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公开(公告)号:US20240071869A1
公开(公告)日:2024-02-29
申请号:US17894102
申请日:2022-08-23
Applicant: Micron Technology, Inc.
Inventor: Hong Wan Ng , Seng Kim Ye , Kelvin Tan Aik Boo , Ling Pan , See Hiong Leow
IPC: H01L23/48 , H01L21/768 , H01L23/528
CPC classification number: H01L23/481 , H01L21/76879 , H01L21/76898 , H01L23/5283
Abstract: A semiconductor device assembly including a substrate; a first split via including a first via land that is disposed on a surface of the substrate and that has a first footprint with a half-moon shape with a first radius of curvature, and a first via that passes through the substrate and that has a second radius of curvature, wherein the first via is disposed within the first footprint; and a second split via including a second via land that is disposed on the surface of the substrate and that has a second footprint with the half-moon shape with the first radius of curvature, and a second via that passes through the substrate and that has the second radius of curvature, wherein the second via is disposed within the second footprint, wherein the first and second via lands are disposed entirely within a circular region having the first radius of curvature.
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22.
公开(公告)号:US20230282559A1
公开(公告)日:2023-09-07
申请号:US17686225
申请日:2022-03-03
Applicant: Micron Technology, Inc.
Inventor: Hong Wan Ng , Chin Hui Chong , Kelvin Tan Aik Boo , Seng Kim Ye
IPC: H01L23/498 , H01L23/552 , H01L21/48 , H01L25/065 , H01L23/00
CPC classification number: H01L23/49838 , H01L23/552 , H01L23/49816 , H01L21/4846 , H01L25/0657 , H01L24/08 , H01L24/48 , H01L24/80 , H01L24/49 , H01L25/0652 , H01L2224/08225 , H01L2224/80001 , H01L2224/48225 , H01L2224/48145 , H01L2224/49112 , H01L2225/06562 , H01L2225/06506 , H01L2225/0651
Abstract: A semiconductor device assembly is provided. The assembly includes a substrate having an upper surface on which is disposed a first device contact, a keep-out region extending from a first side surface of the substrate to a second side surface of the substrate opposite the first, and at least one trace coupled to the first device contact and extending across the keep out region towards a third side surface of the substrate. The assembly further includes at least one semiconductor device disposed over the upper surface of the substrate and coupled to the first device contact. The keep-out region of the substrate is free from conductive structures other than the at least one trace.
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公开(公告)号:US11562987B2
公开(公告)日:2023-01-24
申请号:US17232333
申请日:2021-04-16
Applicant: Micron Technology, Inc.
Inventor: Chin Hui Chong , Hong Wan Ng , Hem P. Takiar , Seng Kim Ye , Kelvin Tan Aik Boo
IPC: H01L25/065 , H01L23/498 , H01L23/538 , H01L23/00 , H01L25/00 , H01L23/31
Abstract: Semiconductor devices having multiple substrates and die stacks, and associated systems and methods, are disclosed herein. In some embodiments, a semiconductor device includes a package substrate, and a first die stack mounted on the package substrate and including a plurality of first memory dies. The device can include a substrate mounted on the first die stack, the substrate including a plurality of routing elements. The device can also include a second die stack mounted on the substrate, the second die stack including a plurality of second memory dies. The device can further include a controller die mounted on the substrate. The controller die can be configured to communicate with the second die stack via the routing elements of the substrate. The device can include a mold material encapsulating the first die stack, the second die stack, the substrate, and the controller die.
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公开(公告)号:US20210358888A1
公开(公告)日:2021-11-18
申请号:US15931388
申请日:2020-05-13
Applicant: Micron Technology, Inc.
Inventor: Kelvin Tan Aik Boo , Chin Hui Chong , Seng Kim Ye , Hong Wan Ng , Hem P. Takiar
IPC: H01L25/065 , H01L23/498 , H01L23/00 , H01L25/00
Abstract: An apparatus includes an integrated circuit and a substrate coupled to the integrated circuit. The substrate includes a primary layer having a first surface that is a first external surface of the substrate. The primary layer includes an open area that extends through the primary layer to an inner layer of the substrate. The substrate includes a secondary layer. The inner layer is located between the primary layer and the secondary layer. The inner layer includes a third surface that is orientated approximately parallel to the first surface of the primary layer. A portion of the third surface of the inner layer is exposed via the open area of the primary layer. A first plurality of wire bond pads are disposed on the portion of the third surface of the inner layer that is exposed via the open area of primary layer.
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公开(公告)号:US20250079405A1
公开(公告)日:2025-03-06
申请号:US18951102
申请日:2024-11-18
Applicant: Micron Technology, Inc.
Inventor: Kelvin Tan Aik Boo , Hong Wan Ng , Seng Kim Ye , Chin Hui Chong
IPC: H01L25/065 , H01L25/00
Abstract: Semiconductor devices having three-dimensional bonding schemes and associated systems and methods are disclosed herein. In some embodiments, the semiconductor device includes a package substrate, a stack of semiconductor dies carried by the package substrate, and an interconnect module carried by the package substrate adjacent the stack of semiconductor dies. The stack of semiconductor dies can include a first die carried by the package substrate and a second die carried by the first die. Meanwhile, the interconnect module can include at least a first tier and a second tier. The first tier can be carried by and electrically coupled to the package substrate, and the second tier can be carried by and electrically coupled to the first tier. In turn, the second die can be electrically coupled to the second tier.
