Method and arrangement for scanning microscopic specimens with a scanning device
    41.
    发明授权
    Method and arrangement for scanning microscopic specimens with a scanning device 有权
    用扫描装置扫描微观样品的方法和装置

    公开(公告)号:US06852964B2

    公开(公告)日:2005-02-08

    申请号:US09989275

    申请日:2001-11-19

    CPC classification number: G02B21/002

    Abstract: The present invention discloses a method and an arrangement for scanning microscopic specimens (15) with a scanning device. The microscopic specimen (15) is displaceable on a specimen stage (35) in at least two spatial directions. A light beam (3) scans the specimen (15) within a defined scan field (52) by way of a scanning module (7), and the light (17) proceeding from the specimen is detected. A PC (34) is also provided for analysis and calculation. The scan field (52) is defined in such a way that it incompletely encompasses a specimen region that is to be examined. Means (23, 31) are provided which displace the specimen stage (35) in such a way that the entire specimen region of interest can be covered by the plurality of resulting scan fields (521, 522, . . . 52n). The data of the individual scan fields (521, 522, . . . 52n) detected from the specimen region being examined are assembled in the PC (34) into an overall image.

    Abstract translation: 本发明公开了一种用扫描装置扫描微观样品(15)的方法和装置。 微观样品(15)可以在至少两个空间方向上在样品台(35)上移位。 光束(3)通过扫描模块(7)在限定的扫描场(52)内扫描样本(15),并且检测从样本进行的光(17)。 还提供PC(34)用于分析和计算。 扫描场(52)以不完全地包含要检查的样本区域的方式来定义。 提供装置(23,31),其使样本台(35)移动,使得整个样本感兴趣区域可被多个所得到的扫描场(521,522 ...,52n)覆盖。 从正在检查的样本区域检测到的各个扫描场(521,522 ... 52n)的数据在PC(34)中组装成整体图像。

    Light source for illumination in scanning microscopy, and scanning microscope
    42.
    发明授权
    Light source for illumination in scanning microscopy, and scanning microscope 有权
    扫描显微镜照明光源,扫描显微镜

    公开(公告)号:US06813073B2

    公开(公告)日:2004-11-02

    申请号:US09985015

    申请日:2001-11-01

    CPC classification number: B82Y15/00 G02B21/0032 G02B21/0072 G02B21/16

    Abstract: A light source for illumination in scanning microscopy, and a scanning microscope contain an electromagnetic energy source that emits light of one wavelength, and a beam splitter for spatially dividing the light into at least two partial light beams. An intermediate element for wavelength modification is provided in at least one partial light beam.

    Abstract translation: 用于扫描显微镜照明的光源和扫描显微镜包含发射一个波长的光的电磁能源和用于将光空间分为至少两个部分光束的分束器。 在至少一个部分光束中提供用于波长修改的中间元件。

    Laser illuminator and method
    43.
    发明授权
    Laser illuminator and method 有权
    激光照明器及方法

    公开(公告)号:US06796699B2

    公开(公告)日:2004-09-28

    申请号:US09881212

    申请日:2001-06-15

    Abstract: A method for illuminating an object (79). The method is characterized by the steps of injecting (1) the light beam (13) from a laser (9) into a microstructured optical element (19), which spectrally broadens the light of the light beam (13), shaping (3) the spectrally broadened light (31) to form an illumination light beam (29), and directing (5) the illumination light beam (29) onto the object (79). An instrument (7) for illuminating an object (79). The instrument comprises a laser (9) that emits a light beam (13), which is directed onto a microstructured optical element (19) that spectrally broadens the light from the laser. A optical means (33) which shapes the spectrally broadened light (31) to form an illumination light beam (29) is arranged downstream of the microstructured optical element (19).

    Abstract translation: 一种照明物体(79)的方法。 该方法的特征在于以下步骤:将来自激光器(9)的光束(13)注入到微结构化光学元件(19)中,该光学元件光谱(13)的光线变宽,成形(3) 光谱变宽的光(31)形成照明光束(29),并将照明光束(29)引导到物体(79)上。 一种用于照明物体(79)的仪器(7)。 仪器包括发射光束(13)的激光器(9),该激光器被引导到光学拓宽来自激光器的光的微结构化光学元件(19)上。 形成光谱变宽的光(31)以形成照明光束(29)的光学装置(33)布置在微结构化光学元件(19)的下游。

    Optical arrangement for the illumination of specimens for confocal scanning microscopes
    44.
    发明授权
    Optical arrangement for the illumination of specimens for confocal scanning microscopes 有权
    用于共焦扫描显微镜照明的光学布置

    公开(公告)号:US06781752B2

    公开(公告)日:2004-08-24

    申请号:US10730803

    申请日:2003-12-09

    CPC classification number: G02B21/0072 G02B21/0032

    Abstract: A confocal scanning microscope has an illuminating beam path and at least one light source. The light of the light source is coupled into a fiber in which laser transitions can be induced. At least laser light induced in the fiber serves for specimen illumination after passing through an excitation pinhole.

