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公开(公告)号：US12298261B2
公开(公告)日：2025-05-13
申请号：US18013555
申请日：2021-07-02
Applicant: NUCTECH COMPANY LIMITED
Inventor： Zhiqiang Chen , Yuanjing Li , Shangmin Sun , Chunguang Zong , Yu Hu , Huaping Tang , Bicheng Liu , Weizhen Wang
IPC: G01N23/203
Abstract: The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.
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公开(公告)号：US10101473B2
公开(公告)日：2018-10-16
申请号：US15606071
申请日：2017-05-26
Applicant: Nuctech Company Limited
Inventor： Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: G01T1/24 , H01L31/02 , H05K1/18 , H05K1/02 , H05K1/11 , H01L31/119 , H01L31/0296
Abstract: The present disclosure provides a semiconductor detector. The semiconductor detector comprises: a detector crystal including a crystal body, an anode and a cathode; a field enhance electrode for applying a voltage to the detector crystal; an insulating material disposed between the field enhanced electrode and a surface of the detector crystal. The semiconductor detector further comprises a field enhanced electrode circuit board having a bottom connection layer in contact with the surface of the detector crystal and a top layer opposite to the bottom connection layer, wherein the top layer is connected to a high voltage input terminal of the semiconductor detector, and an insulating material is provided between the bottom connection layer and the detector surface of the detector crystal.
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公开(公告)号：US11812002B2
公开(公告)日：2023-11-07
申请号：US17382236
申请日：2021-07-21
Applicant: NUCTECH COMPANY LIMITED
Inventor： Bicheng Liu , Hao Yu , Weizhen Wang , Guangming Xu , Haojie Chi , Shangmin Sun , Chunguang Zong , Yu Hu
CPC classification number: H04N1/4092 , G06T3/4007 , G06T5/006 , G06T5/50 , G06T7/97 , H04N1/00005 , H04N1/00037 , G06T2207/10008 , G06T2207/20021
Abstract: The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.
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公开(公告)号：US11055869B2
公开(公告)日：2021-07-06
申请号：US16226645
申请日：2018-12-20
Applicant: NUCTECH COMPANY LIMITED
Inventor： Bicheng Liu , Haoran Zhang , Guangming Xu , Qi Wang , Qiangqiang Zhu , Yuan Wo
Abstract: The present disclosure discloses a method, apparatus and system for assisting security inspection, and relates to the field of security inspection. The method includes: acquiring registration information of an inspected object; acquiring a standard scanned image corresponding to the registration information; displaying the standard scanned image in an AR manner to determine whether the inspected object is a suspicious object through comparing the standard scanned image with an actual scanned image, the actual scanned image comprising an image of the inspected object.
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公开(公告)号：US20190192090A1
公开(公告)日：2019-06-27
申请号：US16232072
申请日：2018-12-26
Applicant: TSINGHUA UNIVERSITY , NUCTECH COMPANY LIMITED
Inventor： Liang Li , Zhiqiang Chen , Kejun Kang , Ziran Zhao , Li Zhang , Yuxiang Xing , Tiao Zhao , Jianmin Li , Bicheng Liu , Qian Yi
Abstract: The present disclosure provides a decomposition method based on basis material combination. In the present disclosure, a scanned object is divided into a plurality of regions, the basis material combinations used in each of the divided regions are different each other, and the scanned object is re-divided according to the re-determined equivalent atomic number of its each point until the change on decomposition coefficient meets certain conditions. Thereby, a decomposition method based on dynamic basis material combinations is realized, which reduces a decomposition error caused by improper selection of the basis material combination and improves the accuracy of the decomposition and substance identification of the multi-energy CT.
