Device with aluminum surface protection
    13.
    发明授权
    Device with aluminum surface protection 有权
    具有铝表面保护的装置

    公开(公告)号:US08237231B2

    公开(公告)日:2012-08-07

    申请号:US13327992

    申请日:2011-12-16

    Abstract: A semiconductor structure with a metal gate structure includes a first type field-effect transistor having a first gate including: a high k dielectric material on a substrate, a first metal layer on the high k dielectric material layer and having a first work function, and a first aluminum layer on the first metal layer. The first aluminum layer includes an interfacial layer including aluminum, nitrogen and oxygen. The device also includes a second type field-effect transistor having a second gate including: the high k dielectric material on the substrate, a second metal layer on the high k dielectric material layer and having a second work function different from the first work function, and a second aluminum layer on the second metal layer.

    Abstract translation: 具有金属栅极结构的半导体结构包括具有第一栅极的第一型场效应晶体管,包括:基板上的高k电介质材料,高k电介质材料层上的第一金属层,具有第一功函数,以及 在第一金属层上的第一铝层。 第一铝层包括包含铝,氮和氧的界面层。 该器件还包括具有第二栅极的第二类场效应晶体管,其包括:衬底上的高k电介质材料,高k电介质材料层上的第二金属层,具有不同于第一功函数的第二功函数, 和在第二金属层上的第二铝层。

    Field-by-field laser annealing and feed forward process control
    14.
    发明授权
    Field-by-field laser annealing and feed forward process control 有权
    逐场激光退火和前馈过程控制

    公开(公告)号:US08188447B2

    公开(公告)日:2012-05-29

    申请号:US12359682

    申请日:2009-01-26

    Abstract: A method includes dividing a semiconductor wafer into a plurality of dies areas, generating a map of the semiconductor wafer, scanning each of the plurality of die areas of the semiconductor wafer with a laser, and adjusting a parameter of the laser during the scanning based on a value of the die areas identified by the map of the semiconductor wafer. The map characterizing the die areas based on a first measurement of each individual die area.

    Abstract translation: 一种方法包括将半导体晶片分成多个管芯区域,产生半导体晶片的映射图,用激光扫描半导体晶片的多个管芯区域中的每一个,并且在扫描期间调整激光器的参数,基于 由半导体晶片的映射图识别的管芯区域的值。 基于每个单个管芯区域的第一测量来描绘管芯区域的地图。

    LED DEVICE WITH IMPROVED THERMAL PERFORMANCE
    15.
    发明申请
    LED DEVICE WITH IMPROVED THERMAL PERFORMANCE 有权
    具有改进的热性能的LED器件

    公开(公告)号:US20120119228A1

    公开(公告)日:2012-05-17

    申请号:US12944895

    申请日:2010-11-12

    Abstract: An apparatus includes a wafer with a number of openings therein. For each opening, an LED device is coupled to a conductive carrier and the wafer in a manner so that each of the coupled LED device and a portion of the conductive carrier at least partially fill the opening. A method of fabricating an LED device includes forming a number of openings in a wafer. The method also includes coupling light-emitting diode (LED) devices to conductive carriers. The LED devices with conductive carriers at least partially fill each of the openings.

    Abstract translation: 一种装置包括其中具有多个开口的晶片。 对于每个开口,LED器件以这样的方式耦合到导电载体和晶片,使得每个耦合的LED器件和导电载体的一部分至少部分地填充开口。 制造LED器件的方法包括在晶片中形成多个开口。 该方法还包括将发光二极管(LED)器件耦合到导电载体上。 具有导电载体的LED装置至少部分地填充每个开口。

    High temperature anneal for aluminum surface protection
    17.
    发明授权
    High temperature anneal for aluminum surface protection 有权
    高温退火铝表面保护

    公开(公告)号:US08119473B2

    公开(公告)日:2012-02-21

    申请号:US12651017

    申请日:2009-12-31

    Abstract: The present disclosure also provides another embodiment of a method for making metal gate stacks. The method includes forming a first dummy gate and a second dummy gate on a substrate; removing a polysilicon layer from the first dummy gate, resulting in a first gate trench; forming a first metal layer and a first aluminum layer in the first gate trench; applying a chemical mechanical polishing (CMP) process to the substrate; performing an annealing process to the first aluminum layer using a nitrogen and oxygen containing gas, forming an interfacial layer of aluminum, nitrogen and oxygen on the first aluminum layer; thereafter removing the polysilicon layer from the second dummy gate, resulting in a second gate trench; and forming a second metal layer and a second aluminum layer on the second metal layer in the second gate trench.

