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21.
公开(公告)号:US20200027856A1
公开(公告)日:2020-01-23
申请号:US16586820
申请日:2019-09-27
Applicant: Intel Corporation
Inventor: Rahul JAIN , Ji Yong PARK , Kyu Oh LEE
IPC: H01L23/00 , H01L23/538 , H01L25/00 , H01L25/065
Abstract: Examples relate to a die interconnect substrate comprising a bridge die comprising at least one bridge interconnect connecting a first bridge die pad of the bridge die to a second bridge die pad of the bridge die. The die interconnect substrate further comprises a substrate structure comprising a substrate interconnect electrically insulated from the bridge die, wherein the bridge die is embedded in the substrate structure. The die interconnect substrate further comprises a first interface structure for attaching a semiconductor die to the substrate structure, wherein the first interface structure is connected to the first bridge die pad. The die interconnect substrate further comprises a second interface structure for attaching a semiconductor die to the substrate structure, wherein the second interface structure is connected to the substrate interconnect. A surface of the first interface structure and a surface of the second interface structure are at the same height.
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公开(公告)号:US20190355675A1
公开(公告)日:2019-11-21
申请号:US15982652
申请日:2018-05-17
Applicant: Intel Corporation
Inventor: Kyu-Oh LEE , Sai VADLAMANI , Rahul JAIN , Junnan ZHAO , Ji Yong PARK , Cheng XU , Seo Young KIM
Abstract: Techniques for fabricating a semiconductor package having magnetic materials embedded therein are described. For one technique, fabrication of package includes: forming a pad and a conductive line on a build-up layer; forming a raised pad structure on the build-up layer, the raised pad comprising a pillar structure on the pad; encapsulating the conductive line and the raised pad structure in a magnetic film comprising one or more magnetic fillers; planarizing a top surface of the magnetic film until top surfaces of the raised pad structure and the magnetic film are co-planar; depositing a primer layer on the top surfaces; removing one or more portions of the primer layer above the raised pad structure to create an opening; and forming a via in the opening on the raised pad structure. The primer layer may comprise one or more of a build-up layer, a photoimageable dielectric layer, and a metal mask.
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公开(公告)号:US20190244922A1
公开(公告)日:2019-08-08
申请号:US16386195
申请日:2019-04-16
Applicant: Intel Corporation
Inventor: Rahul JAIN , Kyu Oh LEE , Amanda E. SCHUCKMAN , Steve S. CHO
IPC: H01L23/00
CPC classification number: H01L24/13 , H01L23/498 , H01L24/11 , H01L24/16 , H01L24/32 , H01L2224/11462 , H01L2224/13082 , H01L2224/13111 , H01L2224/13155 , H01L2224/16157 , H01L2224/16225 , H01L2224/32225 , H01L2224/73204 , H01L2224/83951 , H01L2924/15311 , H05K1/00 , H01L2924/00
Abstract: Techniques and mechanisms for providing effective connectivity with surface level microbumps on an integrated circuit package substrate. In an embodiment, different metals are variously electroplated to form a microbump which extends through a surface-level dielectric of a substrate to a seed layer including copper. The microbump includes nickel and tin, wherein the nickel aids in mitigating an absorption of seed layer copper. In another embodiment, the microbump has a mass fraction of tin, or a mass fraction of nickel, that is different in various regions along a height of the microbump.
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