented and include a droplet deposition means, an optical recording means, and a computer control and image analysis means. In several preferred embodiments, a pipette is used to deposit one or more droplets in parallel onto a slide, a plate or a film, and a digital microscope is positioned either above or below the droplet to record a timed sequence of images of the process of drying thereof. Various chemical compounds coating the deposition slide can be used to enhance the test further. Image analysis includes data filtering, dividing the image into a plurality of overlapping windows, and analysis of formation and change in patterns over time. If used with biological fluids, the devices and methods of the invention can be used for rapid diagnosis of a variety of conditions and diseases.

Abstract translation: 本发明提供了用于光学监测和干燥液滴的快速分析的装置，包括液滴沉积装置，光学记录装置以及计算机控制和图像分析装置。 在几个优选实施例中，移液管被用于平行地将一个或多个液滴沉积在载玻片，板或膜上，并且数字显微镜位于液滴的上方或下方，以记录图像的定时序列 干燥。 可以使用涂覆沉积载玻片的各种化合物进一步增强测试。 图像分析包括数据过滤，将图像划分为多个重叠窗口，以及随着时间的推移形成和模式变化的分析。 如果与生物流体一起使用，本发明的装置和方法可以用于各种病症和疾病的快速诊断。

公开(公告)号：US20040263957A1

公开(公告)日：2004-12-30

申请号：US10861076

申请日：2004-06-04

Inventor： Edwin Hirahara ,  Paul Roger Spencer

IPC: G02B021/18

CPC classification number: G02B27/022 ,  A01H4/006 ,  G01N21/84 ,  G01N2021/177 ,  G01N2021/8466 ,  G01N2201/0634

Abstract: The invention provides a method and system for simultaneously imaging multiple views of a plant embryo. First, the method provides a camera for receiving a first view of a plant embryo (e.g., the top view). Second, the method provides a first reflecting surface for receiving and reflecting a second view of the plant embryo (e.g., the side view) toward the camera. Thus, the method permits simultaneously imaging both the first and second views of the plant embryo. In one embodiment, the method further provides a second reflecting surface for receiving and reflecting a third view (e.g., the end view) of the plant embryo toward the camera, so that the camera can simultaneously image the first, second, and third views of the plant embryo. The invention reduces the time required to obtain multiple views of an embryo, which can then be analyzed to classify the embryos according to their germination vigor.

公开(公告)号：US20040223149A1

公开(公告)日：2004-11-11

申请号：US10811094

申请日：2004-03-26

Inventor： Thomas J. Skierski ,  Thomas L. Cope

IPC: G01J003/42

CPC classification number: G01J3/46 ,  G01J3/0251 ,  G01J2003/466 ,  G01N21/251 ,  G01N21/274 ,  G01N21/474 ,  G01N33/46 ,  G01N2021/8416 ,  G01N2201/0634 ,  G01N2201/065

Abstract: A method of verifying the color and tinting strength of a manufactured batch of a semi-transparent wood stain. In accordance with the method, a standard batch of the wood stain is formed and then mixed with a specified amount of a white colorant to form a standard measurement batch. A test sample of the manufactured batch is obtained and is also mixed with a specified amount of the white colorant to form a test measurement sample. Layers of the standard measurement batch and the test measurement sample are formed on the substrates and complete hide obtained. Reflectance measurements of the layers are made using a spectrophotometer. The reflectance measurements are used to determine if the color and the tinting strength of the manufactured batch is within an acceptable deviation range of the color and tinting strength of the standard batch. This allows for objective color difference and tint strength difference calculations, and adjustments can be made therefrom, therefore eliminating the past visual trial and error methods.

Abstract translation: 一种验证制造的半透明木纹的批次的颜色和着色强度的方法。 根据该方法，形成标准批次的木纹，然后与指定量的白色着色剂混合以形成标准测量批料。 获得制造的批次的测试样品，并将其与指定量的白色着色剂混合以形成测试测量样品。 在基板上形成标准测量批次和测试测量样品的层，并获得完整的隐藏。 层的反射率测量使用分光光度计进行。 使用反射率测量来确定制造的批次的颜色和着色强度是否在标准批次的颜色和着色强度的可接受的偏差范围内。 这允许目标色差和色调强度差计算，并且可以进行调整，从而消除过去的视觉试验和误差方法。

