AI-based product surface inspecting apparatus and method

    公开(公告)号:US12087421B2

    公开(公告)日:2024-09-10

    申请号:US18541004

    申请日:2023-12-15

    Abstract: Disclosed are a product surface inspecting apparatus and method which detect a defect on products having different feature using a previously trained artificial neural network. A product surface inspecting apparatus according to an exemplary embodiment includes a sensor unit which photographs a product to generate image data and measures at least one of a color, a saturation, a brightness, a transparency, and a reflectance of the product; and a detection unit which detects a defect on a product by inputting the image data to a convolutional neural network trained to detect a defect on a product surface, the number of convolution layers of the convolutional neural network may be determined based on at least one of the color, the saturation, the brightness, the transparency, and the reflectance of the product.

    Deep learning system applicable for quality inspection by learning only non-defective manufactured product data and control method thereof

    公开(公告)号:US12146839B1

    公开(公告)日:2024-11-19

    申请号:US18787162

    申请日:2024-07-29

    Abstract: A deep learning-based quality inspection system by learning only non-defective manufactured product data may include: an input unit receiving a non-defective manufactured product image data set; a preprocessor preprocessing a model to learn the images with a same size by not applying a cropping task to cut and process only an area at a specific location within each image for each of the plurality of images included in the image data set, but applying a resizing task of adjusting each image to a desired size and a padding task of adjusting the size of the image while maintaining a ratio of each image as it is; and a controller extracting a non-defective manufactured product feature which becomes a non-defective manufactured product criterion from the preprocessed image, and generating a plurality of fake defective manufactured product features by adding a Gaussian noise feature to the extracted non-defective manufactured product feature.

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