Testing network framework and information management method applied thereto

    公开(公告)号:US10725898B2

    公开(公告)日:2020-07-28

    申请号:US15991092

    申请日:2018-05-29

    Abstract: An information management method for a testing network framework is provided. The testing network framework includes a first server and at least one computer. The method includes the following steps. Firstly, the at least one computer downloads and executes a test application program. Then, the at least one computer is connected to the first server, and provides a device identification code and a network address value of the at least one computer to the first server. If the first server judges that the corresponding device identification code complies with a first default condition and the corresponding network address value complies with a second default condition, the corresponding computer is authenticated, and a test setting information is provided from the first server to the corresponding computer. After the test setting information is downloaded to the corresponding computer, a test process is performed.

    ELECTRONIC SCALE WITH CALIBRATION FUNCTION AND ELECTRONIC SCALE CALIBRATING METHOD

    公开(公告)号:US20200217710A1

    公开(公告)日:2020-07-09

    申请号:US16394546

    申请日:2019-04-25

    Abstract: An electronic scale calibrating method for an electronic scale is provided. The electronic scale includes a weighing pan, a memory unit, a first weight sensor and a second weight sensor. The weighing pan has a placement region. The first weight sensor and the second weight sensor are symmetric with respect to the placement region. Firstly, two standard samples are placed in the placement region simultaneously. Then, the first weight sensor and the second weight sensor sense the two standard samples to obtain a first read value and a second read value, respectively. Then, a first parameter, a second parameter, a first calibration coefficient and a second calibration coefficient are defined according to the first read value and the second read value. Then, a calibration formula is generated and stored in the memory unit.

    Circuit board testing system
    13.
    发明授权

    公开(公告)号:US09632133B2

    公开(公告)日:2017-04-25

    申请号:US14192308

    申请日:2014-02-27

    Inventor: Pei-Ming Chang

    Abstract: A circuit board testing system includes a testing fixture and a computer system. The testing fixture includes a contact element, a switching circuit, and a data acquisition unit. The contact element is connected with a circuit board. The switching circuit is connected with the contact element. By enabling the switching circuit, the data acquisition unit acquires a real voltage value corresponding to the electronic component. The computer system is connected with the testing fixture for converting the real voltage value into a real resistance value corresponding to the electronic component. According to the real resistance value, the computer system judges whether the electronic component passes the test.

    Camera module testing method
    14.
    发明授权

    公开(公告)号:US10750068B2

    公开(公告)日:2020-08-18

    申请号:US16285630

    申请日:2019-02-26

    Abstract: A camera module testing method is applied to a camera module including a camera lens and a photosensitive element. In a step (A), an original image is captured through the camera lens and the photosensitive element. In a step (B), the original image is converted into a gray scale image. In a step (C), the gray scale image is converted into a binary image according to a critical gray scale value. In a step (D), a boundary contour is obtained according to plural pixels of the binary image higher than or equal to the critical gray scale value. In a step (E), a contour center of the boundary contour is obtained. Then, a step (F) is performed to judge whether an optical axis of the camera lens is aligned with an imaging center of the photosensitive element according to the imaging center and the contour center.

    SENSOR TESTING SYSTEM AND SENSOR TESTING METHOD APPLIED THERETO

    公开(公告)号:US20190331709A1

    公开(公告)日:2019-10-31

    申请号:US16044742

    申请日:2018-07-25

    Abstract: A sensor testing system includes a standard unit and a test fixture. The standard unit and plural under-test sensors are placed on a test platform of the test fixture. A sensor testing method includes following steps. Firstly, the standard unit and the plural under-test sensors are arranged to generate a main process. Then, the standard unit and the plural under-test sensors are assigned to generate plural sub-threads according to the main process. When the main process is executed, the plural sub-threads are synchronously executed. Then, the test platform is enabled to create a motion in a first direction, and the main process waits for a predetermined time period. Then, the standard unit and the under-test sensors sense the motion in the first direction. When the sensing results are generated, the standard unit and the under-test sensors respond to the main process.

    Electronic device test system and method thereof

    公开(公告)号:US10338978B2

    公开(公告)日:2019-07-02

    申请号:US15493856

    申请日:2017-04-21

    Abstract: An electronic device test system and method detects a memory serial number of an electronic device. The electronic device test system includes a Macintosh system computer, configured to execute a serial number detection program to detect the memory serial number of the electronic device; and a Windows system computer, configured to execute a serial number comparison program to compare whether the memory serial number of the electronic device satisfies a coding rule. The Macintosh system computer transmits the memory serial number to the Windows system computer by means of an RS232 interface for printing.

