Abstract:
A chip carrier with a dam bar structure is proposed. The chip carrier is defined with at least a chip attach area and a wire bonding area surrounding the chip attach area, allowing a chip to be mounted on the chip attach area and electrically connected to the wire bonding area by bonding wires bonded to the wire bonding area. A molding gate and a dam bar are formed on the substrate outside the chip attach area and wire bonding area. An molding compound is injected through the molding gate for encapsulating the chip and bonding wires. The dam bar is provided with a first gate directed toward the molding gate, a second gate and a third gate opposed to the second gate, wherein the second and third gates are each vertically arranged with respect to the molding gate, allowing the molding compound to divert its flow direction by the dam bar.
Abstract:
A BGA (ball grid array) package with enhanced electrical and thermal performance, and a method for fabricating the BGA package, are proposed. This BGA package is characterized by the use of a power-connecting heat spreader and a ground-connecting heat spreader, which are respectively used to electrically connect power pad and ground pad to a packaged chip as well as to dissipate heat generated by the chip during operation. The ground-connecting heat spreader is arranged to entirely cover the chip, and thereby provides good shielding effect for the chip, which helps improve electrical performance of the chip during operation. Further, the ground-connecting heat spreader is partly exposed to outside of an encapsulation body that encapsulates the chip, by which satisfactory heat-dissipation efficiency can be achieved.
Abstract:
A substrate for accommodating a passive component is proposed, including a core layer defined with a chip attach area and a trace forming area surrounding the chip attach area, with a solder mask layer being applied on the trace forming area. At least a pair of solder pads are formed on the trace forming area, and partly exposed to outside of the solder mask layer. The solder pads are each formed at a central position with an recess, allowing the core layer to be partly exposed through the recesses of the solder pads. For bonding a passive component to the solder pads, solder paste soldered on the solder pads forms a recessed top surface due to surface tension of the solder paste, and generates a downward and convergent dragging force for properly positioning the passive component on the solder pads without producing shifting or tombstone effect.
Abstract:
A dual-chip integrated circuit package with unaligned chip arrangement and a method of manufacturing such a dual-chip integrated circuit package are provided. The dual-chip integrated circuit package includes a leadframe having a first set of leads and a second set of leads. The dual-chip integrated circuit package is used to pack two integrated circuit chips in an unaligned chip arrangement, in which the first integrated circuit chip is mounted to one side of the inner part of the first set of leads, and the second integrated circuit chip is mounted to the other side of the same in such a manner as to allow the bonding pads on the second integrated circuit chip to be positioned in the spacing formed between the two sets of leads. This unaligned chip arrangement can help facilitate the wire-bonding process for the bonding pads on the second integrated circuit chip. An encapsulant is used for encapsulating the first integrated circuit chip, the second integrated circuit chip, the first set of bonding wires, the second set of bonding wires, the inner part of the first set of leads, and the inner part of the second set of leads. The particular structure of the dual-chip integrated circuit package allows no restriction to the relative size between the two integrated circuit chips, thus allowing flexible selection for the combination of the two integrated circuit chips. Moreover, the dual-chip integrated circuit package can help save layout space on the circuit board and offers more functionality and storage capacity.
Abstract:
A TBGA (Tape Ball Grid Array) package assembly with grounded heat sink and method of fabricating the same is provided, which is constructed of a tape, a heat sink, and at least one semiconductor chip. The proposed TBGA technology is characterized by that a grounding plug is formed by first forming a via hole in the heat sink and a via hole in the tape without penetrating through the grounding solder-ball pad, and then filling an electrically-conductive material, such as solder or silver paste, into the heat-sink via hole from the top of the package assembly until filling up the tape via hole and the heat-sink via hole. As the semiconductor chip is mounted in position, its grounding pads are electrically bonded to the heat sink, thereby allowing the semiconductor chip to be externally grounded through the grounding plug, the grounding solder-ball pad, and the solder ball attached to the grounding solder-ball pad. The proposed TBGA technology allows the resulted grounding plug to be firmly secured in position due to the filled solder being wettable to the heat sink, thereby providing a greater ball shear strength to the grounding solder ball that is subsequently bonded to the grounding plug. The finished TBGA package would be therefore assured in the reliability of its grounding structure.
Abstract:
A semiconductor package with a heat dissipating structure is proposed, in which the heat dissipating structure is precisely positioned on a substrate, in a manner that a plurality of solder balls self-align with ball pads formed on the substrate, and support a heat sink to be positioned above a semiconductor chip mounted on the substrate. This therefore makes the heat sink closely abut a molding cavity of an encapsulating mold in a molding process, and prevents resin flash from occurring on the heat sink, so that a surface of the heat sink can be directly exposed to the atmosphere for improving heat dissipating efficiency. Moreover, the solder balls characterized in softness deform in response to a pressure generated by the encapsulating mold during molding. Therefore, the substrate can be protected from being damaged by the pressure, and thus quality of the semiconductor package can be assured.
Abstract:
A semiconductor chip package is formed to be capable of reducing moisture erosion by configuring the bonding finger, the plating-conduction-line, and the trace on the chip carrier therein in such a way that the length of path for moisture to penetrate and to reach the bonding finger through a plating-conduction-line is significantly longer than those implemented in a conventional chip package.
Abstract:
A method of fabricating BGA (Ball Grid Array) packages is proposed, which utilizes a specially-designed carrier to serve as an auxiliary tool to package semiconductor chips on substrates. The carrier is formed with a plurality of cavities respective for receiving a substrate and in communication with an injection gate, such that no injection gate is required on the substrate, thereby not restricting the trace routability on the substrate. Moreover, a two-piece type of mold is allowed being used to form a number of encapsulation bodies at one time, making the fabrication more productive and cost-effective. Furthermore, the proposed BGA fabrication method can be implemented without having to provide an air outlet in the substrate but allows the resulted encapsulation body to be free of voids to assure the quality of the packages. The proposed BGA fabrication method is therefore more advantageous to use than the prior art.
Abstract:
A lead-frame-based semiconductor package and a fabrication method thereof are proposed. The semiconductor package includes: a lead frame having a plurality of first and second leads, wherein each first lead is formed with an extending portion smaller in thickness than the first lead in a manner that, an upper surface of the extending portion is flush with an upper surface of the first lead, and a lower surface of the extending portion forms a height difference with respect to a lower surface of the first lead; a chip mounted over the upper surfaces of the extending portions, and electrically connected to the leads by bonding wires; an encapsulant for encapsulating the upper surfaces of leads, upper surfaces of extending portions, chip and bonding wires; and a non-conductive material applied over the lower surfaces of extending portions, wherein the lower surfaces of leads are exposed to outside of the non-conductive material.
Abstract:
A semiconductor device and a fabrication method of the same are proposed, in which at least one electronic component is firstly mounted on a first substrate, and then the first substrate is attached onto a semiconductor chip or a second substrate. Further, with the chip being deposited on the second substrate, electrical connection is established among the first substrate, the second substrate and the chip. This combined structure is subsequently subjected to molding, ball implantation and singulation processes, and thus completes the fabrication of the semiconductor device. Such a semiconductor device provides significant advantages, including prevention of the occurrence of wire short-circuiting, no need to alter the substrate design, no need to use a circuit pattern with fine pitches or an expensive substrate integrated with electronic components.