公开(公告)号：US12106467B2

公开(公告)日：2024-10-01

申请号：US17598062

申请日：2020-03-24

Applicant: JFE STEEL CORPORATION

Inventor： Yuki Takaki ,  Junichi Yotsuji ,  Taku Watanabe

IPC: G06K9/00 ,  G06T7/00 ,  G06T7/215 ,  G06T7/73 ,  G06V20/64

CPC classification number: G06T7/0006 ,  G06T7/215 ,  G06T7/73 ,  G06V20/64 ,  G06T2207/10016 ,  G06T2207/30132 ,  G06V2201/06

Abstract: An inspection apparatus for coke oven construction that is configured to check accuracy after refractories are laid in oven construction work for updating or newly creating a coke oven that produces coke. The inspection apparatus includes an image capturing device configured to acquire an image of a work area where oven construction work is in progress, measurement region determining means configured to identify a work-completed area where laying work has been completed on the basis of the image of the work area acquired by the image capturing device, and determine the identified work-completed area as a measurement region, and a refractory position measuring device configured to check laying accuracy by measuring positions of laid refractories in the measurement region determined by the measurement region determining means.

公开(公告)号：US12087421B2

公开(公告)日：2024-09-10

申请号：US18541004

申请日：2023-12-15

Applicant: INTER X CO., LTD.

Inventor： Jung Ywn Park ,  Ha Il Jung ,  Jeong Hyun Park

IPC: G06Q20/16 ,  G01N21/88 ,  G16H20/10 ,  G16H80/00 ,  G16H10/60

CPC classification number: G16H20/10 ,  G01N21/8851 ,  G06Q20/16 ,  G16H80/00 ,  G01N2021/8854 ,  G06V2201/06 ,  G16H10/60

Abstract: Disclosed are a product surface inspecting apparatus and method which detect a defect on products having different feature using a previously trained artificial neural network. A product surface inspecting apparatus according to an exemplary embodiment includes a sensor unit which photographs a product to generate image data and measures at least one of a color, a saturation, a brightness, a transparency, and a reflectance of the product; and a detection unit which detects a defect on a product by inputting the image data to a convolutional neural network trained to detect a defect on a product surface, the number of convolution layers of the convolutional neural network may be determined based on at least one of the color, the saturation, the brightness, the transparency, and the reflectance of the product.

公开(公告)号：US12068182B2

公开(公告)日：2024-08-20

申请号：US17736503

申请日：2022-05-04

Applicant: National Tsing Hua University

Inventor： Wei-Chang Yeh ,  Shi-Yi Tan ,  Yuan Tzu Lin

IPC: H01L21/67 ,  G06V30/14 ,  H01L21/673 ,  H01L21/68

CPC classification number: H01L21/67294 ,  G06V30/1431 ,  G06V30/1437 ,  H01L21/67265 ,  H01L21/67303 ,  H01L21/681 ,  G06V2201/06

Abstract: A device for recognizing wafer identification number with automatically turning on and off recognizing function comprises a base, a support frame, a light source, a plurality of image capturing units, an image recognition unit and a control unit. The base comprises a wafer boat placing portion and a first switch disposed on the wafer boat placing portion. The light source and the image capturing units are disposed on the support frame. The control unit is electrically connected to the first switch, the light source, the image capturing units and the image recognition unit. As such, the device for recognizing wafer identification number with automatically turning on and off recognizing function can automatically turn on and off the light source, the image capturing units, and the image recognition unit, therefore the operation is very easy and convenience.

公开(公告)号：US20240153138A1

公开(公告)日：2024-05-09

申请号：US18414409

申请日：2024-01-16

Applicant: ZHEJIANG HUARAY TECHNOLOGY CO., LTD.

