Sensing in Meat Products and the Like
    21.
    发明申请
    Sensing in Meat Products and the Like 审中-公开
    感觉肉制品等

    公开(公告)号:US20080204733A1

    公开(公告)日:2008-08-28

    申请号:US11795159

    申请日:2006-01-12

    Abstract: Methods and devices for sensing foreign bodies and the like in products, such as food products, are described. Said products, which are generally light transmissive, are backlit by a source of light and an image of said object is taken. In one form of the invention, the light is polarized both before an after transmission through the said object. In another form of the invention, the products are conveyed by a holder having gaps therein that allows the light from said light source to pass through said holder. In some forms of the invention, the source of light has a power output dependent on the dimensions of said object.

    Abstract translation: 对食品等产品中异物等的检测方法和装置进行了说明。 所述产品通常是透光的,被光源背光,并且拍摄所述物体的图像。 在本发明的一种形式中,光在通过所述物体的透射之后被极化。 在本发明的另一形式中,产品由其中具有间隙的保持器传送,允许来自所述光源的光通过所述保持器。 在本发明的一些形式中,光源具有取决于所述物体的尺寸的功率输出。

    Method of verifying color and strength properties of batches of wood stains
    22.
    发明授权
    Method of verifying color and strength properties of batches of wood stains 失效
    验证木材批次的颜色和强度性能的方法

    公开(公告)号:US07042566B2

    公开(公告)日:2006-05-09

    申请号:US10811094

    申请日:2004-03-26

    Abstract: A method of verifying the color and tinting strength of a manufactured batch of a semi-transparent wood stain. In accordance with the method, a standard batch of the wood stain is formed and then mixed with a specified amount of a white colorant to form a standard measurement batch. A test sample of the manufactured batch is obtained and is also mixed with a specified amount of the white colorant to form a test measurement sample. Layers of the standard measurement batch and the test measurement sample are formed on the substrates and complete hide obtained. Reflectance measurements of the layers are made using a spectrophotometer. The reflectance measurements are used to determine if the color and the tinting strength of the manufactured batch is within an acceptable deviation range of the color and tinting strength of the standard batch. This allows for objective color difference and tint strength difference calculations, and adjustments can be made therefrom, therefore eliminating the past visual trial and error methods.

    Abstract translation: 一种验证制造的半透明木纹的批次的颜色和着色强度的方法。 根据该方法,形成标准批次的木纹,然后与指定量的白色着色剂混合以形成标准测量批料。 获得制造的批次的测试样品,并将其与指定量的白色着色剂混合以形成测试测量样品。 在基板上形成标准测量批次和测试测量样品的层,并获得完整的隐藏。 层的反射率测量使用分光光度计进行。 使用反射率测量来确定制造的批次的颜色和着色强度是否在标准批次的颜色和着色强度的可接受的偏差范围内。 这允许目标色差和色调强度差计算,并且可以进行调整,从而消除过去的视觉试验和误差方法。

    Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected
    24.
    发明授权
    Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected 失效
    半导体基板的制造方法以及检查被检体的图案的缺陷的方法和装置

    公开(公告)号:US06404498B1

    公开(公告)日:2002-06-11

    申请号:US09588201

    申请日:2000-06-06

    Abstract: A pattern detection method and apparatus for inspecting, with high resolution, a micro fine defect of a pattern on an inspected object, and a semiconductor substrate manufacturing method and system with a high yield. A micro fine pattern on the inspected object is inspected by annular-looped illumination through an objective lens onto a wafer, the wafer having micro fine patterns thereon. The illumination may be polarized and controlled according to an image detected on the pupil of the objective lens, and image signals are obtained by detecting a reflected light from the wafer. The image signals are compared with reference image signals and a part of the pattern showing inconsistency is detected as a defect. Simultaneously, micro fine defects on the micro-fine pattern are detected with high resolution. Further, process conditions of a manufacturing line are controlled by analyzing a cause of defect and a factor of defect.

    Abstract translation: 用于以高分辨率检查被检查物体上的图案的微细缺陷的图案检测方法和装置,以及高产率的半导体基板制造方法和系统。 被检查物体上的微细图案通过物镜通过环形照明被检查到晶片上,晶片上具有微细精细图案。 照明可以根据在物镜的光瞳上检测到的图像进行偏振和控制,并且通过检测来自晶片的反射光来获得图像信号。 将图像信号与参考图像信号进行比较,并且检测出显示不一致的图案的一部分作为缺陷。 同时,以高分辨率检测微细图案上的微细缺陷。 此外,通过分析缺陷的原因和缺陷因素来控制生产线的工艺条件。

    ADJUSTABLE OPTICAL SYSTEM FOR A SPECTROGRAPH
    25.
    发明公开

    公开(公告)号:US20240361234A1

    公开(公告)日:2024-10-31

    申请号:US18309390

    申请日:2023-04-28

    CPC classification number: G01N21/31 G01N2201/0633 G01N2201/0634

    Abstract: A spectrograph includes a base, a first optic mounted with respect to the base, a second optic mounted with respect to the base, and a third optic mounted with respect to the base. A first relative position between the first optic and the second optic is adjustable about a first pivot axis. A second relative position between the second optic and the third optic is adjustable about a second pivot axis independently from the adjustability of the relative position between the first optic and the second optic. The second pivot axis is substantially coincident with the first pivot axis, and a distance between the third optic and the second optic is fixed during adjustment of the second relative position.

    METHOD AND APPARATUS FOR DETERMINING A FORCE APPLIED TO A SAMPLE DURING AN OPTICAL INTERROGATION TECHNIQUE

    公开(公告)号:US20240310277A1

    公开(公告)日:2024-09-19

    申请号:US18668978

    申请日:2024-05-20

    CPC classification number: G01N21/3563 G01L1/22 G01N2201/0634

    Abstract: An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.

    Glycosuria measurement device
    28.
    发明授权

    公开(公告)号:US11879888B2

    公开(公告)日:2024-01-23

    申请号:US17566474

    申请日:2021-12-30

    Abstract: The invention discloses a glycosuria measurement device, comprising a prism body and a housing. The prism body comprises a first accommodating space, a junction surface, a first light penetrating surface, a second light penetrating surface, a third light penetrating surface and a light-emitting surface. The first accommodating space accommodates urine. The junction surface is formed at a bottom surface of the first accommodating space. The first light penetrating surface is formed at the first lateral surface of the first accommodating space. The second light penetrating surface is formed at the second lateral surface of the first accommodating space. The third light penetrating surface is disposed opposite to the junction surface. The light-emitting surface is disposed opposite to the junction surface. The housing comprises a second accommodating space, a first light-emitting port and a second light-emitting port. The second accommodating space accommodates the prism body.

    MEASURING APPARATUS
    30.
    发明公开
    MEASURING APPARATUS 审中-公开

    公开(公告)号:US20230288323A1

    公开(公告)日:2023-09-14

    申请号:US18014756

    申请日:2021-07-08

    CPC classification number: G01N21/35 G01N2201/0634

    Abstract: A measuring apparatus includes a light source configured to emit light in a mid-infrared region, the light including: first-wavelength light having a wave number of from 970 cm-1 or more to 1010 cm-1 or less; and second-wavelength light different from the first-wavelength light, the second-wavelength light having a wave number of from 950 cm-1 or more to 990 cm-1 or less; a photosensor configured to detect the light emitted from the light source and reflected by a measurement target; and an information processing device configured to: obtain a first absorbance of the first-wavelength light and a second absorbance of the second-wavelength light from an output of the photosensor; and determine a biomarker of the measurement target based on the first absorbance and the second absorbance.

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