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    OPTICAL MODULE, METHOD FOR MANUFACTURING OPTICAL MODULE, AND OPTICAL TRANSCEIVER
    152.
    发明申请
    OPTICAL MODULE, METHOD FOR MANUFACTURING OPTICAL MODULE, AND OPTICAL TRANSCEIVER 有权
    光学模块，制造光学模块的方法和光学收发器

    公开(公告)号：US20150212285A1

    公开(公告)日：2015-07-30

    申请号：US14553478

    申请日：2014-11-25

    Applicant: FUJITSU LIMITED

    Inventor： Norio Kainuma ,  Takashi Kubota

    IPC: G02B6/42 ,  G02B6/43 ,  G02B6/13 ,  G01J1/04

    CPC classification number: G01J1/0407 ,  G01J1/0204 ,  G01J1/0252 ,  G01J1/0411 ,  G01J1/0414 ,  G02B6/4204 ,  G02B6/4212 ,  G02B6/4214 ,  G02B6/428

    Abstract: An optical module comprising: an optical waveguide transports light, the optical waveguide including a first mirror which reflects first light; an adhesive sheet formed over the optical waveguide, the adhesive sheet including a first gap above the first mirror; a first light-transmissive layer formed in the first gap; a lens sheet arranged over the adhesive sheet, the lens sheet including a first lens which is formed above the first light-transmissive layer; and a light-emitting device formed above the lens sheet, the light-emitting device including a light-emitting portion which emits the first light to the first lens.

    Abstract translation: 一种光学模块，包括：光波导传输光，所述光波导包括反射第一光的第一反射镜; 在所述光波导上形成的粘合片，所述粘合片包括在所述第一反射镜上方的第一间隙; 形成在第一间隙中的第一透光层; 透镜片，布置在所述粘合片上，所述透镜片包括形成在所述第一透光层上方的第一透镜; 以及形成在所述透镜片的上方的发光装置，所述发光装置包括向所述第一透镜发射所述第一光的发光部。

    Electromagnetic interference protection structure
    154.
    发明授权
    Electromagnetic interference protection structure 有权
    电磁干扰保护结构

    公开(公告)号：US08895925B2

    公开(公告)日：2014-11-25

    申请号：US13404277

    申请日：2012-02-24

    Applicant: Abbas Torabi

    Inventor： Abbas Torabi

    IPC: G01J5/20

    CPC classification number: G01J5/06 ,  G01J1/0209 ,  G01J1/0252 ,  G01J1/0488 ,  G01J5/022 ,  G01J5/0285 ,  G01J5/046 ,  G01J5/0862 ,  G01J5/20 ,  G01J2001/448 ,  G01J2005/0077 ,  G01J2005/202 ,  H01L27/14621 ,  H01L27/14649

    Abstract: A detector structure having a sensor for detecting energy impinging on the structure in the infrared and/or optical frequency band; an electronics section disposed behind the sensor for processing electrical signal produced by the sensor in response to the sensor detecting the infrared and/or optical energy; and an electrically conductive layer for inhibiting electromagnetic energy outside of the visible and infrared portions of the spectrum, such electrically conductive layer being disposed between impinging energy and the electronics section, such layer having a transmissivity greater than 90 percent in the visible and infrared portions of the spectrum and being reflective and/or dissipative to portions of the impinging energy outside of the visible and infrared portions of the spectrum. In one embodiment an electrically conductive layer having a substantially constant absorptivity to electromagnetic energy within the visible and infrared portions of the spectrum. In one embodiment, the layer is graphene.

    Abstract translation: 一种检测器结构，具有用于检测冲击在红外线和/或光频带中的结构的能量的传感器; 设置在所述传感器后面的电子部件，用于响应于所述传感器检测所述红外线和/或光能量而处理由所述传感器产生的电信号; 以及用于在光谱的可见光和红外部分之外抑制电磁能的导电层，这种导电层设置在入射能量和电子部分之间，这样的透光率在可见光和红外部分中的透射率大于90％ 光谱并且对于光谱的可见光和红外部分之外的部分冲击能量是反射和/或耗散的。 在一个实施例中，导电层具有对光谱的可见光和红外部分内的电磁能的基本上恒定的吸收性。 在一个实施例中，该层是石墨烯。

    METHOD FOR CORRECTING FOR DARK CURRENT VARIATION IN TEC COOLED PHOTODIODES
    155.
    发明申请
    METHOD FOR CORRECTING FOR DARK CURRENT VARIATION IN TEC COOLED PHOTODIODES 有权
    用于校正TEC冷却光​​刻体中的暗电流变化的方法

