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    Multi-energy-spectrum X-ray imaging system and method of substance identification of item to be inspected by using the same
    11.
    发明授权
    Multi-energy-spectrum X-ray imaging system and method of substance identification of item to be inspected by using the same 有权

    公开(公告)号：US11112528B2

    公开(公告)日：2021-09-07

    申请号：US16314093

    申请日：2017-09-12

    Applicant: Nuctech Company Limited

    Inventor： Guangming Xu ,  Bicheng Liu ,  Ziran Zhao ,  Jianping Gu ,  Qiang Li ,  Lan Zhang

    IPC: G01V5/00 ,  G01N23/087 ,  G01R23/18

    Abstract: The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue. Compared with the conventional dual-energy X-ray system, the multi-spectrum imaging can significantly improve the system's ability to identify substances in theory, especially in the field of security applications. The improvement of substance identification is important for contraband inspection, such as, drugs, explosives.

    Semiconductor detector
    13.
    发明授权
    Semiconductor detector 有权

    公开(公告)号：US10388818B2

    公开(公告)日：2019-08-20

    申请号：US15625473

    申请日：2017-06-16

    Applicant: NUCTECH COMPANY LIMITED

    Inventor： Lan Zhang ,  Yingshuai Du ,  Bo Li ,  Zonggui Wu ,  Jun Li ,  Xuepeng Cao ,  Haifan Hu ,  Jianping Gu ,  Guangming Xu ,  Bicheng Liu

    IPC: H01L31/118 ,  G01T1/24 ,  G01T1/02 ,  H01L27/144 ,  H01L31/0224 ,  H01L31/028 ,  H01L31/0296 ,  H01L31/0304 ,  H01L31/032

    Abstract: There is provided a semiconductor detector. According to an embodiment, the semiconductor detector may include a semiconductor detection material including a first side and a second side opposite to each other. One of the first side and the second side is a ray incident side that receives incident rays. The detector may further include a plurality of pixel cathodes disposed on the first side and a plurality of pixel anodes disposed on the second side. The pixel anodes and the pixel cathodes correspond to each other one by one. The detector may further include a barrier electrode disposed on a periphery of respective one of the pixel cathodes or pixel anodes on the ray incident side. According to the embodiment of the present disclosure, it is possible to effectively suppress charge sharing between the pixels and thus to improve an imaging resolution of the detector.

    Dual-energy ray scanning system, scanning method and inspecting system
    15.
    发明授权
    Dual-energy ray scanning system, scanning method and inspecting system 有权

    公开(公告)号：US10285252B2

    公开(公告)日：2019-05-07

    申请号：US15278043

    申请日：2016-09-28

    Applicant: Nuctech Company Limited

    Inventor： Yu Hu ,  Shangmin Sun ,  Juan Zheng ,  Bicheng Liu

    IPC: G21K1/04 ,  H05G1/30 ,  G01V5/00 ,  G01N23/083 ,  G21K1/10

    Abstract: Provided is a dual-energy ray scanning system, which includes a ray source for alternately emitting a high energy ray and a low energy ray; a filter includes a low energy filtering element and a low energy transmitting element; a control device for synchronously controlling the ray source and the filter, and the low energy filtering element includes a plurality of filter sheets, the low energy transmitting element comprises a plurality of transmission sheets, the filter sheets and the transmission sheets are arranged alternately and surround the ray source to form a cavity, and the ray source is located on a central axis of the cavity.

    Spiral CT device and Three-dimensional image reconstruction method
    18.
    发明授权
    Spiral CT device and Three-dimensional image reconstruction method 有权

    公开(公告)号：US11346975B2

    公开(公告)日：2022-05-31

    申请号：US16467140

    申请日：2017-08-04

    Applicant: NUCTECH COMPANY LIMITED

    Inventor： Zhiqiang Chen ,  Ziran Zhao ,  Yaohong Liu ,  Jianping Gu ,  Qian Yi ,  Bicheng Liu ,  Guangming Xu

    IPC: G01V5/00 ,  G01N23/046 ,  G01T1/29

    Abstract: The present disclosure provides a spiral Computed Tomography (CT) device and a three-dimensional image reconstruction method. The spiral CT device includes: an inspection station operable to carry an object to be inspected and defining an inspection space; a rotational supporting apparatus disposed around the inspection space; a plurality of X-ray sources located on the rotational supporting apparatus; and a plurality of X-ray receiving apparatuses located on the rotational supporting apparatus and opposing to the plurality of X-ray sources respectively, wherein the plurality of X-ray sources and the plurality of X-ray receiving apparatuses are rotational synchronously with the rotational supporting apparatus, wherein the plurality of X-ray sources are closely disposed and fan-shaped X-ray beams provided by the plurality of X-ray sources cover the inspection space with a minimum degree of overlapping.

    Image processing method, device, and computer readable storage medium
    19.
    发明授权
    Image processing method, device, and computer readable storage medium 有权

    公开(公告)号：US10884156B2

    公开(公告)日：2021-01-05

    申请号：US16232082

    申请日：2018-12-26

    Applicant: NUCTECH COMPANY LIMITED

    Inventor： Qi Wang ,  Bicheng Liu ,  Guangming Xu

    IPC: G06K9/00 ,  G01V5/00 ,  G06T5/20 ,  G01N23/04 ,  G06T3/40

    Abstract: The present disclosure provides an image processing method, device, and computer readable storage medium, relating to the field of image processing technology, the method includes: acquiring a first undersampled image to be processed; and reconstructing, according to a mapping relationship between an undersampled image and a normally sampled original image, the first undersampled image to a corresponding first original image, wherein the mapping relationship is obtained by training a machine learning model with a second undersampled image and a normally sampled second original image corresponding to the second undersampled image as training samples.

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