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公开(公告)号:US20230256567A1
公开(公告)日:2023-08-17
申请号:US18306170
申请日:2023-04-24
Applicant: Applied Materials, Inc.
Inventor: Daniel Redfield , Jason Garcheung Fung , Mayu Felicia Yamamura
IPC: B24D11/00 , B29C64/112 , B29C64/393 , B33Y30/00 , B33Y80/00 , B33Y50/02 , B33Y10/00 , B29C64/282 , B29C64/40 , C09G1/16
CPC classification number: B24D11/006 , B29C64/40 , B29C64/112 , B29C64/282 , B29C64/393 , B33Y10/00 , B33Y30/00 , B33Y50/02 , B33Y80/00 , C09G1/16 , B24B37/20
Abstract: A method of fabricating a polishing pad using an additive manufacturing system includes depositing a first set successive layers by droplet ejection to form a. Depositing the successive layers includes dispensing a polishing pad precursor to first regions corresponding to partitions of the polishing pad and dispensing a sacrificial material to second regions corresponding to grooves of the polishing pad. Removing the sacrificial material provides the polishing pad with a polishing surface that has the partitions separated by the grooves.
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公开(公告)号:US11241839B2
公开(公告)日:2022-02-08
申请号:US16289213
申请日:2019-02-28
Applicant: Applied Materials, Inc.
Inventor: William H. McClintock , Rajeev Bajaj , Jason G. Fung , Daniel Redfield
IPC: B29C64/00 , B29C64/393 , G01B9/02 , G06F9/30 , B33Y50/02
Abstract: Embodiments disclosed herein provide methods of forming bond pad redistribution layers (RDLs) in a fan-out wafer level packaging (FOWLP) scheme using an additive manufacturing process. In one embodiment, a method of forming a redistribution layer includes positioning a carrier substrate on a manufacturing support of an additive manufacturing system, the carrier substrate including a plurality of singulated devices, detecting one or more fiducial features corresponding to each of the plurality of singulated devices, determining actual positions of each of the plurality of singulated devices relative to one or more components of the additive manufacturing system, generating printing instructions for forming a patterned dielectric layer based on the actual positions of each of the plurality of singulated devices, and forming the patterned dielectric layer using the printing instructions.
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公开(公告)号:US10967482B2
公开(公告)日:2021-04-06
申请号:US15922813
申请日:2018-03-15
Applicant: Applied Materials, Inc.
Inventor: Daniel Redfield
IPC: B29C64/245 , B33Y10/00 , B29C64/112 , B24B53/017 , B33Y80/00 , B29C64/209 , B29C64/393 , B29C64/129 , B24B57/02
Abstract: A method of fabricating a polishing pad using an additive manufacturing system includes dispensing a first plurality of first layers from a first plurality of successive layers by, for each respective first layer of the first plurality of first layers, ejecting droplets of polishing layer precursor into gaps between projections from a support to form the respective first layer, and curing the respective first layer before depositing a subsequent first layer, and dispensing a second plurality of layers from the first plurality of successive layers over the first plurality of layers by, for each respective second layer of the second plurality of layers, ejecting droplets of the polishing layer precursor to form the respective second layer, each respective second layer spanning the projections and the gaps, and curing the respective second layer before depositing a subsequent second layer, and removing the polishing layer from the support.
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公开(公告)号:US10593574B2
公开(公告)日:2020-03-17
申请号:US14935134
申请日:2015-11-06
Applicant: Applied Materials, Inc.
Inventor: Jason G. Fung , Rajeev Bajaj , Daniel Redfield , Aniruddh Khanna , Mario Cornejo , Gregory E. Menk , John Watkins
IPC: B24B37/013 , H01L21/67 , B29C64/106 , B33Y10/00 , B33Y80/00 , B24B37/26 , B24B49/00 , B24B49/10 , B24B49/14 , B24B49/16 , H01L21/306 , H01L21/66 , B29L31/00
Abstract: Chemical mechanical polishing (CMP) apparatus and methods for manufacturing CMP apparatus are provided herein. CMP apparatus may include polishing pads, polishing head retaining rings, and polishing head membranes, among others, and the CMP apparatus may be manufactured via additive manufacturing processes, such as three dimensional (3D) printing processes. The CMP apparatus may include wireless communication apparatus components integrated therein. Methods of manufacturing CMP apparatus include 3D printing wireless communication apparatus into a polishing pad and printing a polishing pad with a recess configured to receive a preformed wireless communication apparatus.
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公开(公告)号:US10537973B2
公开(公告)日:2020-01-21
申请号:US15455072
申请日:2017-03-09
Applicant: Applied Materials, Inc.
Inventor: Mayu Felicia Yamamura , Jason Garcheung Fung , Daniel Redfield , Rajeev Bajaj , Hou T. Ng
Abstract: A method of fabricating a polishing pad using an additive manufacturing system includes receiving data indicative of a desired shape of the polishing pad to be fabricated by droplet ejection. The desired shape defines a profile including a polishing surface and one or more grooves on the polishing pad. Data indicative of a modified pattern of dispensing feed material is generated to at least partially compensate for distortions of the profile caused by the additive manufacturing system, and a plurality of layers of the feed material are dispensed by droplet ejection in accordance to the modified pattern.
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公开(公告)号:US10456886B2
公开(公告)日:2019-10-29
申请号:US15394044
申请日:2016-12-29
Applicant: Applied Materials, Inc.
