Surface Inspection Device
    26.
    发明公开

    公开(公告)号:US20240118223A1

    公开(公告)日:2024-04-11

    申请号:US18285295

    申请日:2021-04-14

    CPC classification number: G01N21/9501 G01N2201/025

    Abstract: A surface inspection device (1) according to the present invention comprises: a plate-shaped sample holding member (3) which can hold a sample (2); a spindle motor (4) for rotating the sample holding member (3); a turntable (5) which is fixed to the spindle motor (4) and rotated by the spindle motor (4); a frame (6) to which the spindle motor (4) is fixed; a plurality of support members (12) each having one end fixed to the sample holding member (3) and the other end fixed to the turntable (5), the support members supporting the sample holding member (3) such that the sample holding member is displaceable in a focus direction which is the height direction with respect to the turntable (5); and a sample drive unit (11) which displaces the sample holding member (3) in the focus direction with respect to the turntable (5). This surface inspection device (1) can accurately drive the sample (2) in the focus direction.

    Method and device for gemstone evolution

    公开(公告)号:US10006868B2

    公开(公告)日:2018-06-26

    申请号:US14899586

    申请日:2013-09-11

    CPC classification number: G01N21/87 G01N1/34 G01N2201/025 G01N2201/06113

    Abstract: The present invention relates to the method and device to determination of the properties of gemstones and more particularly evolution of gemstone by detection of internal and external structure of gemstone. In particular, the present invention methods and device is used to identify the size, location of impurities/defects in raw gemstone with the help of optimize spectroscopy scanning. The present invention method and device is used for precise automatic evolution of gemstones and possibilities (estimation) of final value of planned gemstone after remaining gemstone processing cycle.

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