公开(公告)号：US20070051908A1

公开(公告)日：2007-03-08

申请号：US11593121

申请日：2006-11-06

Applicant: Howard Mizes ,  Peter Paul ,  Michael Borton ,  Stanley Wallace

Inventor： Howard Mizes ,  Peter Paul ,  Michael Borton ,  Stanley Wallace

IPC: G01N21/86

CPC classification number: G01J1/08 ,  G01J1/0266

Abstract: Systems and methods provide calibration for a linear array sensor. A test pattern having a plurality of lines is used. Comparison between expected and measured spacing between a pair of neighboring lines is used to determine sensor position displacement.

公开(公告)号：US07154110B2

公开(公告)日：2006-12-26

申请号：US10953321

申请日：2004-09-30

Applicant: Howard A. Mizes ,  Peter Paul ,  Michael D. Borton ,  Stanley J. Wallace

Inventor： Howard A. Mizes ,  Peter Paul ,  Michael D. Borton ,  Stanley J. Wallace

IPC: G01N21/86

CPC classification number: G01J1/08 ,  G01J1/0266

Abstract: Systems and methods provide calibration for a linear array sensor. A test pattern having a plurality of lines is used. Comparison between expected and measured spacing between a pair of neighboring lines is used to determine sensor position displacement.

Abstract translation: 系统和方法为线性阵列传感器提供校准。 使用具有多行的测试图案。 使用一对相邻线之间的预期间隔和测量间距的比较来确定传感器位置位移。

公开(公告)号：US07041953B2

公开(公告)日：2006-05-09

申请号：US10902624

申请日：2004-07-29

Applicant: Robert W. Byren

Inventor： Robert W. Byren

IPC: G01J1/20

CPC classification number: G02B26/06 ,  G01J1/0266 ,  G01J9/00

Abstract: A beam control system and method: The inventive system includes, an arrangement for receiving a first beam of electromagnetic energy; measuring wavefront aberrations in the first beam with a wavefront sensor; and removing global tilt from the measured wavefront aberrations to provide higher order aberrations for beam control. In the illustrative embodiment, the invention uses a traditional (quad-cell) Shack-Hartmann wavefront sensor to measure wavefront aberrations. An adaptive optics processor electronically removes the global tilt (angular jitter) from this measurement leaving only the higher-order Zernike components. These higher-order aberrations are then applied to wavefront control elements, such as deformable mirrors or spatial light modulators that correct the tracker image and apply a conjugate distortion to the wavefront of the outgoing HEL beam. A track error (angular jitter) component is supplied by a separate fine track sensor. This jitter error is then applied by the adaptive optics processor to a fast steering mirror, which corrects jitter in the tracker image and applies a compensating distortion to the LOS of the HEL beam.

公开(公告)号：US20060071185A1

公开(公告)日：2006-04-06

申请号：US10953321

申请日：2004-09-30

Applicant: Howard Mizes ,  Peter Paul ,  Michael Borton ,  Stanley Wallace

Inventor： Howard Mizes ,  Peter Paul ,  Michael Borton ,  Stanley Wallace

IPC: G01V8/00 ,  G01N21/86 ,  G01J1/42

CPC classification number: G01J1/08 ,  G01J1/0266

Abstract: Systems and methods provide calibration for a linear array sensor. A test pattern having a plurality of lines is used. Comparison between expected and measured spacing between a pair of neighboring lines is used to determine sensor position displacement.

公开(公告)号：US20060022115A1

公开(公告)日：2006-02-02

申请号：US10902624

申请日：2004-07-29

Applicant: Robert Byren

Inventor： Robert Byren

IPC: G01J1/20

CPC classification number: G02B26/06 ,  G01J1/0266 ,  G01J9/00

Abstract: A beam control system and method: The inventive system includes, an arrangement for receiving a first beam of electromagnetic energy; measuring wavefront aberrations in the first beam with a wavefront sensor; and removing global tilt from the measured wavefront aberrations to provide higher order aberrations for beam control. In the illustrative embodiment, the invention uses a traditional (quad-cell) Shack-Hartmann wavefront sensor to measure wavefront aberrations. An adaptive optics processor electronically removes the global tilt (angular jitter) from this measurement leaving only the higher-order Zernike components. These higher-order aberrations are then applied to wavefront control elements, such as deformable mirrors or spatial light modulators that correct the tracker image and apply a conjugate distortion to the wavefront of the outgoing HEL beam. A track error (angular jitter) component is supplied by a separate fine track sensor. This jitter error is then applied by the adaptive optics processor to a fast steering mirror, which corrects jitter in the tracker image and applies a compensating distortion to the LOS of the HEL beam.

