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公开(公告)号:US11535001B2
公开(公告)日:2022-12-27
申请号:US17128758
申请日:2020-12-21
Applicant: POINT ENGINEERING CO., LTD.
Inventor: Bum Mo Ahn , Seung Ho Park , Sung Hyun Byun
Abstract: Proposed are a manufacturing method of an anodic oxide film structure, and an anodic oxide film structure. More particularly, proposed are a manufacturing method of an anodic oxide film structure, and an anodic oxide film structure, wherein production yield of the entire product can be improved by repairing a defective region to be made normal.
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公开(公告)号:US11193955B2
公开(公告)日:2021-12-07
申请号:US16794147
申请日:2020-02-18
Applicant: POINT ENGINEERING CO., LTD.
Inventor: Bum Mo Ahn , Seung Ho Park , Sung Hyun Byun
IPC: G01R1/073
Abstract: The present invention provides a guide plate for a probe card. The guide plate for the probe card according to the present invention includes: a first guide plate including a plurality of first pin insertion holes formed therein, and made of an anodic oxide film; and a second guide plate disposed to be spaced apart from the first guide plate by a predetermined distance, and including a plurality of second pin insertion holes through which probe pins passing through the first pin insertion holes pass, wherein a buffer part is provided at least partially on each of an upper portion and a lower portion of the first guide plate.
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公开(公告)号:US11145788B2
公开(公告)日:2021-10-12
申请号:US16734175
申请日:2020-01-03
Applicant: POINT ENGINEERING CO., LTD.
Inventor: Bum Mo Ahn , Seung Ho Park , Sung Hyun Byun
IPC: H01L33/00 , H01L33/64 , H01L25/075
Abstract: The present invention relates generally to a micro LED transfer head transferring a micro light-emitting diode (micro LED) from a first substrate to a second substrate. More particularly, the present invention relates to a micro LED transfer head holding and transferring a micro LED in which holding portions and surrounding areas of the holding portions are configured of different materials.
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公开(公告)号:US10539526B2
公开(公告)日:2020-01-21
申请号:US15674463
申请日:2017-08-10
Applicant: POINT ENGINEERING CO., LTD.
Inventor: Bum Mo Ahn , Seung Ho Park , Sung Hyun Byun
IPC: G01N27/12
Abstract: Disclosed is a micro sensor. Particularly, disclosed is a micro sensor capable of changing a resistance value of a resistance unit connected to a sensor electrode depending on a sensing material, the resistance unit having at least two resistors.
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公开(公告)号:US10015841B2
公开(公告)日:2018-07-03
申请号:US14864184
申请日:2015-09-24
Applicant: Point Engineering Co., Ltd.
Inventor: Bum Mo Ahn , Seung Ho Park , Sung Hyun Byun
CPC classification number: H05B3/03 , G01N27/12 , H05B3/262 , H05B2203/014 , H05B2203/017
Abstract: A micro heater and a micro sensor is capable of providing a heater having a small thermal capacity by forming an air gap which surrounds the heater wire, and forming the heater wire on a porous substrate.
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公开(公告)号:US20170309868A1
公开(公告)日:2017-10-26
申请号:US15491351
申请日:2017-04-19
Applicant: Point Engineering Co., Ltd.
Inventor: Bum Mo Ahn , Seung Ho Park , Sung Hyun Byun
CPC classification number: H01L51/56 , C23C14/042 , C23C14/12 , C23C14/24 , C25D11/04 , C25D11/20 , C25D11/24 , H01L51/0011 , H01L51/5012
Abstract: A mask for forming a pattern on a substrate is provided. The mask includes an anodic oxide film formed by anodizing metal, at least one transmission hole configured to vertically penetrate the anodic oxide film and formed in a corresponding relationship with the pattern, a plurality of pores formed in the anodic oxide film so as to have a smaller diameter than the transmission hole, and a magnetic material provided in each of the pores.
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公开(公告)号:US20160370336A1
公开(公告)日:2016-12-22
申请号:US15181976
申请日:2016-06-14
Applicant: Point Engineering Co., Ltd.
Inventor: Bum Mo Ahn , Seung Ho Park , Sung Hyun Byun
CPC classification number: G01N33/0027 , G01N27/121 , G01N27/128 , H05B1/0247 , H05B3/03 , H05B3/24
Abstract: A micro heater includes a substrate and a heater electrode formed on the substrate. The substrate includes a plurality of pores formed to vertically extend through the substrate. A micro sensor includes a substrate, a sensor electrode formed on the substrate, and a heater electrode formed on the substrate. A protective layer may be used to protect any of the electrodes against oxidation. Any of the electrodes may be formed on a barrier layer positioned on the porous layer.
Abstract translation: 微加热器包括形成在基板上的基板和加热电极。 衬底包括形成为垂直延伸穿过衬底的多个孔。 微型传感器包括基板,形成在基板上的传感器电极和形成在基板上的加热电极。 可以使用保护层来保护任何电极免受氧化。 任何电极可以形成在位于多孔层上的阻挡层上。
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18.
公开(公告)号:US20160095222A1
公开(公告)日:2016-03-31
申请号:US14866073
申请日:2015-09-25
Applicant: Point Engineering Co., Ltd.
Inventor: Seung Ho Park , Tae Hwan Song , Sung Hyun Byun
CPC classification number: H01L33/62 , H01L33/486 , H01L33/60 , H05K1/05 , H05K1/185 , H05K2201/09745 , H05K2201/10106
Abstract: A chip substrate includes conductive portions, an insulation portion and a cavity. The conductive portions are laminated in one direction to constitute the chip substrate. The insulation portion is interposed between the conductive portions to electrically isolate the conductive portions. The cavity is formed on an upper surface of the chip substrate at a predetermined depth in a region including the insulation portion. The cavity is defined by a plurality of continuously-extending curved surfaces having predetermined radii of curvature.
Abstract translation: 芯片基板包括导电部分,绝缘部分和空腔。 导电部分沿一个方向层叠以构成芯片基板。 绝缘部分介于导电部分之间,以使导电部分电隔离。 在包括绝缘部分的区域中,在芯片基板的上表面上以预定的深度形成空腔。 空腔由具有预定曲率半径的多个连续延伸的弯曲表面限定。
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公开(公告)号:US12222370B2
公开(公告)日:2025-02-11
申请号:US17919739
申请日:2021-04-20
Applicant: POINT ENGINEERING CO., LTD.
Inventor: Bum Mo Ahn , Seung Ho Park , Sung Hyun Byun
Abstract: A probe head and a probe card having the same are provided. The probe head includes a plurality of guide plates each having a guide hole, wherein each of the guide plates has a shape in which a plurality of layers are stacked, and each of the guide plates includes: a first guide layer provided at a lowermost side thereof, and having a first guide hole; and a second guide layer provided at an uppermost side thereof, and having a second guide hole, wherein a side wall of the first guide hole and a side wall of the second guide hole are not provided on the same vertical line.
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公开(公告)号:US12169212B2
公开(公告)日:2024-12-17
申请号:US17912518
申请日:2021-03-23
Applicant: POINT ENGINEERING CO., LTD.
Inventor: Bum Mo Ahn , Sung Hyun Byun , Dong Hyeok Seo
Abstract: Proposed are a probe head for testing, through a probe, a pattern formed on a wafer, and a probe card having the same. More particularly, proposed are a probe head in which formation of a guide hole into which a probe is inserted and insertion of the probe therein are facilitated, and a probe card having the same.
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