Apparatus and methods for providing substrate structures having metallic layers for microelectronics devices
    41.
    发明授权
    Apparatus and methods for providing substrate structures having metallic layers for microelectronics devices 有权
    用于提供具有用于微电子器件的金属层的衬底结构的装置和方法

    公开(公告)号:US06423579B2

    公开(公告)日:2002-07-23

    申请号:US09836591

    申请日:2001-04-16

    Abstract: The present invention is directed toward apparatus and methods for providing substrate structures having metallic layers for microelectronics devices. In one embodiment of the invention, an apparatus includes a substrate layer, and a metallic layer attached to the substrate layer, the metallic layer being attachable to a bottom surface of the microelectronics device. The metallic layer may advantageously provide a surface free from voids or irregularities for improved attachment of microelectronics devices. The metallic layer may also provide improved conduction of thermal energy away from the device, shielding from electromagnetic interference, a vapor barrier between the device and the substrate, and may serve as a convenient ground channel. In one embodiment, the metallic layer may be continuous layer. Alternately, the metallic layer may be segmented into a plurality of closely-fitted pieces, or a plurality of spaced-apart pieces separated by expansion joints. In another embodiment, an apparatus may include a second metallic layer formed on the substrate layer opposite from the first metallic layer. In a further embodiment, a plating layer is formed on the second metallic layer. In yet another embodiment, a microelectronics package includes a substrate layer, a metallic layer attached to the substrate layer, an attachment layer formed on at least part of the metallic layer, and a die having a bottom surface attached to the attachment layer. The attachment layer may be an adhesive layer, or alternately, a eutectic layer.

    Abstract translation: 本发明涉及用于提供具有用于微电子器件的金属层的衬底结构的装置和方法。 在本发明的一个实施例中,一种装置包括衬底层和附着到衬底层的金属层,该金属层可附接到微电子器件的底表面。 金属层可以有利地提供没有空隙或不规则性的表面,以改善微电子器件的附着。 金属层还可以提供远离器件的热能的改善的传导,屏蔽电磁干扰,器件和衬底之间的蒸气阻挡层,并且可以用作方便的接地通道。 在一个实施例中,金属层可以是连续层。 或者,金属层可以被分割成多个紧密配合的片,或者由膨胀节分开的多个间隔开的片。 在另一个实施例中,装置可以包括形成在与第一金属层相对的基底层上的第二金属层。 在另一实施例中,在第二金属层上形成镀层。 在另一个实施例中,微电子封装包括衬底层,附着到衬底层的金属层,形成在金属层的至少一部分上的附着层和连接到附着层的底表面的管芯。 附着层可以是粘合剂层,或者可以是共晶层。

    Apparatus and methods of packaging and testing die
    43.
    发明授权
    Apparatus and methods of packaging and testing die 有权
    包装和测试模具的装置和方法

    公开(公告)号:US06380631B2

    公开(公告)日:2002-04-30

    申请号:US09872221

    申请日:2001-05-31

    Abstract: Apparatus and methods of packaging and testing die. In one embodiment, a stacked die package includes a packaging substrate having a first surface with a recess disposed therein and a plurality of conductive leads coupled thereto, a first die attached to the packaging substrate within the recess and having a plurality of first bond pads electrically coupled to at least some of the conductive leads, and a second die attached to the first die and having a plurality of second bond pads that are electrically coupled to at least some of the conductive leads. When the stacked die package is engaged with, for example, a circuit board, the first surface of the packaging substrate is proximate the circuit board so that the packaging substrate at least partially encloses and protects the first and second die. The properties and dimensions of the packaging substrate are tailored to optimize the operational environment of the die, including improving thermal dissipation and enhancing performance of the die. In an alternate embodiment, the packaging substrate comprises an electrically conductive substrate and an electrically insulative material is formed between the conductive leads and the packaging substrate. In another embodiment, the first bond pads are electrically coupled to the conductive leads by wire-bonding. Alternately, the first bond pads are in direct contact with the conductive leads in a flip chip arrangement. In another embodiment, the die is sealed within an encapsulating layer to protect the first and second die.

    Abstract translation: 包装和测试模具的装置和方法 在一个实施例中,堆叠的管芯封装包括具有设置在其中的凹部的第一表面和与其连接的多个导电引线的封装衬底,第一管芯附接到凹部内的封装衬底,并且具有多个第一接合焊盘, 耦合到至少一些导电引线,以及附接到第一管芯的第二管芯,并且具有电耦合到至少一些导电引线的多个第二接合焊盘。 当堆叠的管芯封装与例如电路板接合时,封装衬底的第一表面靠近电路板,使得封装衬底至少部分地包围并保护第一和第二管芯。 定制包装基材的性能和尺寸以优化模具的操作环境,包括改善热耗散和提高模具的性能。 在替代实施例中,封装衬底包括导电衬底,并且在导电引线和封装衬底之间形成电绝缘材料。 在另一个实施例中,第一接合焊盘通过引线接合电耦合到导电引线。 或者,第一接合焊盘以倒装芯片布置与导电引线直接接触。 在另一个实施例中,将管芯密封在封装层内以保护第一和第二管芯。

    Low profile multi-IC chip package connector

    公开(公告)号:US06362519B1

    公开(公告)日:2002-03-26

    申请号:US09836067

    申请日:2001-04-17

    Abstract: A low profile multi-IC chip package for high speed application comprises a connector for electrically connecting the equivalent outer leads of a set of stacked primary semiconductor packages. In one embodiment, the connector comprises a two-part sheet of flexible insulative polymer with buses formed on one side. In another embodiment, the connector comprises multiple buses formed from conductive polymer. In further embodiments, the primary packages are stacked within a cage and have their outer leads in unattached contact with buses within the cage or, alternatively, are directly fixed to leads or pads on the host circuit board.

    Vertical surface mount assembly and methods
    50.
    发明授权
    Vertical surface mount assembly and methods 有权
    垂直表面安装组件及方法

    公开(公告)号:US06228677B1

    公开(公告)日:2001-05-08

    申请号:US09505214

    申请日:2000-02-16

    CPC classification number: H05K3/301 H01L2924/0002 Y10T29/4913 H01L2924/00

    Abstract: A vertically mountable semiconductor device assembly including a semiconductor device and a mechanism for attaching the semiconductor device to a carrier substrate. The semiconductor device has each of its bond pads disposed proximate a single edge thereof. Preferably, at least a portion of the semiconductor device is exposed. An alignment device is attached to a carrier substrate. A mounting element on the vertically mountable semiconductor device package engages the alignment device to interconnect the semiconductor device and the alignment device. Preferably, the alignment device secures the vertically mountable semiconductor device package perpendicular relative to the carrier substrate. The distance between the bond pads and corresponding terminals on the carrier substrate is very small in order to reduce impedance. The vertically mountable semiconductor device package may also be readily user-upgradable.

    Abstract translation: 一种可垂直安装的半导体器件组件,包括半导体器件和用于将半导体器件附着到载体衬底的机构。 半导体器件的每个接合焊盘都设置在其单个边缘附近。 优选地,半导体器件的至少一部分被暴露。 对准装置附接到载体基板。 可垂直安装的半导体器件封装上的安装元件与对准装置接合以使半导体器件和对准器件互连。 优选地,对准装置将垂直安装的半导体器件封装相对于载体衬底垂直固定。 接合焊盘和载体基板上的对应端子之间的距离非常小以减少阻抗。 垂直安装的半导体器件封装也可以容易地用户升级。

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