Abstract translation: 光束控制系统和方法：本发明的系统包括：用于接收第一电磁能束的装置; 用波前传感器测量第一光束中的波前像差; 并从测量的波前像差中去除全局倾斜，以提供光束控制的高阶像差。 在说明性实施例中，本发明使用传统（四单元）Shack-Hartmann波前传感器来测量波前像差。 自适应光学处理器从该测量中电子地去除全局倾斜（角度抖动），仅留下高阶Zernike分量。 然后将这些较高阶像差应用于波前控制元件，例如校正跟踪器图像并将共轭失真应用于输出HEL波束的波阵面的可变形反射镜或空间光调制器。 轨道误差（角度抖动）分量由单独的细轨道传感器提供。 然后，该自适应光学处理器将该抖动误差应用于快速导向镜，其校正跟踪器图像中的抖动，并将补偿失真应用于HEL波束的LOS。

公开(公告)号：US20060006319A1

公开(公告)日：2006-01-12

申请号：US11216354

申请日：2005-08-31

Applicant: Jon Bechtel ,  Harold Ockerse

Inventor： Jon Bechtel ,  Harold Ockerse

IPC: H01J5/02

CPC classification number: G02B5/021 ,  B60R1/088 ,  B60R1/12 ,  B60S1/0822 ,  B60S1/0833 ,  B60S1/0885 ,  G01J1/02 ,  G01J1/0209 ,  G01J1/0219 ,  G01J1/0228 ,  G01J1/0266 ,  G01J1/0271 ,  G01J1/04 ,  G01J1/0403 ,  G01J1/0407 ,  G01J1/0411 ,  G01J1/0422 ,  G01J1/0474 ,  G01J1/18 ,  G01J1/42 ,  G01J1/46 ,  G01J2001/4266 ,  G02B5/0215 ,  G02B5/0221 ,  G02B5/0242 ,  G02B5/0278 ,  G02B19/0028 ,  G02B19/0076

Abstract: The inventive sensor device includes a support structure, a sensing element mounted on the support substrate for sensing optical radiation and generating an electrical output signal in response thereto, and an encapsulant encapsulating the sensing element on the support structure. The encapsulant being configured to define a lens portion for focusing incident optical radiation onto an active surface of the sensing element, and an optical radiation collector portion surrounding the lens portion for collecting and redirecting optical radiation that is not incident the lens portion onto the active surface of the sensing element. The collector portion may be a parabolic reflector that reflects incident light by total internal reflection. The sensor device may be incorporated into an assembly including a diffuser positioned across an aperture, and/or may be incorporated into a vehicle accessory such as a rearview mirror assembly.

Abstract translation: 本发明的传感器装置包括支撑结构，安装在支撑基板上的感测元件，用于感测光辐射并响应于此产生电输出信号，以及将感测元件封装在支撑结构上的密封剂。 密封剂被配置为限定用于将入射光辐射聚焦到感测元件的有效表面上的透镜部分，以及围绕透镜部分的光学辐射收集器部分，用于收集并重定向未入射到透镜部分的有源表面的光学辐射 的传感元件。 收集器部分可以是通过全内反射来反射入射光的抛物面反射器。 传感器装置可以结合到包括跨过孔的扩散器的组件中，和/或可以被结合到诸如后视镜组件的车辆附件中。

公开(公告)号：US20050199785A1

公开(公告)日：2005-09-15

申请号：US10513876

申请日：2003-05-08

Applicant: Takashi Yamaguchi ,  Ryoji Hayashi

Inventor： Takashi Yamaguchi ,  Ryoji Hayashi

IPC: H01L31/0232 ,  H01J3/14 ,  G06M7/00 ,  H01J5/16

CPC classification number: G01J1/02 ,  G01J1/0266 ,  G01J1/04 ,  G01J1/0407 ,  G01J1/0414 ,  H01L31/02325 ,  H01L31/02327

Abstract: A light receiving device 7 includes a sensor 10 for outputting a signal correlating to incident light on a detection surface 10a and a light receiving element 8 disposed in confrontation with the detection surface and capable of transmitting light. The light receiving element has a recessed portion 22 on the opposite surface of the surface confronting the detection surface. A wall surface 24 of the recessed portion reflects the light beam L2 from a lateral direction of the detection surface toward the detection surface 10a.

Abstract translation: 光接收装置7包括：传感器10，其用于输出与检测面10a上的入射光相关的信号;以及受光元件8，其配置成与检测面对置并能够透光。 光接收元件在与检测表面相对的表面的相对表面上具有凹部22。 凹部的壁面24将光束L 2从检测面的横向方向朝检测面10a反射。

公开(公告)号：US20050174565A1

公开(公告)日：2005-08-11

申请号：US10512446

申请日：2003-04-22

Applicant: Peter Veitch

Inventor： Peter Veitch

IPC: G01M11/02 ,  G01B9/00 ,  G01J9/00 ,  G01M11/00

CPC classification number: G01M11/005 ,  G01J1/0266 ,  G01J9/00 ,  G01M11/0264

Abstract: Estimating one or more optical characteristics of a Device-Under-Test (DUT). The method, includes directing an optical wavefront, generated by a source, towards a test location and generating at least one ray from the wavefront at the test location. Then for each ray at two or more measurement planes, each measurement plane transverse to the direction of travel of the wavefront and beyond the test location relative to the source at different optical path distances, measuring respective points of intersection of the ray with the measurement planes with and without the DUT at the test location. Followed by determining the transverse aberration due to the DUT for the ray at each measurement plane; and the estimating for each measurement plane from the determined transverse aberrations the coefficients of a general transverse aberration equation, the coefficients of which are the product of a combination of optical characteristics and the optical distance between the measurement plane and the appropriate principal plane of the DUT. The optical characteristics are calculated from the estimates of the coefficients for each measurement plane and the optical distances between respective measurement planes.