公开(公告)号：US20040075837A1

公开(公告)日：2004-04-22

申请号：US10686584

申请日：2003-10-17

Inventor： Shunji Maeda ,  Yasuhiko Nakayama ,  Minoru Yoshida ,  Hitoshi Kubota ,  Kenji Oka

IPC: G01B011/00

CPC classification number: G01N21/8806 ,  G01N21/9501 ,  G01N21/956 ,  G01N21/95607 ,  G01N2021/95615 ,  G01N2201/0618 ,  G01N2201/0634

Abstract: A pattern detection method and apparatus thereof for inspecting with high resolution a micro fine defect of a pattern on an inspected object and a semiconductor substrate manufacturing method and system for manufacturing semiconductor substrates such as semiconductor wafers with a high yield. A micro fine pattern on the inspected object is inspected by irradiating an annular-looped illumination through an objective lens onto a wafer mounted on a stage, the wafer having micro fine patterns thereon. The illumination light may be circularly or elliptically polarized and controlled according to an image detected on the pupil of the objective lens and image signals are obtained by detecting a reflected light from the wafer. The image signals are compared with reference image signals and a part of the pattern showing inconsistency is detected as a defect so that simultaneously, a micro fine defect or defects on the micro fine pattern are detected with high resolution. Further, process conditions of a manufacturing line are controlled by analyzing a cause of defect and a factor of defect which occurs on the pattern.

Abstract translation: 一种用于以高分辨率检查被检查物体上的图案的微细缺陷的图案检测方法及其装置以及以高产率制造半导体晶片等半导体基板的半导体基板的制造方法和系统。 通过将通过物镜的环形照明照射到安装在台架上的晶片上，检查被检查物体上的微细图案，晶片上具有微细精细图案。 照明光可以根据在物镜的光瞳上检测到的图像而被圆形或椭圆偏振并且被控制，并且通过检测来自晶片的反射光来获得图像信号。 将图像信号与参考图像信号进行比较，并且检测出显示不一致的图案的一部分作为缺陷，从而同时以高分辨率检测微细微图案或微细图案上的缺陷。 此外，通过分析缺陷的原因和在图案上发生的缺陷因素来控制生产线的工艺条件。

公开(公告)号：US20020154303A1

公开(公告)日：2002-10-24

申请号：US10098478

申请日：2002-03-18

Inventor： Shunji Maeda ,  Yasuhiko Nakayama ,  Minoru Yoshida ,  Hitoshi Kubota ,  Kenji Oka

IPC: G01N021/88

CPC classification number: G01N21/8806 ,  G01N21/9501 ,  G01N21/956 ,  G01N21/95607 ,  G01N2021/95615 ,  G01N2201/0618 ,  G01N2201/0634

Abstract: A pattern detection method and apparatus thereof for inspecting with high resolution a micro fine defect of a pattern on an inspected object and a semiconductor substrate manufacturing method and system for manufacturing semiconductor substrates such as semiconductor wafers with a high yield. A micro fine pattern on the inspected object is inspected by irradiating an annular-looped illumination through an objective lens onto a wafer mounted on a stage, the wafer having micro fine patterns thereon. The illumination light may be circularly or elliptically polarized and controlled according to an image detected on the pupil of the objective lens and image signals are obtained by detecting a reflected light from the wafer. The image signals are compared with reference image signals and a part of the pattern showing inconsistency is detected as a defect so that simultaneously, a micro fine defect or defects on the micro fine pattern are detected with high resolution. Further, process conditions of a manufacturing line are controlled by analyzing a cause of defect and a factor of defect which occurs on the pattern.

Abstract translation: 一种用于以高分辨率检查被检查物体上的图案的微细缺陷的图案检测方法及其装置以及以高产率制造半导体晶片等半导体基板的半导体基板的制造方法和系统。 通过将通过物镜的环形照明照射到安装在台架上的晶片上，检查被检查物体上的微细图案，晶片上具有微细精细图案。 照明光可以根据在物镜的光瞳上检测到的图像而被圆形或椭圆偏振并且被控制，并且通过检测来自晶片的反射光来获得图像信号。 将图像信号与参考图像信号进行比较，并且检测出显示不一致的图案的一部分作为缺陷，从而同时以高分辨率检测微细微图案或微细图案上的缺陷。 此外，通过分析缺陷的原因和在图案上发生的缺陷因素来控制生产线的工艺条件。