    Abstract translation: 本公开还提供了制造金属栅极叠层的方法的另一个实施例。 该方法包括在衬底上形成第一虚拟栅极和第二虚拟栅极; 从第一伪栅极去除多晶硅层,产生第一栅极沟槽; 在所述第一栅极沟槽中形成第一金属层和第一铝层; 对基材进行化学机械抛光(CMP)工艺; 使用含氮和氧的气体对所述第一铝层进行退火处理,在所述第一铝层上形成铝,氮和氧的界面层; 然后从第二伪栅极去除多晶硅层,产生第二栅极沟槽; 以及在所述第二栅极沟槽中的所述第二金属层上形成第二金属层和第二铝层。

    INTEGRATION OF BOTTOM-UP METAL FILM DEPOSITION
    18.
    发明申请
    INTEGRATION OF BOTTOM-UP METAL FILM DEPOSITION 有权
    底部金属膜沉积的整合

    公开(公告)号:US20110195570A1

    公开(公告)日:2011-08-11

    申请号:US12702525

    申请日:2010-02-09

    Abstract: The described embodiments of methods of bottom-up metal deposition to fill interconnect and replacement gate structures enable gap-filling of fine features with high aspect ratios without voids and provide metal films with good film quality. In-situ pretreatment of metal film(s) deposited by gas cluster ion beam (GCIB) allows removal of surface impurities and surface oxide to improve adhesion between an underlying layer with the deposited metal film(s). Metal films deposited by photo-induced chemical vapor deposition (PI-CVD) using high energy of low-frequency light source(s) at relatively low temperature exhibit liquid-like nature, which allows the metal films to fill fine feature from bottom up. The post deposition annealing of metal film(s) deposited by PI-CVD densifies the metal film(s) and removes residual gaseous species from the metal film(s). For advanced manufacturing, such bottom-up metal deposition methods address the challenges of gap-filling of fine features with high aspect ratios.

    Abstract translation: 自下而上金属沉积以填充互连和替代栅极结构的方法的所述实施例使得能够在没有空隙的情况下间隙填充具有高纵横比的精细特征,并提供具有良好膜质量的金属膜。 通过气体簇离子束(GCIB)沉积的金属膜的原位预处理允许去除表面杂质和表面氧化物以改善下层与沉积的金属膜之间的粘附。 通过使用高能量的低频光源在较低温度下通过光致化学气相沉积(PI-CVD)沉积的金属膜表现出液体性质,这允许金属膜从下向上填充精细特征。 通过PI-CVD沉积的金属膜的后沉积退火致密化金属膜并从金属膜去除残余的气态物质。 对于先进的制造,这种自下而上的金属沉积方法解决了具有高纵横比的精细特征的间隙填充的挑战。

    High Temperature Anneal for Aluminum Surface Protection
    19.
    发明申请
    High Temperature Anneal for Aluminum Surface Protection 有权
    高温退火铝表面保护

    公开(公告)号:US20110156166A1

    公开(公告)日:2011-06-30

    申请号:US12651017

    申请日:2009-12-31

    Abstract: The present disclosure also provides another embodiment of a method for making metal gate stacks. The method includes forming a first dummy gate and a second dummy gate on a substrate; removing a polysilicon layer from the first dummy gate, resulting in a first gate trench; forming a first metal layer and a first aluminum layer in the first gate trench; applying a chemical mechanical polishing (CMP) process to the substrate; performing an annealing process to the first aluminum layer using a nitrogen and oxygen containing gas, forming an interfacial layer of aluminum, nitrogen and oxygen on the first aluminum layer; thereafter removing the polysilicon layer from the second dummy gate, resulting in a second gate trench; and forming a second metal layer and a second aluminum layer on the second metal layer in the second gate trench.

    Abstract translation: 本公开还提供了制造金属栅极叠层的方法的另一个实施例。 该方法包括在衬底上形成第一虚拟栅极和第二虚拟栅极; 从第一伪栅极去除多晶硅层,产生第一栅极沟槽; 在所述第一栅极沟槽中形成第一金属层和第一铝层; 对基材进行化学机械抛光(CMP)工艺; 使用含氮和氧的气体对所述第一铝层进行退火处理,在所述第一铝层上形成铝,氮和氧的界面层; 然后从第二虚拟栅极去除多晶硅层,产生第二栅极沟槽; 以及在所述第二栅极沟槽中的所述第二金属层上形成第二金属层和第二铝层。

    Retainer ring
    20.
    发明授权
    Retainer ring 有权
    保持环

    公开(公告)号:US07950983B2

    公开(公告)日:2011-05-31

    申请号:US12683033

    申请日:2010-01-06

    CPC classification number: B24B37/32

    Abstract: A retainer ring and a method of using the retainer ring are provided. The retainer ring has openings along a bottom surface. Grooves encompass the openings and extend to an interior portion of the retainer ring wherein a semiconductor wafer may be held. In operation, a semiconductor wafer is placed inside the retainer ring. As the retainer ring and the semiconductor wafer are moved relative to an underlying polishing pad, slurry is dispensed through the openings in the retainer ring. The grooves in the retainer ring allow the slurry to flow from the openings to the interior portion of the retainer ring and the semiconductor wafer.

    Abstract translation: 提供了保持环和使用保持环的方法。 保持环具有沿底面的开口。 沟槽包围开口并延伸到保持环的内部,其中可以保持半导体晶片。 在操作中,将半导体晶片放置在保持环内。 当保持环和半导体晶片相对于下面的抛光垫移动时,通过保持环中的开口分配浆料。 保持环中的槽允许浆料从开口流到保持环和半导体晶片的内部。

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