Abstract translation: 估计被测设备（DUT）的一个或多个光学特性。 该方法包括将由光源产生的光学波前引导到测试位置并在测试位置处从波前产生至少一个光线。 然后对于两个或更多个测量平面处的每个射线，每个测量平面横向于波前的行进方向并且在不同光程距离处相对于源超过测试位置，测量射线与测量平面的相交点 在测试位置有和没有DUT。 随后确定每个测量平面处的用于射线的DUT的横向像差; 以及根据所确定的横向像差估计每个测量平面的一般横向像差方程的系数，其系数是光学特性的组合与测量平面与DUT的适当主平面之间的光学距离的乘积的乘积 。 根据每个测量平面的系数的估计和各个测量平面之间的光学距离来计算光学特性。

公开(公告)号：US06865034B1

公开(公告)日：2005-03-08

申请号：US10616265

申请日：2003-07-08

Applicant: Chris L. Willis

Inventor： Chris L. Willis

IPC: G01J1/02 ,  G02B7/02 ,  G02B27/64 ,  H01S3/00

CPC classification number: G01J1/02 ,  G01J1/0252 ,  G01J1/0266 ,  G02B7/028 ,  G02B27/64

Abstract: A system is provided for nulling out or eliminating alignment errors in an optical system by moving a lens to capture and center a collimated beam laterally-shifted by thermal excursions, thus to couteract the boresight error caused by the thermally-induced lateral shifting. As a result, alignment error the thermal coefficient of expansion characteristics of the optical elements and their mounting systems caused by lateral off-sets is corrected by moving a lens or lens system in response to thermal changes in a direction which moves the lens so that the collimated light impinging on the lens is made to come in on the optical axis of the lens.

Abstract translation: 提供了一种用于通过移动透镜以捕获和对准通过热偏移横向移位的准直光束来对光学系统中的对准误差进行零位或消除的系统，从而对由热诱导的横向偏移引起的视轴误差进行协调。 结果，通过使透镜或透镜系统响应于使透镜移动的方向上的热变化来移动透镜或透镜系统来校正由侧向偏移引起的光学元件及其安装系统的热膨胀特性的对准误差， 入射在透镜上的准直光进入透镜的光轴。

公开(公告)号：US06831268B2

公开(公告)日：2004-12-14

申请号：US10068540

申请日：2002-02-06

Applicant: Jon H. Bechtel ,  Harold C. Ockerse

Inventor： Jon H. Bechtel ,  Harold C. Ockerse

IPC: H01J4014

CPC classification number: G02B5/021 ,  B60R1/088 ,  B60R1/12 ,  B60S1/0822 ,  B60S1/0833 ,  B60S1/0885 ,  G01J1/02 ,  G01J1/0209 ,  G01J1/0219 ,  G01J1/0228 ,  G01J1/0266 ,  G01J1/0271 ,  G01J1/04 ,  G01J1/0403 ,  G01J1/0407 ,  G01J1/0411 ,  G01J1/0422 ,  G01J1/0474 ,  G01J1/18 ,  G01J1/42 ,  G01J1/46 ,  G01J2001/4266 ,  G02B5/0215 ,  G02B5/0221 ,  G02B5/0242 ,  G02B5/0278 ,  G02B19/0028 ,  G02B19/0076

Abstract: The inventive sensor device includes a support structure, a sensing element mounted on the support substrate for sensing optical radiation and generating an electrical output signal in response thereto, and an encapsulant encapsulating the sensing element on the support structure. The encapsulant being configured to define a lens portion for focusing incident optical radiation onto an active surface of the sensing element, and an optical radiation collector portion surrounding the lens portion for collecting and redirecting optical radiation that is not incident the lens portion onto the active surface of the sensing element. The collector portion may be a parabolic reflector that reflects incident light by total internal reflection. The sensor device may be incorporated into an assembly including a diffuser positioned across an aperture, and/or may be incorporated into a vehicle accessory such as a rearview mirror assembly.

Abstract translation: 本发明的传感器装置包括支撑结构，安装在支撑基板上的感测元件，用于感测光辐射并响应于此产生电输出信号，以及将感测元件封装在支撑结构上的密封剂。 密封剂被配置为限定用于将入射光辐射聚焦到感测元件的有效表面上的透镜部分，以及围绕透镜部分的光学辐射收集器部分，用于收集并重定向未入射到透镜部分的有源表面的光学辐射 的传感元件。 收集器部分可以是通过全内反射来反射入射光的抛物面反射器。 传感器装置可以结合到包括跨过孔的扩散器的组件中，和/或可以被结合到诸如后视镜组件的车辆附件中。