    公开(公告)号：US20140240698A1

    公开(公告)日：2014-08-28

    申请号：US14186549

    申请日：2014-02-21

    Applicant: Chris Wagner ,  James Kirby Goulet

    Inventor： Chris Wagner ,  James Kirby Goulet

    IPC: G01J1/42

    CPC classification number: G01J1/4257 ,  G01J1/0228 ,  G01J1/0252 ,  G01J1/44

    Abstract: An optical power meter including a photodiode having a surface for receiving a beam of light, a thermo-electric cooler for maintaining the photodiode at a predetermined temperature, and a current monitor for measuring a drive current passing through the thermo-electric cooler allows dark current drift arising from a varying thermal gradient across the active region of the photodiode to be corrected, thus improving stability of the optical power meter. More specifically, by monitoring the TEC drive current, and applying a correction factor to the optical power readings, the stability of optical power readings is improved by an order of magnitude.

    Abstract translation: 一种光功率计，包括具有用于接收光束的表面的光电二极管，用于将光电二极管保持在预定温度的热电冷却器，以及用于测量通过热电冷却器的驱动电流的电流监视器，允许暗电流 由于要校正的光电二极管的有源区域的不同热梯度产生漂移，从而提高了光功率计的稳定性。 更具体地，通过监视TEC驱动电流，并对光功率读数应用校正因子，光功率读数的稳定性提高了一个数量级。

    FRICTION AND WEAR REDUCTION IN CRYOGENIC MECHANISMS AND OTHER SYSTEMS
    156.
    发明申请
    FRICTION AND WEAR REDUCTION IN CRYOGENIC MECHANISMS AND OTHER SYSTEMS 审中-公开
    低温机械和其他系统的摩擦和磨损减少

    公开(公告)号：US20140126848A1

    公开(公告)日：2014-05-08

    申请号：US14071970

    申请日：2013-11-05

    Applicant: Raytheon Company

    Inventor： Daniel Vukobratovich ,  James E. Scroggin ,  Konstantine J. Christopoulos

    IPC: F16C17/04

    CPC classification number: F16C17/04 ,  C23C14/165 ,  F04B53/18 ,  F05C2201/0424 ,  F05C2201/046 ,  F05C2251/14 ,  G01J1/0252 ,  G01J1/0437 ,  G01J1/0448 ,  G01J5/046 ,  G01J5/061 ,  G01J5/0831 ,  G01J5/084 ,  G01J5/62 ,  G01J2005/623

    Abstract: An apparatus includes a first component having a first surface and a second component having a second surface. The first surface includes sputtered gold, and the second surface includes a stainless steel alloy. The first surface is configured to contact the second surface, and one of the components is configured to move against another of the components. The stainless steel alloy could consist of a UNS 21800/AISI Type S21800 metal. The sputtered gold could include ion sputtered gold, and the sputtered gold could have a thickness of about 1 micron. The first component could include a first blade of an adjustable aperture mechanism, where the adjustable aperture mechanism also includes a second blade. The second component could include a first plate of the adjustable aperture mechanism, where the adjustable aperture mechanism further includes a second plate. The blades can be configured to move within a space between the plates.

    Abstract translation: 一种装置包括具有第一表面的第一部件和具有第二表面的第二部件。 第一表面包括溅射金，第二表面包括不锈钢合金。 第一表面被配置为接触第二表面，并且其中一个部件被配置成抵靠另一个部件移动。 不锈钢合金可以由UNS 21800 / AISI S21800型金属组成。 溅射的金可以包括离子溅射的金，并且溅射的金可以具有约1微米的厚度。 第一部件可以包括可调节孔径机构的第一叶片，其中可调孔径机构还包括第二叶片。 第二部件可以包括可调节孔径机构的第一板，其中可调节孔径机构还包括第二板。 叶片可以构造成在板之间的空间内移动。

    Cryogenic Cooling Apparatuses and Systems
    157.
    发明申请
    Cryogenic Cooling Apparatuses and Systems 有权
    低温冷却装置和系统

    公开(公告)号：US20140123684A1

    公开(公告)日：2014-05-08

    申请号：US14067332

    申请日：2013-10-30

    Applicant: L-3 Communications Cincinnati Electronics Corporation

    Inventor： J. Brian Toft ,  Fred Nicol

    IPC: F25B9/00

    CPC classification number: F25D19/006 ,  G01J1/0252 ,  G01J1/0271 ,  G01J3/0286 ,  G01J3/0291 ,  G01J5/061

    Abstract: An image sensing apparatus includes a focal plane array and a cold shield thermally isolated from the focal plane array. The cryogenic cooling apparatus further includes a first cryocooler assembly comprising a first cold finger thermally coupled to the focal plane array. The first cryocooler assembly is configured to maintain a focal plane array operating temperature. The cryogenic cooling apparatus includes a second cryocooler assembly comprising a second cold finger thermally coupled to the cold shield. The second cryocooler assembly is configured to maintain a cold shield operating temperature that is different from the focal plane array operating temperature.