Inventor： Jing LI ,  Rui YU ,  Lu ZHOU

IPC: G06T7/73 ,  G06T1/00 ,  G06V10/74 ,  G06V10/764 ,  G06V10/77 ,  G06V10/80

CPC classification number: G06T7/74 ,  G06T1/0014 ,  G06V10/761 ,  G06V10/764 ,  G06V10/7715 ,  G06V10/806 ,  G06T2207/30164 ,  G06V2201/06

Abstract: The embodiments of the present disclosure provide a method for positioning a target object. The method may include: determining an identification result by processing an image based on an identification model, wherein the identification result includes a first position of each of at least one target object in a first coordinate system; determining, from the image, a target image of each of the at least one target object based on the first position of each of the at least one target object in the first coordinate system; and determining, based on a first reference image and the target image of each of the at least one target object, a second position of each of the at least one target object in a second coordinate system, wherein the second position is configured to determine operation parameters of an operating device.

公开(公告)号：US20240135583A1

公开(公告)日：2024-04-25

申请号：US18208660

申请日：2023-06-11

Applicant: Cognex Corporation

Inventor： Nathaniel R. Bogan

IPC: G06T7/73 ,  G06F18/28 ,  G06T7/00 ,  G06T7/33 ,  G06V10/44 ,  G06V10/46 ,  G06V10/75 ,  G06V10/772

CPC classification number: G06T7/75 ,  G06F18/28 ,  G06T7/001 ,  G06T7/344 ,  G06V10/44 ,  G06V10/46 ,  G06V10/752 ,  G06V10/772 ,  G06T2207/20081 ,  G06T2207/30164 ,  G06V2201/06

Abstract: A system and method for scoring trained probes for use in analyzing one or more candidate poses of a runtime image is provided. A set of probes with location and gradient direction based on a trained model are applied to one or more candidate poses based upon a runtime image. The applied probes each respectively include a discrete set of position offsets with respect to the gradient direction thereof. A match score is computed for each of the probes, which includes estimating a best match position for each of the probes respectively relative to one of the offsets thereof, and generating a set of individual probe scores for each of the probes, respectively at the estimated best match position.

公开(公告)号：US11935216B2

公开(公告)日：2024-03-19

申请号：US16940778

申请日：2020-07-28

Applicant: TE Connectivity Services GmbH ,  Tyco Electronics (Shanghai) Co., Ltd.

Inventor： Roberto Francisco-Yi Lu ,  Sonny O. Osunkwo ,  Dandan Zhang ,  Jiankun Zhou ,  Lei Zhou

IPC: G06T5/40 ,  B07C5/342 ,  G01N21/88 ,  G06F18/21 ,  G06T5/00 ,  G06T7/00 ,  G06V10/20 ,  G06V30/10

CPC classification number: G06T5/40 ,  B07C5/342 ,  G01N21/8851 ,  G06F18/21 ,  G06T5/009 ,  G06T7/0004 ,  G06V10/255 ,  G06V30/10 ,  B07C2501/0063 ,  G01N2021/8887 ,  G06T2200/28 ,  G06T2207/20081 ,  G06V2201/06

Abstract: A vision inspection system includes a sorting platform having an upper surface supporting parts for inspection. An inspection station is positioned adjacent the sorting platform including an imaging device to image the parts in a field of view. A vision inspection controller receives images from the imaging device. The vision inspection controller includes an image histogram tool to pre-process the images to improve contrast of the images by redistributing lightness values of the images based on adaptive histogram equalization processing to generate enhanced images. The vision inspection controller processes the enhanced images based on an image analysis model to determine inspection results for each of the parts. The vision inspection controller has an artificial intelligence learning module operated to customize and configure the image analysis model based on the enhanced images.

公开(公告)号：US20240062513A1

公开(公告)日：2024-02-22

申请号：US18498112

申请日：2023-10-31

Applicant: CHENGDU QINCHUAN IOT TECHNOLOGY CO., LTD.

