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41.
公开(公告)号:US20190206823A1
公开(公告)日:2019-07-04
申请号:US15857332
申请日:2017-12-28
Applicant: INTEL CORPORATION
Inventor: Kristof Darmawikarta , Sri Ranga Sai Boyapati , Hiroki Tanaka , Robert A. May
IPC: H01L23/00 , H01L21/48 , H01L23/538 , H01L23/498
CPC classification number: H01L24/19 , H01L21/481 , H01L21/4853 , H01L23/49827 , H01L23/49838 , H01L23/49866 , H01L23/5381 , H01L23/5386 , H01L24/20
Abstract: An apparatus, comprising a substrate comprising a dielectric, a conductor, comprising a via embedded within the dielectric, the via has a first end and a second end, and substantially vertical sidewalls between the first end and the second end, and a conductive structure extending laterally from the first end of the via over the dielectric, wherein the via and the conductive structure have a contiguous microstructure.
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公开(公告)号:US20190198447A1
公开(公告)日:2019-06-27
申请号:US16329644
申请日:2016-09-30
Applicant: Intel Corporation
Inventor: Aleksandar Aleksov , Adel A. Elsherbini , Kristof Darmawikarta , Robert A. May , Sri Ranga Sai Boyapati
IPC: H01L23/538 , H01L23/498 , H01L23/00 , H01L21/48 , H01L25/065 , H01L25/18
Abstract: An apparatus is provided which comprises: a plurality of first conductive contacts having a first pitch spacing on a substrate surface, a plurality of second conductive contacts having a second pitch spacing on the substrate surface, and a plurality of conductive interconnects disposed within the substrate to couple a first grouping of the plurality of second conductive contacts associated with a first die site with a first grouping of the plurality of second conductive contacts associated with a second die site and to couple a second grouping of the plurality of second conductive contacts associated with the first die site with a second grouping of the plurality of second conductive contacts associated with the second die site, wherein the conductive interconnects to couple the first groupings are present in a layer of the substrate above the conductive interconnects to couple the second groupings. Other embodiments are also disclosed and claimed.
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公开(公告)号:US10121679B1
公开(公告)日:2018-11-06
申请号:US15721384
申请日:2017-09-29
Applicant: Intel Corporation
Inventor: Aleksandar Aleksov , Kristof Darmawikarta , Arnab Sarkar , Hiroki Tanaka , Robert A. May , Sri Ranga Sai Boyapati
IPC: H01L23/532 , H01L21/48 , H01L23/00 , H01L23/498
Abstract: Embodiments of the present disclosure may relate to a package substrate that may include a layer having a layer surface that is planarized and a via within the layer, where the via includes a via surface that is exposed on the layer surface, and where the via surface is planarized. The package substrate may further include a bond pad on the layer surface, where a first thickness of the bond pad includes a seed layer on the via surface, and where a second thickness of the bond pad includes a plating stack on the seed layer. Other embodiments may be described or claimed.
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