DETERMINATION OF A CHANGE OF OBJECT'S SHAPE

    公开(公告)号:US20220065617A1

    公开(公告)日:2022-03-03

    申请号:US17595137

    申请日:2020-05-08

    Abstract: Surface changes are estimated using multiple speckle interferograms acquired using beams incident at different angles. Beam irradiation conditions can be changed to increase signal to noise ratio with averaging, such as weighted averaging. Irradiation conditions can be varied with a tilt plate, a wedge, or by changing beam wavelengths.

    Test of operational status of a digital scanner during lithographic exposure process

    公开(公告)号:US11099007B2

    公开(公告)日:2021-08-24

    申请号:US16675477

    申请日:2019-11-06

    Abstract: System and method for monitoring of performance of a mirror array of a digital scanner with a use of light, illuminating the mirror array at grazing (off-axis) incidence, and an optical imaging system that includes a lateral shearing interferometer (operated in either static or a phase-shifting condition) during and without interrupting the process of exposure of the workpiece with the digital scanner, to either simply identify problematic pixels for further troubleshooting or measure the exact magnitude of the deformation of a mirror element of the mirror array.

    SYSTEM AND METHOD FOR A DISPLACEMENT MEASUREMENT

    公开(公告)号:US20190234729A1

    公开(公告)日:2019-08-01

    申请号:US16379512

    申请日:2019-04-09

    Abstract: System and method for profiling of a surface with lateral scanning interferometer the optical axis of which is perpendicular to the surface. In-plane scanning of the surface is carried out with increments that correspond to integer number of pixels of an employed optical detector. Determination of height profile of a region-of-interest that is incomparably larger than a FOV of the interferometer objective is performed in time reduced by at least an order of magnitude as compared to time required for the same determination by a vertical scanning interferometer.

    System and method for a displacement measurement

    公开(公告)号:US10302419B2

    公开(公告)日:2019-05-28

    申请号:US15632849

    申请日:2017-06-26

    Abstract: System and method for profiling of a surface with lateral scanning interferometer the optical axis of which is perpendicular to the surface. In-plane scanning of the surface is carried out with increments that correspond to integer number of pixels of an employed optical detector. Determination of height profile of a region-of-interest that is incomparably larger than a FOV of the interferometer objective is performed in time reduced by at least an order of magnitude as compared to time required for the same determination by a vertical scanning interferometer.

    ENCODER HEAD WITH BIREFRINGENT ELEMENTS FOR FORMING IMPERFECT RETROREFLECTION AND EXPOSURE SYSTEM UTILIZING THE SAME

    公开(公告)号:US20180061627A1

    公开(公告)日:2018-03-01

    申请号:US15800480

    申请日:2017-11-01

    Abstract: An encoder head configured for use with a lithographic exposure tool. The head is devoid of the multiplicity of optical corner-cubes and includes, instead, a single, geometrically substantially perfect cuboid of optically-isotropic material complemented, in operation, with prismatic elements made of optically anisotropic material to form a contraption that, as a unit, splits a single beam of light delivered to the contraption into four measurement (sub-)beams of light (two in xz-plane, two in yz-plane) and causes each of these sub-beams to interact with the wafer-stage diffraction grating at the same location upon the second pass by the grating as upon the first pass by the grating, thereby solving problems of (i) structural complexity of a conventional encoder head for use in an exposure tool, (ii) burdensome alignment of the multitude of optical prisms in the process of forming such encoder head, and (iii) cyclic non-linear errors associated with measurements involving conventional corner-cubes-based encoder heads while, at the same time, reducing the geometrical footprint of the encoder head.

    Method for spatially multiplexing two or more fringe projection signals on a single detector
    20.
    发明授权
    Method for spatially multiplexing two or more fringe projection signals on a single detector 有权
    在单个检测器上空间复用两个或多个条纹投影信号的方法

    公开(公告)号:US09030668B2

    公开(公告)日:2015-05-12

    申请号:US13794353

    申请日:2013-03-11

    Abstract: Fringe patterns at first and second spatial frequencies are projected onto a work piece surface and a reference surface, respectively. An image of the projected fringe patterns is obtained and a measurement signal associated with work piece displacements and a reference signal are obtained based on the first and second spatial frequencies. The image of the projected fringe patterns can exhibit substantial or complete overlap of the fringe patterns at the first and second spatial frequencies, and the overlapping patterns can be separated based on the spatial frequencies. Fringe pattern shifts at one or both of the first and second spatial frequencies can be used to adjust a pattern transfer system to permit accurate pattern transfer.

    Abstract translation: 在第一和第二空间频率处的边缘图案分别投影到工件表面和参考表面上。 获得投影条纹图案的图像,并且基于第一和第二空间频率获得与工件位移相关联的测量信号和参考信号。 投影条纹图案的图像可以在第一和第二空间频率处显示条纹图案的实质或完全重叠,并且可以基于空间频率来分离重叠图案。 在第一和第二空间频率中的一个或两个处的边缘图案移位可用于调整图案转印系统以允许精确的图案转印。

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