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公开(公告)号:US12243807B2
公开(公告)日:2025-03-04
申请号:US18398120
申请日:2023-12-27
Applicant: Micron Technology, Inc.
Inventor: Hong Wan Ng , Chin Hui Chong , Hem P. Takiar , Seng Kim Ye , Kelvin Tan Aik Boo
Abstract: Substrates for semiconductor packages, including hybrid substrates for decoupling capacitors, and associated devices, systems, and methods are disclosed herein. In one embodiment, a substrate includes a first pair and a second pair of electrical contacts on a first surface of the substrate. The first pair of electrical contacts can be configured to receive a first surface-mount capacitor, and the second pair of electrical contacts can be configured to receive a second surface-mount capacitor. The first pair of electrical contacts can be spaced apart by a first space, and the second pair of electrical contacts can be spaced apart by a second space. The first and second spaces can correspond to corresponding to first and second distances between electrical contacts of the first and second surface-mount capacitors.
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27.
公开(公告)号:US20240404995A1
公开(公告)日:2024-12-05
申请号:US18646688
申请日:2024-04-25
Applicant: Micron Technology, Inc.
Inventor: Chin Hui Chong , Hong Wan Ng , See Hiong Leow , Ling Pan , Seng Kim Ye , Kelvin Tan Aik Boo
IPC: H01L25/065 , H01L25/00 , H05K1/02 , H10B80/00
Abstract: An apparatus includes selectable a circuit placement mechanism configured to support two or more different circuit layouts. The circuit placement mechanism may include an overlap of electrical connections associated with the two or more circuit layouts and joined through an etch back selector. The etch back selector may enable the apparatus to function according to a selected one of the two or more different circuit layouts.
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28.
公开(公告)号:US20240234403A1
公开(公告)日:2024-07-11
申请号:US18545996
申请日:2023-12-19
Applicant: Micron Technology, Inc.
Inventor: Seng Kim Dalson Ye , Kelvin Tan Aik Boo , Hong Wan Ng , See Hiong Leow , Ling Pan
IPC: H01L25/18 , H01L21/48 , H01L23/498 , H01L25/00 , H10B80/00
CPC classification number: H01L25/18 , H01L21/4853 , H01L23/49811 , H01L23/49822 , H01L23/49833 , H01L25/50 , H10B80/00 , H01L24/48
Abstract: A microelectronic device package includes a microelectronic device coupled to a substrate. The microelectronic device package further includes a stack of semiconductor dies positioned over the microelectronic device. The microelectronic device package also includes an interposer positioned between the microelectronic device and the stack of semiconductor dies. The interposer includes a conductive structure electrically connecting the microelectronic device and a ground circuit of the substrate. The interposer further includes an insulative structure positioned between the conductive structure and the stack of semiconductor dies.
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公开(公告)号:US20240203963A1
公开(公告)日:2024-06-20
申请号:US18588595
申请日:2024-02-27
Applicant: Micron Technology, Inc.
Inventor: Hong Wan Ng , Kelvin Tan Aik Boo , Chin Hui Chong , Hem P. Takiar , Seng Kim Ye
IPC: H01L25/16 , H01L21/56 , H01L23/31 , H01L25/00 , H01L25/065
CPC classification number: H01L25/16 , H01L21/563 , H01L23/3192 , H01L25/0657 , H01L25/50 , H01L28/40
Abstract: Semiconductor devices and associated systems and methods are disclosed herein. In some embodiments, the semiconductor device is an assembly that includes a package substrate having a front side and a backside opposite the front side. A controller die with a first longitudinal footprint can be attached to the front side of the package substrate. A passive electrical component is also attached to the front side of the package substrate. A stack of semiconductor dies can be attached to the controller die and the passive electrical component. The stack of semiconductor dies has a second longitudinal footprint greater than the first longitudinal footprint in at least one dimension. The controller die and the passive electrical component are positioned at least partially within the second longitudinal footprint, thereby at least partially supporting the stack of semiconductor dies.
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公开(公告)号:US20240128163A1
公开(公告)日:2024-04-18
申请号:US18398120
申请日:2023-12-27
Applicant: Micron Technology, Inc.
Inventor: Hong Wan Ng , Chin Hui Chong , Hem P. Takiar , Seng Kim Ye , Kelvin Tan Aik Boo
IPC: H01L23/48 , H01L23/498 , H01L27/08
CPC classification number: H01L23/481 , H01L23/49816 , H01L27/0805 , H01L28/40
Abstract: Substrates for semiconductor packages, including hybrid substrates for decoupling capacitors, and associated devices, systems, and methods are disclosed herein. In one embodiment, a substrate includes a first pair and a second pair of electrical contacts on a first surface of the substrate. The first pair of electrical contacts can be configured to receive a first surface-mount capacitor, and the second pair of electrical contacts can be configured to receive a second surface-mount capacitor. The first pair of electrical contacts can be spaced apart by a first space, and the second pair of electrical contacts can be spaced apart by a second space. The first and second spaces can correspond to corresponding to first and second distances between electrical contacts of the first and second surface-mount capacitors.
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