Inventor: Sivapackia Ganapathiappan , Nag B. Patibandla , Rajeev Bajaj , Daniel Redfield , Fred C. Redeker , Mahendra C. Orilall , Boyi Fu , Mayu Yamamura , Ashwin Chockalingam
Abstract: Implementations disclosed herein generally relate to polishing articles and methods for manufacturing polishing articles used in polishing processes. More specifically, implementations disclosed herein relate to porous polishing pads produced by processes that yield improved polishing pad properties and performance, including tunable performance. Additive manufacturing processes, such as three-dimensional printing processes provides the ability to make porous polishing pads with unique properties and attributes.
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公开(公告)号:US10391605B2
公开(公告)日:2019-08-27
申请号:US15287665
申请日:2016-10-06
Applicant: Applied Materials, Inc.
Inventor: Sivapackia Ganapathiappan , Boyi Fu , Ashwin Chockalingam , Daniel Redfield , Rajeev Bajaj , Mahendra C. Orilall , Hou T. Ng , Jason G. Fung , Mayu Yamamura
IPC: B24B37/24
Abstract: Embodiments of the present disclosure relate to advanced polishing pads with tunable chemical, material and structural properties, and new methods of manufacturing the same. According to one or more embodiments of the disclosure, it has been discovered that a polishing pad with improved properties may be produced by an additive manufacturing process, such as a three-dimensional (3D) printing process. Embodiments of the present disclosure thus may provide an advanced polishing pad that has discrete features and geometries, formed from at least two different materials that include functional polymers, functional oligomers, reactive diluents, addition polymer precursor compounds, catalysts, and curing agents. For example, the advanced polishing pad may be formed from a plurality of polymeric layers, by the automated sequential deposition of at least one polymer precursor composition followed by at least one curing step, wherein each layer may represent at least one polymer composition, and/or regions of different compositions. Embodiments of the disclosure further provide a polishing pad with polymeric layers that may be interpenetrating polymer networks.
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公开(公告)号:US10384330B2
公开(公告)日:2019-08-20
申请号:US14885950
申请日:2015-10-16
Applicant: Applied Materials, Inc.
Inventor: Rajeev Bajaj , Daniel Redfield , Mahendra C. Orilall , Boyi Fu , Aniruddh Khanna , Jason G. Fung , Mario Cornejo , Ashwin Chockalingam , Mayu Yamamura , Veera Raghava Reddy Kakireddy , Ashavani Kumar , Venkat Hariharan , Gregory E. Menk , Fred C. Redeker , Nag B. Patibandla , Hou T. Ng , Robert E. Davenport , Amritanshu Sinha
Abstract: Embodiments of the present disclosure relate to advanced polishing pads with tunable chemical, material and structural properties, and new methods of manufacturing the same. According to one or more embodiments of the disclosure, it has been discovered that a polishing pad with improved properties may be produced by an additive manufacturing process, such as a three-dimensional (3D) printing process. Embodiments of the present disclosure thus may provide an advanced polishing pad that has discrete features and geometries, formed from at least two different materials that include functional polymers, functional oligomers, reactive diluents, and curing agents. For example, the advanced polishing pad may be formed from a plurality of polymeric layers, by the automated sequential deposition of at least one resin precursor composition followed by at least one curing step, wherein each layer may represent at least one polymer composition, and/or regions of different compositions.
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公开(公告)号:US20180339397A1
公开(公告)日:2018-11-29
申请号:US15922813
申请日:2018-03-15
Applicant: Applied Materials, Inc.
Inventor: Daniel Redfield
IPC: B24B53/017 , B24B57/02 , B29C64/112 , B29C64/129 , B29C64/209 , B29C64/393
Abstract: A method of fabricating a polishing pad using an additive manufacturing system includes dispensing a first plurality of first layers from a first plurality of successive layers by, for each respective first layer of the first plurality of first layers, ejecting droplets of polishing layer precursor into gaps between projections from a support to form the respective first layer, and curing the respective first layer before depositing a subsequent first layer, and dispensing a second plurality of layers from the first plurality of successive layers over the first plurality of layers by, for each respective second layer of the second plurality of layers, ejecting droplets of the polishing layer precursor to form the respective second layer, each respective second layer spanning the projections and the gaps, and curing the respective second layer before depositing a subsequent second layer, and removing the polishing layer from the support.
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公开(公告)号:US09776361B2
公开(公告)日:2017-10-03
申请号:US14863409
申请日:2015-09-23
Applicant: Applied Materials, Inc.
Inventor: Kasiraman Krishnan , Daniel Redfield , Russell Edward Perry , Gregory E. Menk , Rajeev Bajaj , Fred C. Redeker , Nag B. Patibandla , Mahendra C. Orilall , Jason G. Fung
IPC: B29C67/00 , B24B37/22 , B24B37/26 , B29K105/16 , B29L31/00
CPC classification number: B29C64/112 , B24B37/22 , B24B37/24 , B24B37/26 , B24D11/001 , B29K2105/16 , B29K2995/007 , B29L2031/736
Abstract: A polishing article manufacturing system includes a feed section and a take-up section, the take-up section comprising a supply roll having a polishing article disposed thereon for a chemical mechanical polishing process, a print section comprising a plurality of printheads disposed between the feed section and the take-up section, and a curing section disposed between the feed section and the take-up section, the curing section comprising one or both of a thermal curing device and an electromagnetic curing device.
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