SYSTEMS FOR ULTRASONIC INSPECTION OF A SURFACE

    公开(公告)号:US20230228719A1

    公开(公告)日:2023-07-20

    申请号:US18189674

    申请日:2023-03-24

    CPC classification number: G01N29/265 G01N29/04 G01N2291/0289

    Abstract: Systems for ultrasonic measurements of an inspection surface is described. An inspection robot with a payload moves in a direction of travel across an inspection surface. The payload has two sensor holders, the first sensor holder to hold a first UT array at a first orientation and the second to hold a second UT array at a second orientation A sensor holder linking component holds the two UT phased arrays in a parallel configuration along their long edges. An arm of the payload may be pivotably connected to both the sensor linking component at one end and a lift connection element on the other end. The lift component has a lift motor to raise the lift connection element. A rastering device moves the payload in a direction of inspection which is distinct from both the direction of travel and the parallel configuration of the two phased UT arrays.

    ROBOTIC SYSTEMS FOR RAPID ULTRASONIC SURFACE INSECTION

    公开(公告)号:US20220341892A1

    公开(公告)日:2022-10-27

    申请号:US17824656

    申请日:2022-05-25

    Abstract: Robotic systems for rapid ultrasonic surface inspection are described. An example system may have an inspection robot to move in a direction of travel on an inspection surface. The robot may have a payload with a first and a second ultrasonic (UT) phased array, and a rastering device that executes a reciprocating motion of the payload. The system may have an inspection controller with a positioning circuit to provide an inspection position command, an inspection circuit to provide a rastering position command and an interrogation command. The robot is responsive to the inspection position command to move to an inspection position, and the rastering device is responsive to the rastering position command to move the payload through at least a portion of a range of reciprocating motion. The UT phased arrays are responsive to the interrogation command to perform an inspection on three axes of inspection.

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