Method for checking or calibrating the angle-dependent alignment of a high-precision test-piece
    21.
    发明授权
    Method for checking or calibrating the angle-dependent alignment of a high-precision test-piece 有权
    用于检查或校准高精度测试件的角度相关对准的方法

    公开(公告)号:US07299556B2

    公开(公告)日:2007-11-27

    申请号:US10565966

    申请日:2004-07-23

    Applicant: Heinz Lippuner

    Inventor: Heinz Lippuner

    CPC classification number: G01C1/02 G01C25/00

    Abstract: The invention related to a method for checking or calibrating the angle-dependent alignment of a reference structure on a high-precision test-piece. After arrangement of the test-piece on a retainer piece, a pre-alignment of an optical unit and/or the reference structure of the test-piece is carried out, such that the test-piece beam is at least partly incident on a detector and generates at least one point there. The position of the at least one point on the detector is evaluated by means of a control/regulation unit. After a relatively fine alignment of the optical unit relative to the reference structure, by means of the control/regulation unit, depending on the position of the at least one point on the detector, such that the at least one point has a given set position on the detector, a recording of at least the retainer piece rotation angle and/or the measuring piece rotation angle is carried out, whereby a beam from the reference structure of the test-piece is generated, or modified with relation to a beam parameter, in particular, by reflection, stopping, filtering or shaping and the generated or altered beam forms the test-piece beam.

    Abstract translation: 本发明涉及一种用于检查或校准参考结构在高精度测试件上的与角度相关的对准的方法。 在将测试件安装在保持件上之后,执行光学单元和/或测试件的参考结构的预对准,使得测试片梁至少部分地入射到检测器 并在那里生成至少一个点。 通过控制/调节单元来评估检测器上的至少一个点的位置。 在光学单元相对于参考结构相对精细对准之后,借助于控制/调节单元,取决于检测器上的至少一个点的位置,使得至少一个点具有给定的设定位置 在检测器上,执行至少保持器片旋转角度和/或测量件旋转角度的记录,由此产生来自测试件的参考结构的光束或相对于光束参数进行修改, 特别是通过反射,停止,过滤或成形,并且产生或改变的波束形成测试片。

    Measuring head system for a coordinate measuring machine and method for optically measuring of displacements of a probe element
    22.
    发明授权
    Measuring head system for a coordinate measuring machine and method for optically measuring of displacements of a probe element 有权
    用于坐标测量机的测量头系统和用于光学测量探针元件的位移的方法

    公开(公告)号:US08294906B2

    公开(公告)日:2012-10-23

    申请号:US12741075

    申请日:2008-10-29

    CPC classification number: G01B11/007 G01B5/012

    Abstract: A measuring head system for a coordinate measuring machine, having a scanning element for contacting a measured object as a contacting part, which can be moved such that an object to be measured can be mechanically scanned using the scanning element. An optical sensor is fixed on the measuring head base. Means are provided to generate a projection on the sensor line using at least one radiation source. The means have at least one first mask element to generate a first partial projection on the sensor line such that said partial projection is optimized to determine an x displacement and a y displacement of the contacting part in relation to the measuring head base in the x direction or y direction. An analysis unit is configured to determine the x displacement and the y displacement from signals only generated by the one sensor line.

    Abstract translation: 一种用于坐标测量机的测量头系统,具有用于接触作为接触部分的测量对象的扫描元件,其可被移动,使得可以使用扫描元件机械地扫描被测量物体。 光学传感器固定在测量头基座上。 提供装置以使用至少一个辐射源在传感器线路上产生投影。 所述装置具有至少一个第一掩模元件以在所述传感器线上产生第一部分投影,使得所述部分投影被优化以确定所述接触部分相对于所述测量头基座在x方向上的位移和位移,或 y方向。 分析单元被配置为从仅由一个传感器线产生的信号确定x位移和y位移。

    Method for determining an influencing variable acting on the eccentricity in a goniometer
    23.
    发明授权
    Method for determining an influencing variable acting on the eccentricity in a goniometer 有权
    确定作用在测角器偏心度的影响变量的方法

    公开(公告)号:US08031334B2

    公开(公告)日:2011-10-04

    申请号:US12522198

    申请日:2007-12-06

    Abstract: The invention relates to a method for determining at least one influencing variable acting on the eccentricity in a goniometer, using a detector arrangement consisting of four optical detector elements, and a rotational body comprising a plurality of pattern elements arranged around a pattern center, the rotational body being rotatably arranged about an axis. According to said method, at least some of the pattern elements are reproduced on the detector arrangement, the positions of the pattern elements reproduced on the detector arrangement are resolved, and the eccentricity of the pattern center in relation to a detector center of the detector arrangement is determined. A plurality of such eccentricity measurements for different rotational positions enables different influencing variables acting on the current eccentricity to be separated, especially by forming units.

