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公开(公告)号:US11892412B2
公开(公告)日:2024-02-06
申请号:US17393654
申请日:2021-08-04
Applicant: SARINE TECHNOLOGIES LTD.
Inventor: Zvi Ioffe , Ariel Danan , Amiram Eldar
IPC: G01N21/87 , G06T7/11 , G06T7/90 , G01N21/25 , G01N21/64 , G01N33/38 , H04N23/54 , H04N23/56 , H04N23/88 , H04N23/695
CPC classification number: G01N21/87 , G01N21/251 , G01N21/6456 , G01N33/381 , G06T7/11 , G06T7/90 , H04N23/54 , H04N23/56 , H04N23/695 , H04N23/88 , G01N2201/061 , G06T2207/10024 , G06T2207/20072
Abstract: A system for the automatic grading of a cut/polished gemstone (SUT) includes an enclosure with a stage for mounting the cut/polished SUT. The enclosure further includes one or more sources of broadband visible (BBV) light, the sources of BBV light being controllable by a programmable controller; an image sensor for capturing a plurality of images of a mounted SUT, and one or more sources of UV light mounted within the enclosure. The controller captures images of the mounted SUT from one or more selected angles relative to the sensor elevation axis and relative to the position of the SUT on the stage rotation axis; an image capturing module is configured for processing the one or more images; and, a light grade calculation module is configured for grading the cut/polished SUT using light indicative parameters from at least a part of the one or more images captured.
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公开(公告)号:US11112368B2
公开(公告)日:2021-09-07
申请号:US17128044
申请日:2020-12-19
Applicant: SARINE TECHNOLOGIES LTD.
Inventor: Zvi Ioffe , Ariel Danan , Amiram Eldar
IPC: G01N21/87 , G06T7/11 , G06T7/90 , H04N5/232 , G01N21/25 , G01N21/64 , G01N33/38 , H04N5/225 , H04N9/73
Abstract: A system for the automatic grading of a cut/polished gemstone (SUT) includes an enclosure with a stage for mounting the cut/polished SUT. The enclosure further includes one or more sources of broadband visible (BBV) light, the sources of BBV light being controllable by a programmable controller; an image sensor for capturing a plurality of images of a mounted SUT, and one or more sources of UV light mounted within the enclosure. The controller captures images of the mounted SUT from one or more selected angles relative to the sensor elevation axis and relative to the position of the SUT on the stage rotation axis; an image capturing module is configured for processing the one or more images; and, a light grade calculation module is configured for grading the cut/polished SUT using light indicative parameters from at least a part of the one or more images captured.
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公开(公告)号:US20210131974A1
公开(公告)日:2021-05-06
申请号:US17128044
申请日:2020-12-19
Applicant: SARINE TECHNOLOGIES LTD.
Inventor: Zvi IOFFE , Ariel DANAN , Amiram ELDAR
IPC: G01N21/87 , H04N5/225 , H04N5/232 , H04N9/73 , G06T7/11 , G06T7/90 , G01N21/25 , G01N21/64 , G01N33/38
Abstract: A system for the automatic grading of a cut/polished gemstone (SUT) includes an enclosure with a stage for mounting the cut/polished SUT. The enclosure further includes one or more sources of broadband visible (BBV) light, the sources of BBV light being controllable by a programmable controller; an image sensor for capturing a plurality of images of a mounted SUT, and one or more sources of UV light mounted within the enclosure. The controller captures images of the mounted SUT from one or more selected angles relative to the sensor elevation axis and relative to the position of the SUT on the stage rotation axis; an image capturing module is configured for processing the one or more images; and, a light grade calculation module is configured for grading the cut/polished SUT using light indicative parameters from at least a part of the one or more images captured.
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公开(公告)号:US11892413B2
公开(公告)日:2024-02-06
申请号:US17588384
申请日:2022-01-31
Applicant: SARINE TECHNOLOGIES LTD.
