Abstract:
A multichip module package uses bond wire with plastic resin on one side of a lead frame to package an integrated circuit and flip chip techniques to attach one or more mosfets to the other side of the lead frame. The assembled multichip module 30 has an integrated circuit controller 14 on a central die pad. Wire bonds 16 extend from contact areas on the integrated circuit to outer leads 2.6 of the lead frame 10. On the opposite, lower side of the central die pad, the sources and gates of the mosfets 24, 26 are bump or stud attached to the half etched regions of the lead frame. The drains 36 of the mosfets and the ball contacts 22.1 on the outer leads are soldered to a printed circuit board.
Abstract:
A packaged semiconductor device (a wafer-level chip scale package) containing no UBM between a chip pad and an RDL pattern is described. As well, the device contains only a single non-polymeric insulation layer between the RDL pattern and the solder bump. The single non-polymeric insulation layer does not need high temperature curing processes and so does not induce thermal stresses into the device. As well, manufacturing costs are diminished by eliminating the UBM between the chip pad and the RDL pattern.
Abstract:
Embodiments of the invention are directed to semiconductor die packages. One embodiment of the invention is directed to a semiconductor die package including, (a) a semiconductor die including a first surface and a second surface, (b) a source lead structure including protruding region having a major surface, the source lead structure being coupled to the first surface, (c) a gate lead structure being coupled to the first surface, and (d) a molding material around the source lead structure and the semiconductor die, where the molding material exposes the second surface of the semiconductor die and the major surface of the source lead structure.
Abstract:
A semiconductor die package is disclosed. In one embodiment, the die package includes a semiconductor die including a first surface and a second surface, and a leadframe structure having a die attach region and a plurality of leads extending away from the die attach region. The die attach region includes one or more apertures. A molding material is around at least portions of the die attach region of the leadframe structure and the semiconductor die. The molding material is also within the one or more apertures.
Abstract:
A mandrel assembly has a hollow main tube and two annular sleeves, wherein an inner diameter of the two annular sleeves is larger than an outer diameter of the two main tube ends. The two annular sleeves are sleeved respectively on the two main tube ends, which can be easily disengaged from the mandrel assembly when applied with an external force.
Abstract:
A data writing method for a rewritable non-volatile memory module, and a memory controller and a memory storage apparatus using the same are provided. The method includes partitioning physical blocks of the rewritable non-volatile memory module into a data area and a spare area and configuring logical blocks. The method also includes selecting physical blocks from the spare area as spare physical blocks corresponding to a logical block and using only lower physical pages of the spare physical blocks to store updated data that is to be written into the logical block. The method further includes moving valid data of all logical pages of the logical block into a physical block of the data area, wherein each lower physical page and an upper physical page corresponding thereto in the physical block are programmed together. Accordingly, the method can effectively improve the speed and reliability of writing data.
Abstract:
Systems and methods of fabricating Wafer Level Chip Scale Packaging (WLCSP) devices with transistors having source, drain and gate contacts on one side of the transistor while still having excellent electrical performance with low drain-to-source resistance RDS(on) include using a two-metal drain contact technique. The RDS(on) is further improved by using a through-silicon-via (TSV) technique to form a drain contact or by using a copper layer closely connected to the drain drift.
Abstract:
Semiconductor die packages are disclosed. An exemplary semiconductor die package includes a premolded substrate. The premolded substrate can have a semiconductor die attached to it, and an encapsulating material may be disposed over the semiconductor die.
Abstract:
An exemplary semiconductor die package of the invention has a metal-oxide substrate disposed between a first surface of a semiconductor die and a heat-sinking component, with a conductive die clip or one or more electrical interconnect traces disposed between the metal-oxide substrate and the first surface of the semiconductor die. The heat-sinking component may comprise a heat sink, or an adaptor plate to which a heat sink may be coupled. The conductive die clip or electrical trace(s) provides electrical connection(s) to the first surface of the semiconductor die, while the metal-oxide substrate electrically insulates the die from the heat-sinking component, and provides a path of high thermal conductivity between the die and the heat-sinking component. The second surface of the semiconductor die may be left free to connect to a circuit board, or a leadframe or interconnect substrate may be attached to it.
Abstract:
A flash memory storage device, a controller thereof, and a data programming method are provided. The flash memory storage device has a flash memory comprising a plurality of physical blocks, each physical block includes a plurality of physical addresses, and the physical addresses comprises at least one fast physical address and at least one slow physical address. The method comprises at least grouping the physical blocks into a data area and a spare area; setting a predetermined block number; obtaining m physical blocks from the spare area, receiving a write command comprising a write data and a logical address, determining a logical address range of a buffer according to the logical address and the predetermined block number. When all logical addresses to be programmed with the write data are within the logical address range of the buffer, using a fast mode to program the data into the m physical blocks.