    Abstract translation: 本发明涉及一种用于使用由四个光学检测器元件组成的检测器装置来确定作用于测角器中的偏心的至少一个影响变量的方法,以及包括围绕图案中心布置的多个图案元件的旋转体, 主体围绕轴线可旋转地布置。 根据所述方法,在检测器装置上再现至少一些图形元素,解析在检测器装置上再现的图案元素的位置,并且图案中心相对于检测器装置的检测器中心的偏心度 决心,决意,决定。 用于不同旋转位置的多个这种偏心测量使得能够分离作用于当前偏心的不同影响变量,特别是通过形成单元。

    Method and apparatus for determining positions
    24.
    发明授权
    Method and apparatus for determining positions 有权
    用于确定位置的方法和装置

    公开(公告)号:US08011112B2

    公开(公告)日:2011-09-06

    申请号:US11948731

    申请日:2007-11-30

    CPC classification number: G01D5/34792 G01D5/2455

    Abstract: For determining positions of a support having a bar code relative to a sensor array, the position of lines in the region of the sensor array is determined at least once and a position is determined therefrom. Thereafter, at least one line of the bar code is selected, a displacement of the position of the at least one selected line in the region of the sensor array is registered and the actual position is calculated therefrom by means of a previously determined position. An incremental and rapid measurement is thus permitted with a bar code and a sensor array.

    Abstract translation: 为了确定具有相对于传感器阵列的条形码的支撑件的位置,确定传感器阵列区域中的线的位置至少一次并且从其确定位置。 此后,选择条形码的至少一行,记录传感器阵列区域中的至少一条所选行的位置的位移,并且通过先前确定的位置从其计算实际位置。 因此,允许使用条形码和传感器阵列进行增量和快速测量。

    MEASURING METHOD FOR AN ARTICULATED-ARM COORDINATE MEASURING MACHINE
    25.
    发明申请
    MEASURING METHOD FOR AN ARTICULATED-ARM COORDINATE MEASURING MACHINE 有权
    肘关节坐标测量机的测量方法

    公开(公告)号:US20110046917A1

    公开(公告)日:2011-02-24

    申请号:US12937423

    申请日:2009-04-17

    Abstract: The invention relates to a measuring method for determining a measurement position of a probe element 6 using a coordinate measuring machine 1 having a base and members that can be moved relative to the base and relative to each other, wherein one of the members, as the probe member TG, comprises a probe element 6, so that the probe element 6 can move freely within a prescribed volume of space, wherein the measurement position is captured by the probe element 6, a measurement variable set is taken by measuring measurement variables linked to a measurement position of the members, wherein the measurement position is determined by a relative location of the members to each other and of at least one of the members to the base, and the measurement position is determined relative to the base. According to the invention, a plurality of different measurement settings M1, M2, M3 are generated in a stationary state of the probe element 6 in the measurement position, wherein the capture is repeated anew for each of the same, so that at least one measurement variable set is captured for each measurement setting M1, M2, M3. The derivation then takes place using a statistical evaluation of the captured measurement variable sets.

    Abstract translation: 本发明涉及一种用于使用具有基座的坐标测量机1和相对于基座相对于彼此移动的构件来确定探针元件6的测量位置的测量方法,其中,一个构件作为 探针构件TG包括探针元件6,使得探针元件6能够在规定体积的空间内自由移动,其中测量位置由探针元件6捕获,测量变量通过测量与 所述构件的测量位置,其中所述测量位置由所述构件相对于所述构件的相对位置以及所述构件中的至少一个到所述基座确定,并且所述测量位置相对于所述底座确定。 根据本发明,在测量位置中在探针元件6的静止状态下产生多个不同的测量设置M1,M2,M3,其中对于每个测量位置重复重复捕获,使得至少一个测量 针对每个测量设置M1,M2,M3捕获变量集。 然后使用所捕获的测量变量集合的统计评估来进行推导。

    OPTOELECTRONIC ANGLE SENSOR AND METHOD FOR DETERMINING A ROTATIONAL ANGLE ABOUT AN AXIS
    26.
    发明申请
    OPTOELECTRONIC ANGLE SENSOR AND METHOD FOR DETERMINING A ROTATIONAL ANGLE ABOUT AN AXIS 有权
    光电角传感器和确定旋转角的方法

    公开(公告)号:US20110044561A1

    公开(公告)日:2011-02-24

    申请号:US12377445

    申请日:2007-08-16

    CPC classification number: G01D5/34776 G01D5/3473

    Abstract: The invention relates to an optoelectronic angle sensor (1a) for determining a rotational angle about an axis (6), comprising a circular disk (2a) that can be rotated about the axis. Said circular disk comprises a coding, essentially over the entire surface, a flat photosensitive detector (3a), a device for producing an evaluable image of the coding on the detector and a memory and evaluation component (4a) for determining the rotational angle. A largely complete, or in particular an entire image of the coding is produced on the detector. The rotational angle is determined using a parameter-varying stochastic comparison method, from the image and a parameterised electronic reference pattern that is provided by means of the memory and evaluation component.