Inventor: Tal Rosenzweig , Arie Zeev Shapira , Abraham M. Kerner
CPC classification number: G01N21/87 , G01N21/17 , G01N21/64 , G01N2021/174 , G01N2021/6423
Abstract: Systems and methods for determining properties of gemstones based, inter alia, on fluorescence properties of the gemstones, are presented. In one aspect, properties of at least one gemstone can be determined. In another aspect, a relationship between at least two gemstones can be determined. In one example, a first and a second gemstones are illuminated with illuminating light of at least one fluorescence-exciting wavelength range; corresponding at least one first fluorescence-emission light and at least one second fluorescence-emission light spectrum, emitted from the first and second gemstones respectively are detected and analyzed, either independently or by comparison, to determine the relationship between the first and second gemstones. In some examples, data indicative of visible light absorbance or three-dimensional models of the gemstones is combined with the fluorescence data to determine the properties or the relationship.
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公开(公告)号:US20210390330A1
公开(公告)日:2021-12-16
申请号:US17412798
申请日:2021-08-26
Applicant: SARINE TECHNOLOGIES LTD.
Inventor: Abraham KERNER , Shilo STOPER , Akiva CASPI
IPC: G06K9/46 , H04N13/204 , G01N21/87 , G01B11/24 , G06T7/73 , G06T7/564 , G06K9/52 , G06T3/40 , G06T5/00 , G06T7/60 , G06T15/00 , H04N5/225 , H04N5/232
Abstract: A method generating a more accurate 3D model for at least two gemstones using external surface of the gemstones; storing, in memory, the more accurate 3D model of the first gemstone and the second gemstone; comparing the more accurate 3D model of the first gemstone and the more accurate 3D model of the second gemstone from the stored memory; calculating, based on the comparison, a matching score for the more accurate 3D model of the first gemstone and the more accurate 3D model of the second gemstone, the matching score being informative of a match between the first gemstone and the second gemstone; and identifying the first gemstone and the second gemstone as being the same gemstone when the matching score meets a predefined matching criterion.
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公开(公告)号:US20210356402A1
公开(公告)日:2021-11-18
申请号:US17388230
申请日:2021-07-29
Applicant: SARINE TECHNOLOGIES LTD.
Inventor: Abraham Kerner , Omri Spirman , Shilo Stopper
IPC: G01N21/87
Abstract: There are provided method for detecting inclusions in a gemstone comprising illuminating the gemstone by successively producing illumination patterns on the gemstone each selected so as to simultaneously provide an internal uniform illumination of one or more predetermined light exit regions of the gemstone, and each being defined by a unique combination of spaced apart light entrance areas illuminated simultaneously from corresponding illumination directions. The method further comprises capturing a plurality of images of the gemstone when illuminated as indicated above, processing the images and identifying inclusions in the images based on non-uniformities in the internal illumination detected in the images. The illumination patterns can be produced by an illumination system configured to selectively illuminate the spaced apart light entrance areas of the gemstone from corresponding illumination directions. The illumination system can be controlled by a controller configured to cause the system to successively produce the illumination patterns. The images of the gemstone can be captured by an image acquisition device and processed by an image processing system configured for identifying inclusions based on non-uniformities in the internal illumination detected in the images.
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公开(公告)号:US11016032B2
公开(公告)日:2021-05-25
申请号:US16344665
申请日:2017-10-31
Applicant: SARINE TECHNOLOGIES LTD.
Inventor: Abraham Kerner , Omri Spirman , Shilo Stopper
IPC: G01N21/87
Abstract: There are provided method for detecting inclusions in a gemstone comprising illuminating the gemstone by successively producing illumination patterns on the gemstone each selected so as to simultaneously provide an internal uniform illumination of one or more predetermined light exit regions of the gemstone, and each being defined by a unique combination of spaced apart light entrance areas illuminated simultaneously from corresponding illumination directions. The method further comprises capturing a plurality of images of the gemstone when illuminated as indicated above, processing the images and identifying inclusions in the images based on non-uniformities in the internal illumination detected in the images. The illumination patterns can be produced by an illumination system configured to selectively illuminate the spaced apart light entrance areas of the gemstone from corresponding illumination directions. The illumination system can be controlled by a controller configured to cause the system to successively produce the illumination patterns. The images of the gemstone can be captured by an image acquisition device and processed by an image processing system configured for identifying inclusions based on non-uniformities in the internal illumination detected in the images.
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