Medical X-ray examination apparatus and method for k-edge imaging
    182.
    发明授权
    Medical X-ray examination apparatus and method for k-edge imaging 有权
    用于k边缘成像的医用X射线检查装置和方法

    公开(公告)号:US08229060B2

    公开(公告)日:2012-07-24

    申请号:US12999637

    申请日:2009-06-17

    Applicant: Roland Proksa

    Inventor: Roland Proksa

    Abstract: The present invention relates to a medical X-ray examination apparatus and method for performing k-edge imaging of an object of interest including material showing k-edge absorption. To allow the use of conventional detector technology, which does not suffer from the limitation to provide very high k-rate capabilities a method is proposed comprising the steps of: —emitting polychromatic X-ray radiation (4; 4a, 4b), —Bragg filtering said polychromatic X-ray radiation by a Bragg filter such that radiation (16) transmitted through said Bragg filter (14; 14a, 14b) passes through said object (5), —detecting X-ray radiation after passing through said object (5), —acquiring projection data at at least two different Bragg reflection angles of said Bragg filter (14; 14a, 14b), and —reconstructing a k-edge image from the acquired projection data.

    Abstract translation: 本发明涉及一种医疗X射线检查装置和方法,用于执行感兴趣对象的k边缘成像,包括显示k边缘吸收的材料。 为了允许使用常规检测器技术,其不受限于提供非常高的k率能力的方法,提出了一种方法,其包括以下步骤: - 发射多色X射线辐射(4; 4a,4b),-Bragg 通过布拉格滤波器对所述多色X射线辐射进行滤波,使得穿过所述布拉格滤波器(14; 14a,14b)的辐射(16)穿过所述物体(5), - 在穿过所述物体(5)之后检测X射线辐射 ), - 在所述布拉格滤波器(14; 14a,14b)的至少两个不同的布拉格反射角处获取投影数据,并且从所获取的投影数据重新构造k边缘图像。

    MIRROR, METHOD OF MANUFACTURING THE SAME, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
    183.
    发明申请
    MIRROR, METHOD OF MANUFACTURING THE SAME, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD 有权
    镜子,制造方法,曝光装置和装置制造方法

    公开(公告)号:US20120170012A1

    公开(公告)日:2012-07-05

    申请号:US13332582

    申请日:2011-12-21

    Abstract: A method of manufacturing a mirror includes a first step of arranging, on a substrate, a shape adjusting layer having a layer thickness which changes by heat, a second step of arranging, on the shape adjusting layer, a reflection layer including a first layer, a second layer, and a barrier layer which is arranged between the first layer and the second layer, and prevents a diffusion of a material of the first layer and a material of the second layer, and a third step of bringing a shape of the reflection layer close to a target shape by changing a layer thickness profile of the shape adjusting layer after the second step, the third step including a process of partially annealing the shape adjusting layer.

    Abstract translation: 一种制造反射镜的方法包括:在基板上布置具有由热变化的层厚度的形状调整层的第一步骤,在形状调整层上布置包括第一层的反射层的第二步骤, 第二层和布置在第一层和第二层之间的阻挡层,并且防止第一层的材料和第二层的材料的扩散,以及使反射形状的第三步骤 通过在第二步骤之后改变形状调整层的层厚度轮廓,接近目标形状的层,第三步骤包括部分退火形状调节层的过程。

    EUV Radiation Source and Method of Generating EUV Radiation
    185.
    发明申请
    EUV Radiation Source and Method of Generating EUV Radiation 有权
    EUV辐射源和产生EUV辐射的方法

    公开(公告)号:US20120154775A1

    公开(公告)日:2012-06-21

    申请号:US13168495

    申请日:2011-06-24

    CPC classification number: H05G2/008 G03F7/70033 G21K2201/064

    Abstract: An EUV radiation source comprising a fuel supply configured to deliver droplets of fuel to a plasma formation location, and a collector configured to collect EUV radiation emitted by a plasma at the plasma formation location, wherein the collector has a reflective surface that is a modified ellipsoid shape, the modified ellipsoid shape providing improved intensity uniformity of collected EUV radiation in the far field compared with a perfect ellipsoid shape.

