Abstract:
The invention related to a method for checking or calibrating the angle-dependent alignment of a reference structure on a high-precision test-piece. After arrangement of the test-piece on a retainer piece, a pre-alignment of an optical unit and/or the reference structure of the test-piece is carried out, such that the test-piece beam is at least partly incident on a detector and generates at least one point there. The position of the at least one point on the detector is evaluated by means of a control/regulation unit. After a relatively fine alignment of the optical unit relative to the reference structure, by means of the control/regulation unit, depending on the position of the at least one point on the detector, such that the at least one point has a given set position on the detector, a recording of at least the retainer piece rotation angle and/or the measuring piece rotation angle is carried out, whereby a beam from the reference structure of the test-piece is generated, or modified with relation to a beam parameter, in particular, by reflection, stopping, filtering or shaping and the generated or altered beam forms the test-piece beam.
Abstract:
A measuring head system for a coordinate measuring machine, having a scanning element for contacting a measured object as a contacting part, which can be moved such that an object to be measured can be mechanically scanned using the scanning element. An optical sensor is fixed on the measuring head base. Means are provided to generate a projection on the sensor line using at least one radiation source. The means have at least one first mask element to generate a first partial projection on the sensor line such that said partial projection is optimized to determine an x displacement and a y displacement of the contacting part in relation to the measuring head base in the x direction or y direction. An analysis unit is configured to determine the x displacement and the y displacement from signals only generated by the one sensor line.
Abstract:
The invention relates to a method for determining at least one influencing variable acting on the eccentricity in a goniometer, using a detector arrangement consisting of four optical detector elements, and a rotational body comprising a plurality of pattern elements arranged around a pattern center, the rotational body being rotatably arranged about an axis. According to said method, at least some of the pattern elements are reproduced on the detector arrangement, the positions of the pattern elements reproduced on the detector arrangement are resolved, and the eccentricity of the pattern center in relation to a detector center of the detector arrangement is determined. A plurality of such eccentricity measurements for different rotational positions enables different influencing variables acting on the current eccentricity to be separated, especially by forming units.
Abstract:
For determining positions of a support having a bar code relative to a sensor array, the position of lines in the region of the sensor array is determined at least once and a position is determined therefrom. Thereafter, at least one line of the bar code is selected, a displacement of the position of the at least one selected line in the region of the sensor array is registered and the actual position is calculated therefrom by means of a previously determined position. An incremental and rapid measurement is thus permitted with a bar code and a sensor array.
Abstract:
The invention relates to a measuring method for determining a measurement position of a probe element 6 using a coordinate measuring machine 1 having a base and members that can be moved relative to the base and relative to each other, wherein one of the members, as the probe member TG, comprises a probe element 6, so that the probe element 6 can move freely within a prescribed volume of space, wherein the measurement position is captured by the probe element 6, a measurement variable set is taken by measuring measurement variables linked to a measurement position of the members, wherein the measurement position is determined by a relative location of the members to each other and of at least one of the members to the base, and the measurement position is determined relative to the base. According to the invention, a plurality of different measurement settings M1, M2, M3 are generated in a stationary state of the probe element 6 in the measurement position, wherein the capture is repeated anew for each of the same, so that at least one measurement variable set is captured for each measurement setting M1, M2, M3. The derivation then takes place using a statistical evaluation of the captured measurement variable sets.
Abstract:
The invention relates to an optoelectronic angle sensor (1a) for determining a rotational angle about an axis (6), comprising a circular disk (2a) that can be rotated about the axis. Said circular disk comprises a coding, essentially over the entire surface, a flat photosensitive detector (3a), a device for producing an evaluable image of the coding on the detector and a memory and evaluation component (4a) for determining the rotational angle. A largely complete, or in particular an entire image of the coding is produced on the detector. The rotational angle is determined using a parameter-varying stochastic comparison method, from the image and a parameterised electronic reference pattern that is provided by means of the memory and evaluation component.
Abstract:
An optoelectric angle-measuring device has a code carrier having a position code which can be detected optically as well as a scanning device in the form of a light-sensitive row or area for detecting the position code and generating a position-dependent scanning signal. The scanning device which is in the form of a scanning film, in particular, surrounds the code carrier or the code carrier essentially completely surrounds the scanning device along a circumference. This provides an extremely accurate angle-measuring device by virtue of the fact that a large part of the position code, in particular even the entire position code, can be detected.
Abstract:
The invention related to a method for checking or calibrating the angle-dependent alignment of a reference structure on a high-precision test-piece. After arrangement of the test-piece on a retainer piece, a pre-alignment of an optical unit and/or the reference structure of the test-piece is carried out, such that the test-piece beam is at least partly incident on a detector and generates at least one point there. The position of the at least one point on the detector is evaluated by means of a control/regulation unit. After a relatively fine alignment of the optical unit relative to the reference structure, by means of the control/regulation unit, depending on the position of the at least one point on the detector, such that the at least one point has a given set position on the detector, a recording of at least the retainer piece rotation angle and/or the measuring piece rotation angle is carried out, whereby a beam from the reference structure of the test-piece is generated, or modified with relation to a beam parameter, in particular, by reflection, stopping, filtering or shaping and the generated or altered beam forms the test-piece beam.
Abstract:
A tilt sensor has a source for optical radiation, a pattern support having an optically effective pattern for the passage of the optical radiation generated by the source, a tilt-sensitive unit downstream of the pattern support in the direction of propagation of the radiation, and a projection area for the incidence of the radiation generated by the source and passing through the pattern support and the tilt-sensitive unit, wherein the source is in the form of a pattern support.