Inventor： Zehua SHAO ,  Bin LIU ,  Yuefei WU ,  Yaqiang QUAN ,  Junyan ZHOU

IPC: G06V10/74 ,  G06F21/60 ,  G06V10/40 ,  G06V10/764 ,  G16Y10/25 ,  G16Y30/10 ,  H04L67/12

CPC classification number: G06V10/761 ,  G06F21/602 ,  G06V10/40 ,  G06V10/764 ,  G16Y10/25 ,  G16Y30/10 ,  H04L67/12 ,  G06V2201/06

Abstract: The present disclosure discloses Industrial Internet of Things (IIoT) system for industrial production data management, control method, and storage medium. By adopting different encryption methods for different image data, and without changing the overall architecture of the cloud computing Internet of Things, the safe penetration of sensitive data on the cloud computing platform is realized, which effectively improves the security of sensitive data. In addition, it does not require additional wiring, reducing the networking cost of the Internet of Things, which has high applicability.

公开(公告)号：US11887296B2

公开(公告)日：2024-01-30

申请号：US17519011

申请日：2021-11-04

Applicant: KLA Corporation

Inventor： Raja Barnwal ,  Saptarshi Majumder

IPC: G06T7/00 ,  G06V10/20 ,  G06V20/80

CPC classification number: G06T7/001 ,  G06T7/0006 ,  G06V10/255 ,  G06V20/80 ,  G06T2207/30148 ,  G06T2207/30168 ,  G06T2207/30242 ,  G06V2201/06

Abstract: Methods and systems for setting up care areas (CAs) for inspection of a specimen are provided. One system includes an imaging subsystem configured for generating images of a specimen and a computer subsystem configured for determining a number of defects detected in predefined cells within one or more of the images generated in a repeating patterned area formed on the specimen. The computer subsystem is also configured for comparing the number of the defects detected in each of two or more of the predefined cells to a predetermined threshold and designating any one or more of the two or more of the predefined cells in which the number of the defects is greater than the predetermined threshold as one or more CAs. In addition, the computer subsystem is configured for storing information for the one or more CAs for use in inspection of the specimen.

公开(公告)号：US11885204B2

公开(公告)日：2024-01-30

申请号：US17249660

申请日：2021-03-09

Applicant: NATIONAL OILWELL VARCO NORWAY AS

Inventor： Hugo Leonardo Rosano ,  Stig Vidar Trydal ,  Erik Haavind ,  Frode Jensen

IPC: G06K9/00 ,  E21B41/00 ,  E21B19/00 ,  F16P3/14 ,  G06V20/52 ,  E21B44/02 ,  G06F18/2413 ,  H04N13/271 ,  H04N13/243

CPC classification number: E21B41/0021 ,  E21B19/00 ,  E21B41/00 ,  E21B44/02 ,  F16P3/142 ,  G06F18/2413 ,  G06V20/52 ,  H04N13/243 ,  H04N13/271 ,  G06V2201/06

Abstract: A system comprising a drilling rig having a rig floor, a derrick, a master control computer system and at least one camera, the at least one camera capturing a master image of at least a portion of the rig floor, sending the master image to the master control computer, the master control computer system mapping said master image into a model to facilitate control of items on said drilling rig.

公开(公告)号：US11854182B2

公开(公告)日：2023-12-26

申请号：US17411339

申请日：2021-08-25

Applicant: UnitX, Inc.

Inventor： Kedao Wang

IPC: G06T7/00 ,  G06T7/62 ,  G06T7/73 ,  G06V10/22 ,  G06V10/82 ,  G06T3/40 ,  B25J11/00

CPC classification number: G06T7/0006 ,  B25J11/00 ,  G06T3/40 ,  G06T7/62 ,  G06T7/73 ,  G06V10/22 ,  G06V10/82 ,  G06T2207/20084 ,  G06T2207/30108 ,  G06T2207/30164 ,  G06V2201/06

Abstract: The present disclosure provides a dimensional measurement method and device based on deep learning. The method includes capturing a target image of a target object, obtaining measurement data for the target image, and determining whether or not the target object is within a preset tolerance.