    Abstract translation: 共焦扫描显微镜具有照明光束路径和至少一个光源。 光源的光耦合到可以诱导激光转换的光纤中。 至少在光纤中感应的激光用于通过激发针孔后的样本照明。

    Method for examining a specimen
    45.
    发明授权
    Method for examining a specimen 有权
    检查样本的方法

    公开(公告)号:US06738190B2

    公开(公告)日:2004-05-18

    申请号:US09947334

    申请日:2001-09-05

    CPC classification number: G02B21/0076 G02B21/0024 G02B21/0032 G02B21/008

    Abstract: A method for examining a specimen (11) by means of a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for the specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11) comprises the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen (11) in accordance with the allocation is then accomplished. Lastly, the reflected and/or fluorescent light proceeding from the specimen (11) is detected.

    Abstract translation: 一种通过具有至少一个光源(1)(优选为激光)的共焦扫描显微镜检查样本(11)以产生用于样本(11)的照明光束(4)的方法,以及光束偏转 将照明光束(4)引导到试样(11)上方的装置(9)包括以下方法步骤:首先获取预览图像。 然后,标记预览图像中的至少一个感兴趣区域。 随后将各个照明光束波长和/或照射光束功率电平分配给该区域。 然后根据分配对样品(11)的区域或区域进行照明。 最后,检测从样品(11)进行的反射和/或荧光。

    Method and apparatus for phase correction of position and detection signals in scanning microscopy, and scanning microscope
    46.
    发明授权
    Method and apparatus for phase correction of position and detection signals in scanning microscopy, and scanning microscope 有权
    扫描显微镜下位置和检测信号相位校正的方法和装置,以及扫描显微镜

    公开(公告)号:US06677579B2

    公开(公告)日:2004-01-13

    申请号:US09920311

    申请日:2001-08-03

    CPC classification number: G02B21/008 G02B21/0072 G02B21/0084

    Abstract: A method and an apparatus for phase correction of position and detection signals in scanning microscopy. The method includes generation of a position signal from the position of a beam deflection device (7) and generation, from the light (17) proceeding from the specimen (15), of a detection signal pertinent to the position signal. The position signal and detection signal are then transferred to a processing unit (23). In the processing unit (23), a correction value is determined. The correction value is transferred to a computer (34) to compensate for time differences between the position signal and detection signal.

    Abstract translation: 一种用于扫描显微镜中位置和检测信号的相位校正的方法和装置。 该方法包括从光束偏转装置(7)的位置产生位置信号,并从与样本(15)进行的光(17)产生与位置信号相关的检测信号。 然后,位置信号和检测信号被传送到处理单元(23)。 在处理单元(23)中,确定校正值。 校正值被传送到计算机(34)以补偿位置信号和检测信号之间的时间差。

    Apparatus for objective changing and microscope having an apparatus for objective changing

    公开(公告)号:US06636352B2

    公开(公告)日:2003-10-21

    申请号:US09681918

    申请日:2001-06-26

    CPC classification number: G02B21/0072 G02B21/248

    Abstract: The apparatus for objective changing comprises an inventory of at least one objective (5) which defines a longitudinal axis (6). The objective change between an objective storage position (22) and a reference objective position (5a) is made possible by the apparatus, and the reference objective position (5a) lies within an optical beam path that defines an optical axis (3). A retaining element defines the reference objective position (5a), and during the objective change, the objective (5) with its longitudinal axis (6) is movable, in the vicinity of the retaining element (26), substantially coaxially with the optical axis (3). The objective change is accomplished along a guide rail (17).

    Optical arrangement
    49.
    发明授权
    Optical arrangement 有权
    光学布置

    公开(公告)号:US06515802B2

    公开(公告)日:2003-02-04

    申请号:US09821286

    申请日:2001-03-29

    CPC classification number: G02B27/126 G02B21/0064 G02B21/0068

    Abstract: An optical arrangement for at least partial spectral selection of light components from a polychromatic light beam (1) is configured, in the interest of multifarious spectral selection capabilities, with means of simple design in such a way that a dispersive medium (2) for spatial spectral spreading of the polychromatic light beam (1) into individual light bundles (3), and an attenuation means (5, 6) for at least partial attenuation of the intensity of one or more light bundles (3), are provided.

    Abstract translation: 用于从多色光束(1)中的光分量的至少部分光谱选择的光学装置被配置为以多种光谱选择能力为特征,以简单设计的方式,使得用于空间的分散介质(2) 提供了多色光束(1)到各个光束(3)中的光谱扩展,以及用于至少部分衰减一个或多个光束(3)的强度的衰减装置(5,6)。

    Temperature regulated microscope
    50.
    发明授权
    Temperature regulated microscope 有权
    温度调节显微镜

    公开(公告)号:US06493135B1

    公开(公告)日:2002-12-10

    申请号:US09622425

    申请日:2000-08-16

    CPC classification number: G02B7/16 G02B21/248 G02B21/30

    Abstract: A microscope with an objective turret (2) carrying an objective (1) and with a specimen holder (4) serving to receive a specimen (3), in order to assure an undesired transport of heat between the specimen (3) and the objective (1), is characterized by the fact that all objectives (1) carried by the objective turret (2) are simultaneously adjusted for temperature by means of the objective turret (2).

    Abstract translation: 具有携带物镜(1)的目标转台(2)和用于接收样本(3)的样品架(4)的显微镜,以确保在样品(3)和物镜之间不希望的热传递 (1)的特征在于,通过客观转塔(2)同时调节物镜(2)承载的所有物镜(1)的温度。

Patent Agency Ranking