    Abstract translation: 本发明涉及一种用于确定围绕轴线(6)的旋转角度的光电子角度传感器(1a),包括可围绕轴线旋转的圆盘(2a)。 所述圆盘包括基本上在整个表面上的编码平板光敏检测器(3a),用于产生检测器上的编码的可评估图像的装置和用于确定旋转角度的存储器和评估部件(4a)。 在检测器上产生了一个很完整的,特别是整个编码的图像。 使用参数变化随机比较方法从图像和通过存储器和评估部件提供的参数化电子参考图案确定旋转角度。

    Optoelectric angle-measuring device
    27.
    发明授权
    Optoelectric angle-measuring device 有权
    光电角度测量装置

    公开(公告)号:US07830500B2

    公开(公告)日:2010-11-09

    申请号:US12091680

    申请日:2006-10-28

    CPC classification number: G01D5/3473 G01D5/34715 H01L27/307

    Abstract: An optoelectric angle-measuring device has a code carrier having a position code which can be detected optically as well as a scanning device in the form of a light-sensitive row or area for detecting the position code and generating a position-dependent scanning signal. The scanning device which is in the form of a scanning film, in particular, surrounds the code carrier or the code carrier essentially completely surrounds the scanning device along a circumference. This provides an extremely accurate angle-measuring device by virtue of the fact that a large part of the position code, in particular even the entire position code, can be detected.

    Abstract translation: 一种光电角度测量装置具有可以光学检测的位置代码的代码载体以及用于检测位置代码并产生位置相关扫描信号的感光行或区域形式的扫描装置。 扫描薄膜形式的扫描装置尤其围绕编码载体或编码载体,沿着圆周基本上完全围绕扫描装置。 这提供了一种非常精确的角度测量装置,这是因为可以检测到大部分位置代码,特别是整个位置代码。

    Method for checking or calibrating the angle-dependent alignment of a high-precision test-piece
    28.
    发明申请
    Method for checking or calibrating the angle-dependent alignment of a high-precision test-piece 有权
    用于检查或校准高精度测试件的角度相关对准的方法

    公开(公告)号:US20060191148A1

    公开(公告)日:2006-08-31

    申请号:US10565966

    申请日:2004-07-23

    Applicant: Heinz Lippuner

    Inventor: Heinz Lippuner

    CPC classification number: G01C1/02 G01C25/00

    Abstract: The invention related to a method for checking or calibrating the angle-dependent alignment of a reference structure on a high-precision test-piece. After arrangement of the test-piece on a retainer piece, a pre-alignment of an optical unit and/or the reference structure of the test-piece is carried out, such that the test-piece beam is at least partly incident on a detector and generates at least one point there. The position of the at least one point on the detector is evaluated by means of a control/regulation unit. After a relatively fine alignment of the optical unit relative to the reference structure, by means of the control/regulation unit, depending on the position of the at least one point on the detector, such that the at least one point has a given set position on the detector, a recording of at least the retainer piece rotation angle and/or the measuring piece rotation angle is carried out, whereby a beam from the reference structure of the test-piece is generated, or modified with relation to a beam parameter, in particular, by reflection, stopping, filtering or shaping and the generated or altered beam forms the test-piece beam.

    Abstract translation: 本发明涉及一种用于检查或校准参考结构在高精度测试件上的与角度相关的对准的方法。 在将测试件安装在保持件上之后,执行光学单元和/或测试件的参考结构的预对准,使得测试片梁至少部分地入射到检测器 并在那里生成至少一个点。 通过控制/调节单元来评估检测器上的至少一个点的位置。 在光学单元相对于参考结构相对精细对准之后,借助于控制/调节单元,取决于检测器上的至少一个点的位置,使得至少一个点具有给定的设定位置 在检测器上,执行至少保持器片旋转角度和/或测量件旋转角度的记录,由此产生来自测试件的参考结构的光束或相对于光束参数进行修改, 特别是通过反射,停止,过滤或成形,并且产生或改变的波束形成测试片。

    Tilt sensor
    29.
    发明申请
    Tilt sensor 有权
    倾斜传感器

    公开(公告)号:US20060005407A1

    公开(公告)日:2006-01-12

    申请号:US11179231

    申请日:2005-07-12

    Applicant: Heinz Lippuner

    Inventor: Heinz Lippuner

    CPC classification number: G01C9/20 G01C9/06 G01C2009/066

    Abstract: A tilt sensor has a source for optical radiation, a pattern support having an optically effective pattern for the passage of the optical radiation generated by the source, a tilt-sensitive unit downstream of the pattern support in the direction of propagation of the radiation, and a projection area for the incidence of the radiation generated by the source and passing through the pattern support and the tilt-sensitive unit, wherein the source is in the form of a pattern support.

    Abstract translation: 倾斜传感器具有用于光辐射的源,具有光学有效图案的图案支撑件,用于使由源产生的光辐射通过,沿着辐射方向的图案支撑下游的倾斜敏感单元,以及 用于由源产生并通过图案支撑件和倾斜敏感单元的辐射入射的投影区域,其中源是图案支撑件的形式。

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