    Abstract translation: 图像感测装置包括焦平面阵列和与焦平面阵列热隔离的冷屏蔽。 低温冷却装置还包括第一低温冷却器组件，其包括热耦合到焦平面阵列的第一冷指。 第一低温冷却器组件被配置为保持焦平面阵列工作温度。 低温冷却装置包括第二低温冷却器组件，其包括热耦合到冷屏蔽的第二冷指。 第二低温冷却器组件被配置为保持与焦平面阵列工作温度不同的冷屏蔽操作温度。

    INSTRUMENT FOR MEASURING LED LIGHT SOURCE
    158.
    发明申请
    INSTRUMENT FOR MEASURING LED LIGHT SOURCE 审中-公开
    用于测量LED光源的仪器

    公开(公告)号：US20130307549A1

    公开(公告)日：2013-11-21

    申请号：US13851959

    申请日：2013-03-28

    Applicant: FOXCONN TECHNOLOGY CO., LTD.

    Inventor： TAY-JIAN LIU

    IPC: G01J1/02 ,  G01R31/44

    CPC classification number: G01J1/0252 ,  G01J1/0223 ,  G01J2001/4252 ,  G01R31/2635 ,  G01R31/44

    Abstract: A LED light source measuring instrument includes a shell portion and a test portion. The shell portion supports the test portion. The test portion includes a carrier plate for placing a LED light source to be tested. A conductive structure is set on the carrier plate for electrically connecting with an underside surface of the LED light source; a cooling chip is set on the carrier plate; a vacuum suction device is provided for generating a vacuum force on the test portion for securely attaching the LED light source to the carrier plate. The cooling chip is used for controlling the temperature of the LED light source within a limited range. A fan is provided for generating a cooling airflow to the LED light source. A heat sink fin extends from the carrier plate toward the fan.

    Abstract translation: LED光源测量仪器包括壳体部分和测试部分。 外壳部分支撑测试部分。 测试部分包括用于放置待测试的LED光源的载体板。 导电结构设置在载体板上，用于与LED光源的下表面电连接; 在载板上设置冷却芯片; 提供了一种真空抽吸装置，用于在测试部分上产生真空力，以将LED光源牢固地附接到承载板。 冷却芯片用于在有限的范围内控制LED光源的温度。 设置有用于产生到LED光源的冷却气流的风扇。 散热片从承载板向风扇延伸。

    Inspection machine, inspecting method and inspecting system
    159.
    发明授权
    Inspection machine, inspecting method and inspecting system 有权
    检验机，检验方法和检验制度

    公开(公告)号：US08421858B2

    公开(公告)日：2013-04-16

    申请号：US13039276

    申请日：2011-03-02

    Applicant: Hsiao-Liang Hsieh ,  Wen-Ti Lin ,  Hsiang-Cheng Hsieh

    Inventor： Hsiao-Liang Hsieh ,  Wen-Ti Lin ,  Hsiang-Cheng Hsieh

    IPC: H04N9/47 ,  G06K9/00

    CPC classification number: G01J1/0252 ,  G01J1/4228 ,  G01J2001/4252 ,  G01R31/2635 ,  G01R31/2893

    Abstract: An inspection machine capable of inspecting optical property and electrical property of a light emitting device is provided. The inspection machine includes a substrate table, a probe mechanism, a heating apparatus, a cooling apparatus, an image-sensing apparatus, a temperature-sensing apparatus and a moving mechanism. The probe mechanism is capable of moving toward the light emitting device to contact therewith. The heating apparatus is capable of heating the light emitting device within a first temperature range. The cooling apparatus is capable of cooling the light emitting device within a second temperature range. The image-sensing apparatus senses a light emitting image provided from the light emitting device. The temperature-sensing apparatus senses the present temperature of the light emitting device. The image-sensing apparatus is disposed on the moving mechanism. The moving mechanism is capable of moving the image-sensing apparatus. An inspecting method and an inspecting system for the inspection machine are also provided.

    Abstract translation: 提供了能够检查发光装置的光学特性和电气性能的检查机。 检查机包括基板台，探针机构，加热装置，冷却装置，图像感测装置，温度感测装置和移动机构。 探针机构能够向发光器件移动以与其接触。 加热装置能够在第一温度范围内加热发光装置。 冷却装置能够在第二温度范围内冷却发光装置。 图像感测装置感测从发光装置提供的发光图像。 温度感测装置感测发光装置的当前温度。 图像感测装置设置在移动机构上。 移动机构能够移动图像感测装置。 还提供了检验机的检查方法和检查系统。

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