Apparatuses and methods for magnetic features of articles
    31.
    发明授权
    Apparatuses and methods for magnetic features of articles 有权
    物品磁性特征的装置和方法

    公开(公告)号:US09217715B2

    公开(公告)日:2015-12-22

    申请号:US14193808

    申请日:2014-02-28

    CPC classification number: G01N21/8806 G01N21/4738 G01N21/95

    Abstract: Provided herein are apparatuses and methods related thereto, wherein at least one apparatus includes: a photon emitting means configured to emit photons, wherein the photons are scattered from magnetic features of an article; a photon detector array configured to receive scattered photons; and a processing means configured to differentiate the magnetic features from the scattered photons.

    Abstract translation: 这里提供的装置和方法,其中至少一个装置包括:配置成发射光子的光子发射装置,其中光子从物品的磁特征散射; 构造成接收散射光子的光子检测器阵列; 以及配置成将磁特征与散射光子区分开的处理装置。

    ARTICLE EDGE INSPECTION
    32.
    发明申请
    ARTICLE EDGE INSPECTION 有权
    文章检查

    公开(公告)号:US20140354980A1

    公开(公告)日:2014-12-04

    申请号:US14096002

    申请日:2013-12-03

    Abstract: Provided herein is an apparatus, including a photon emitting means for emitting photons onto surface edges of an article, a photon detecting means for detecting photons scattered from particles on the surface edges of the article, and a mapping means for mapping a particle or a defect of the surface of the article.

    Abstract translation: 本文提供了一种装置,包括用于将光子发射到物品的表面边缘上的光子发射装置,用于检测从物品的表面边缘上的颗粒散射的光子的光子检测装置,以及用于映射颗粒或缺陷的映射装置 的物品表面。

    DISTINGUISHING FOREIGN SURFACE FEATURES FROM NATIVE SURFACE FEATURES
    33.
    发明申请
    DISTINGUISHING FOREIGN SURFACE FEATURES FROM NATIVE SURFACE FEATURES 有权
    从表面特征鉴别外观特征

    公开(公告)号:US20140104604A1

    公开(公告)日:2014-04-17

    申请号:US14032186

    申请日:2013-09-19

    CPC classification number: G01N21/956 G01N21/00 G01N21/94 G01N21/95

    Abstract: Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article.

    Abstract translation: 本文提供的装置包括光子检测器阵列; 以及处理装置,其被配置用于处理光子检测器阵列信号,所述光子检测器阵列信号对应于从聚焦在第一焦平面中的物体的表面特征散射的第一组光子和从聚焦在第二焦点的物体的表面特征散射的第二组光子散射的光子 焦平面,其中所述处理装置还被配置用于将所述制品的外来表面特征与所述制品的外来本机特征区分开。

    METHOD FOR ENCODER FREQUENCY-SHIFT COMPENSATION
    35.
    发明申请
    METHOD FOR ENCODER FREQUENCY-SHIFT COMPENSATION 有权
    编码器频移补偿方法

    公开(公告)号:US20130169315A1

    公开(公告)日:2013-07-04

    申请号:US13775098

    申请日:2013-02-22

    CPC classification number: H03L7/06 H01J37/3174 H03B21/00 H03L7/08

    Abstract: A method for encoder frequency-shift compensation includes determining frequency values of an input encoder signal, determining repeatable frequency-shifts of the frequency values and generating a frequency-shift compensated clock using the repeatable frequency-shifts. A frequency-shift compensated clock includes a synthesizer configured to generate a frequency-shift compensated clock signal using repeatable frequency shifts and encoder clock signals.

    Abstract translation: 一种用于编码器频移补偿的方法包括:确定输入编码器信号的频率值,确定频率值的可重复频移,并使用可重复的频移产生频移补偿时钟。 频移补偿时钟包括合成器,其被配置为使用可重复的频移和编码器时钟信号来产生频移补偿的时钟信号。

    Raman apparatus and methods
    36.
    发明授权

    公开(公告)号:US10234395B2

    公开(公告)日:2019-03-19

    申请号:US14834418

    申请日:2015-08-24

    Abstract: Provided herein is an apparatus, including an excitation arm including excitation optics; a collection arm including collection optics, wherein the excitation arm and the collection arm are geometrically off-axis from one another for independent control of the excitation optics or the collection optics; and a full-surface spectroscopic analyzer to analyze a thin-film over an article from Raman-scattered light collected by the collection optics.

    Features maps of articles with polarized light

    公开(公告)号:US10152998B2

    公开(公告)日:2018-12-11

    申请号:US14280343

    申请日:2014-05-16

    Abstract: Provided herein is an apparatus including an imaging lens assembly configured to collect reflected light from a surface of an article; an image sensor configured to receive reflected light from the imaging lens assembly, wherein the imaging lens assembly and the image sensor are each arranged at different angles for focusing on substantially an entire surface of an article; and a processing means configured to process signals from the image sensor corresponding to polarized reflected light and subsequently generate one or more features maps.

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