METHOD FOR CONTINUOUSLY DETERMINING ALL OF THE COMPONENTS OF THE RESISTANCE TENSOR OF THIN FILMS

    公开(公告)号:US20210231595A1

    公开(公告)日:2021-07-29

    申请号:US16981735

    申请日:2019-03-19

    Inventor: Tobias KOSUB

    Abstract: A method for continuously determining all of the components of the resistance tensor of thin films, such as thin film resistors and thin film sensors of all types, is disclosed. A continuous determination of all the components of the resistance tensor is facilitated without switching the contact points using a minimum number of contacts. A homogeneous thin film part of any shape is provided with a least three contact points arranged at distances from one another. An input voltage is applied at each of the contact points, the current flowing through the contact points are detected, and the complete resistance tensor of the thin film part is determined from the voltage and current values.

    TRANSPARENT SPECIMEN SLIDE
    40.
    发明申请

    公开(公告)号:US20210024863A1

    公开(公告)日:2021-01-28

    申请号:US17044592

    申请日:2019-04-03

    Abstract: A transparent specimen slide on which the range and the magnitude of the near-surface electrostatic forces can be influenced and set during a process of producing the specimen slide. The specimen slide has a surface on the supporting side and a surface facing away from the supporting side and at least three layers: an electrically insulating first layer, a silicon-containing second layer arranged on the first layer, and an electrically insulating third layer arranged on the second layer. An interface is formed between the first and second layers and between the second and third layers with a first surface charge density. The interface between the second and third layers has a second surface charge density. The first and second surface charge densities have the same or different signs.

Patent Agency Ranking