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Patent Agency Ranking
公开(公告)号：US20180059262A1
公开(公告)日：2018-03-01
申请号：US15609476
申请日：2017-05-31
Applicant: NUCTECH COMPANY LIMITED
Inventor： Lan ZHANG , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: G01T1/24 , H01L31/0224 , H01L31/032
CPC classification number: G01T1/24 , G01T1/241 , H01L31/022408 , H01L31/0324
Abstract: A semiconductor may include a semiconductor detection material including a first side and a second side opposite to each other, a cathode disposed on the first side, and an anode disposed on the second side. The anode includes an array of pixel anodes defining detection pixels of the semiconductor detector, and intermediate anodes disposed between adjacent ones of the pixel anodes. According to an embodiment of the present disclosure, it is possible to achieve signal correction to improve the energy resolution and the signal-to-noise ratio of the detector.
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公开(公告)号：US11699223B2
公开(公告)日：2023-07-11
申请号：US15858868
申请日：2017-12-29
Applicant: Nuctech Company Limited , Tsinghua University
Inventor： Ziran Zhao , Jianping Gu , Bicheng Liu , Qi Wang , Xi Yi
CPC classification number: G06T7/0004 , G01P13/00 , G01T1/00 , G01V5/0058 , G06F3/016 , G06T7/74 , G06T15/08 , G06Q50/30 , G06T2207/10012 , G06T2207/10081 , G06T2207/30232
Abstract: A method, a device and a security system for image data processing based on VR or AR are disclosed. In one aspect, an example image data processing method includes reconstructing, based on three-dimensional (3D) scanned data of a containing apparatus in which objects are contained, a 3D image of the containing apparatus and the objects contained in the containing apparatus. The reconstructed 3D image is stereoscopically displayed. Manipulation information is determined for at least one of the objects in the containing apparatus based on positioning information and action information of a user. At least a 3D image of the at least one object is reconstructed based on the determined manipulation information. The at least one reconstructed object is presented on the displayed 3D image.
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公开(公告)号：US11619599B2
公开(公告)日：2023-04-04
申请号：US16935415
申请日：2020-07-22
Applicant: Tsinghua University , NUCTECH COMPANY LIMITED
Inventor： Zhi Zeng , Xingyu Pan , Xuewu Wang , Junli Li , Ming Zeng , Jianmin Li , Ziran Zhao , Jianping Cheng , Hao Ma , Hui Zhang , Hao Yu , Bicheng Liu
IPC: G01N23/201 , G01N23/02 , G06K9/62
Abstract: The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested.
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公开(公告)号：US10663607B2
公开(公告)日：2020-05-26
申请号：US15591165
申请日：2017-05-10
Applicant: Nuctech Company Limited
Inventor： Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: G01T1/36
Abstract: The present disclosure provides an apparatus for processing signals for a plurality of energy regions, and a system and method for detecting radiation of a plurality of energy regions. The apparatus for processing signals for a plurality of energy regions may comprise: a first processor, configured to receive a signal from a detector and process the received signal to generate a gated signal, wherein a turn-on period of the gated signal represents magnitude of the received signal; and a second processor, configured to receive the gated signal from the first processor, and determine one of the plurality of energy regions to which the received signal belongs according to the turn-on period of the gated signal, so as to count signals within the determined energy region.
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公开(公告)号：US20180182085A1
公开(公告)日：2018-06-28
申请号：US15827722
申请日：2017-11-30
Applicant: Nuctech Company Limited
Inventor： Ziran Zhao , Jianping Gu , Qian Yi , Bicheng Liu
CPC classification number: G06T7/001 , G01N23/04 , G01V5/0016 , G06T5/002 , G06T5/20 , G06T5/50 , G06T7/0004 , G06T7/74 , G06T2207/10028 , G06T2207/10116 , G06T2207/30112
Abstract: The present disclosure discloses an inspection device and a method for inspecting a container. Transmission scanning is performed on the inspected container using a scanning device including a sparse area array detector to obtain scan data. Digital focusing is performed at a specific depth position in a depth direction. Defocused pixel values are filtered out to obtain a slice image at the specific depth position. It is judged whether dangerous articles or suspicious articles are included in the slice image.
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