    Electronic device test system and method thereof

    公开(公告)号:US10175280B2

    公开(公告)日:2019-01-08

    申请号:US15627131

    申请日:2017-06-19

    Abstract: An electronic device test system is configured to test functions of an electronic device. The electronic device test system includes: a test computer, configured to execute an electronic device test program; a scanning device, configured to scan a barcode number of the electronic device; and an optical sensor module, configured to detect a connection status of the electronic device and the test computer. When the optical sensor module confirms the connection status, the electronic device test program starts a test function to test the electronic device, records a test result of the electronic device according to the barcode number, and subsequently generates a retest rate according to the test result.

    Luminance adjusting method for display screen of electronic device
    18.
    发明授权
    Luminance adjusting method for display screen of electronic device 有权
    电子设备显示屏亮度调节方法

    公开(公告)号:US09330609B2

    公开(公告)日:2016-05-03

    申请号:US14549026

    申请日:2014-11-20

    Inventor: Pei-Ming Chang

    Abstract: A luminance adjusting method for a display screen of an electronic device includes the following steps. Firstly, a current brightness value and a current imaging color value of the display screen are recorded. In response to the user's operation, the light output of the display screen is adjusted. Consequently, the adjusted brightness value is equal to a default brightness value and the adjusted imaging color value is equal to a default imaging color value. Meanwhile, the display screen is operated in the healthy display mode. In response to the user's additional operation, the light output of the display screen is adjusted. Consequently, the adjusted brightness value is equal to the recorded current brightness value and the adjusted imaging color value is equal to the recorded current imaging color value. Meanwhile, the display screen is restored to the normal display mode.

    Abstract translation: 电子设备的显示屏的亮度调整方法包括以下步骤。 首先,记录显示画面的当前亮度值和当前成像色彩值。 响应于用户的操作,调整显示屏的光输出。 因此,经调整的亮度值等于默认亮度值,并且调整后的成像色彩值等于默认成像色值。 同时,显示屏以健康的显示模式运行。 响应于用户的附加操作,调整显示屏的光输出。 因此,调整后的亮度值等于记录的当前亮度值,并且调整后的成像色彩值等于记录的当前成像色彩值。 同时,显示屏恢复到正常显示模式。

    Membrane switch circuit testing system
    19.
    发明授权
    Membrane switch circuit testing system 有权
    膜开关电路测试系统

    公开(公告)号:US09297857B2

    公开(公告)日:2016-03-29

    申请号:US14475168

    申请日:2014-09-02

    Inventor: Pei-Ming Chang

    Abstract: A membrane switch circuit testing system includes a testing module and a connection element. After the connection element is connected with a membrane switch circuit and the testing module, the testing module assigns an identification code to a key intersection of the membrane switch circuit. When the key intersection is depressed, an equivalent circuit is defined by the depressed key intersection and a corresponding fixed resistor of the testing module. Moreover, the testing module acquires an intersection resistance value of the depressed key intersection from the equivalent circuit. Consequently, the testing module judges whether the depressed key intersection is qualified according to the intersection resistance value.

    Abstract translation: 薄膜开关电路测试系统包括测试模块和连接元件。 连接元件与薄膜开关电路和测试模块连接后,测试模块将一个识别码分配给薄膜开关电路的一个关键点。 当按键交叉点被按下的键交叉点和相应的测试模块的固定电阻器定义为等效电路。 此外,测试模块从等效电路获取按压的键交叉点的交叉电阻值。 因此,测试模块根据交点电阻值判断按下的键交叉点是否合格。

    CAMERA MODULE TESTING METHOD
    20.
    发明申请

    公开(公告)号:US20200186789A1

    公开(公告)日:2020-06-11

    申请号:US16285630

    申请日:2019-02-26

    Abstract: A camera module testing method is applied to a camera module including a camera lens and a photosensitive element. In a step (A), an original image is captured through the camera lens and the photosensitive element. In a step (B), the original image is converted into a gray scale image. In a step (C), the gray scale image is converted into a binary image according to a critical gray scale value. In a step (D), a boundary contour is obtained according to plural pixels of the binary image higher than or equal to the critical gray scale value. In a step (E), a contour center of the boundary contour is obtained. Then, a step (F) is performed to judge whether an optical axis of the camera lens is aligned with an imaging center of the photosensitive element according to the imaging center and the contour center.

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