    Abstract translation: EUV辐射源包括被配置为将血液液滴输送到等离子体形成位置的燃料供应器,以及收集器,被配置为收集由等离子体形成位置处的等离子体发射的EUV辐射,其中所述收集器具有作为修改椭圆体的反射表面 形状,与完美的椭球形状相比,改进的椭圆体形状提供了远场中收集的EUV辐射的强度均匀性的改进。

    REFLECTIVE OPTICAL ELEMENT, PROJECTION SYSTEM, AND PROJECTION EXPOSURE APPARATUS
    187.
    发明申请
    REFLECTIVE OPTICAL ELEMENT, PROJECTION SYSTEM, AND PROJECTION EXPOSURE APPARATUS 有权
    反射光学元件,投影系统和投影曝光装置

    公开(公告)号:US20110228245A1

    公开(公告)日:2011-09-22

    申请号:US13046137

    申请日:2011-03-11

    Abstract: For the use in illumination systems and projection exposure apparatuses for UV or EUV lithography, a reflective optical element is provided for a operating wavelength in the ultraviolet to extreme ultraviolet wavelength ranges. The reflective optical element includes a substrate and a reflective surface on the substrate. The multilayer system has layers of at least two alternating materials having different real parts of the refractive index at the operating wavelength. Radiation in the operating wavelength of a certain incident angle bandwidth distribution can impinge on the reflective optical element. The reflective surface includes one or more first portions, in which the layers have alternating materials of a first period thickness. The reflective surface includes one or more additional portions, in which the layers of alternating materials have a first period thickness and at least one additional period thickness. The arrangement of the first and additional portions (A2) across the reflective surface is adapted to the incident angle bandwidth distribution. Furthermore, a projection system and a projection exposure apparatus including such a reflective optical element are suggested.

    Abstract translation: 对于在用于UV或EUV光刻的照明系统和投影曝光装置中的用途,提供反射光学元件用于在紫外至极紫外波长范围内的工作波长。 反射型光学元件包括衬底和衬底上的反射表面。 多层系统具有在工作波长处具有不同实际折射率部分的至少两种交替材料的层。 一定入射角度带宽分布的工作波长的辐射可以撞击在反射光学元件上。 反射表面包括一个或多个第一部分,其中层具有第一周期厚度的交替材料。 反射表面包括一个或多个附加部分,其中交替材料层具有第一周期厚度和至少一个附加周期厚度。 穿过反射表面的第一和附加部分(A2)的布置适于入射角度带宽分布。 此外,提出了包括这种反射光学元件的投影系统和投影曝光装置。

    X-RAY REFLECTING DEVICE
    189.
    发明申请
    X-RAY REFLECTING DEVICE 有权
    X射线反射装置

    公开(公告)号:US20110110499A1

    公开(公告)日:2011-05-12

    申请号:US13008866

    申请日:2011-01-18

    CPC classification number: G21K1/067 G21K2201/062 G21K2201/064

    Abstract: Provided is a technique for X-ray reflection, such as an X-ray reflecting mirror, capable of achieving a high degree of smoothness of a reflecting surface, high focusing (reflecting) performance, stability in a curved surface shape, and a reduction in overall weight. A silicon plate (silicon wafer) is subjected to thermal plastic deformation to form an X-ray reflecting mirror having a reflecting surface with a stable curved surface shape. The silicon wafer can be deformed to any shape by applying a pressure thereto in a hydrogen atmosphere at a high temperature of about 1300° C. The silicon plate may be simultaneously subjected to hydrogen annealing to further reduce roughness of a silicon surface to thereby provide enhanced reflectance.

    Abstract translation: 提供了能够实现反射面的高度平滑度,高聚焦(反射)性能,曲面形状的稳定性以及缩小的X射线反射技术,例如X射线反射镜 总重。 硅板(硅晶片)经受热塑性变形,形成具有稳定曲面形状的反射面的X射线反射镜。 硅晶片可以通过在约1300℃的高温下在氢气氛中施加压力而变形为任何形状。硅板可以同时进行氢退火以进一步降低硅表面的粗糙度,从而提供增强的 反射率。

    GRAZING INCIDENCE COLLECTOR FOR LASER PRODUCED PLASMA SOURCES
    190.
    发明申请
    GRAZING INCIDENCE COLLECTOR FOR LASER PRODUCED PLASMA SOURCES 有权
    用于激光生产的等离子体源的光泽收集器

    公开(公告)号:US20100303199A1

    公开(公告)日:2010-12-02

    申请号:US12734829

    申请日:2009-01-28

    Abstract: Grazing incidence collectors (GICs) for extreme ultraviolet (EUV) and X-ray radiation sources, such as laser produced plasma (LPP) sources, are disclosed. Source-collector systems comprising GICs and LPP sources are also disclosed. A laser beam is directed along the collector axis to a fuel target to form the LPP source, and the collector is arranged to collect the radiation and reflect it to an intermediate focus. The collector may include one or more grazing-incidence mirrors, and these mirrors may be electroformed. lithography systems that employ the source-collector systems as disclosed herein.

    Abstract translation: 公开了用于极紫外(EUV)和X射线辐射源的掠入射收集器(GIC),例如激光产生的等离子体(LPP)源。 还公开了包括GIC和LPP源的源收集器系统。 激光束沿着收集器轴线引导到燃料靶以形成LPP源,并且收集器被布置成收集辐射并将其反射到中间焦点。 收集器可以包括一个或多个掠入射镜,并且这些反射镜可以被电铸。 使用如本文所公开的源极 - 收集器系统的光刻系统。

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