公开(公告)号：US11995912B2

公开(公告)日：2024-05-28

申请号：US17742069

申请日：2022-05-11

Applicant: KEY TECHNOLOGY, INC.

Inventor： Peter Lodewyckx ,  Marc Van Daele ,  Timothy Justice

IPC: G06V40/12 ,  G06T7/00 ,  G06T7/593 ,  G06T7/80 ,  G06T15/00 ,  G06V20/52

CPC classification number: G06V40/1335 ,  G06T7/0004 ,  G06T7/596 ,  G06T7/85 ,  G06T15/005 ,  G06V20/52 ,  G06T2207/10021 ,  G06T2207/20221 ,  G06T2207/30128 ,  G06V2201/06

Abstract: A method and apparatus for sorting is described, and which includes providing a product stream formed of individual objects of interest having feature aspects which can be detected; generating multiple images of each of the respective objects of interest; classifying the feature aspects of the objects of interest; identifying complementary images by analyzing some of the multiplicity of images; fusing the complementary images to form an aggregated region representation of the complementary images; and sorting the respective objects of interest based at least in part upon the aggregated region representation which is formed.

公开(公告)号：US11991457B2

公开(公告)日：2024-05-21

申请号：US17812450

申请日：2022-07-14

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Shinya Nakashima

IPC: H04N23/74 ,  G01N21/89 ,  G06T7/00 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71

CPC classification number: H04N23/74 ,  G01N21/89 ,  G06T7/001 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71 ,  G06T2207/10152 ,  G06T2207/20224 ,  G06T2207/30148 ,  G06V2201/06

Abstract: An inspection apparatus includes an illumination device capable of emitting first light in a first wavelength band and reference light in a reference wavelength band overlapping with the first wavelength band, an imaging device that images an inspection body and outputs a pixel signal, and an image processing device. The illumination device emits the first light and the reference light to the inspection body at different timings in one imaging time. The image processing device calculates a first reflectance that is a reflectance in the first wavelength band of the object based on the pixel signal, and determines physical properties of the object based on the first reflectance.

公开(公告)号：US11986859B2

公开(公告)日：2024-05-21

申请号：US17729952

申请日：2022-04-26

Applicant: Berkshire Grey Operating Company, Inc.

Inventor： Thomas Wagner ,  Kevin Ahearn ,  Benjamin Cohen ,  Michael Dawson-Haggerty ,  Christopher Geyer ,  Thomas Koletschka ,  Kyle Maroney ,  Matthew T. Mason ,  Gene Temple Price ,  Joseph Romano ,  Daniel Smith ,  Siddhartha Srinivasa ,  Prasanna Velagapudi ,  Thomas Allen

IPC: B07C5/34 ,  G01B11/245 ,  G05B19/418 ,  G06K7/10 ,  G06K7/14 ,  G06K19/06 ,  G06V20/80 ,  H04N23/56 ,  H04N23/90

CPC classification number: B07C5/3412 ,  G01B11/245 ,  G05B19/4183 ,  G06K7/10693 ,  G06K7/10732 ,  G06K7/10881 ,  G06K7/1413 ,  G06K19/06028 ,  G06V20/80 ,  H04N23/56 ,  H04N23/90 ,  B07C2301/0016 ,  G05B2219/36371 ,  G05B2219/45045 ,  G05B2219/45047 ,  G06V2201/06 ,  Y02P90/02

Abstract: A drop perception system is disclosed that includes an open housing structure having an internal volume, an open top and an open bottom, and a plurality of perception units positioned to capture perception data within the internal volume at a plurality of locations between the open top and the open bottom of the open housing.

公开(公告)号：US20240144632A1

公开(公告)日：2024-05-02

申请号：US17977268

申请日：2022-10-31

Applicant: ZEBRA TECHNOLOGIES CORPORATION

Inventor： Matthew M. Degen ,  Anthony P. DeLuca ,  Adam Danielsen

IPC: G06V10/25 ,  G06F3/04842 ,  G06T11/60 ,  G06V10/94

CPC classification number: G06V10/25 ,  G06F3/04842 ,  G06T11/60 ,  G06V10/945 ,  G06T2200/24 ,  G06V2201/06 ,  G06V2201/10

Abstract: Imaging devices, systems, and methods for analyzing an image taken by an imaging system are described herein. An example method includes: receiving a bank image from the imaging device pursuant to one of a plurality of banks of imaging parameters; rendering the bank image in an image display; receiving an indication of a region of interest (ROI) in the image display associated with a user-selected tool; determining whether the user-selected tool is set to use the bank image, an output of a parent tool, or an output of the user-selected tool; and generating, in the image display, at least a portion of a display image in the ROI representative of: (i) the bank image, (ii) the output of the parent tool, or (iii) the output of the user-selected tool; wherein the portion of the display image is associated with the user-selected region.

公开(公告)号：US11972600B2

公开(公告)日：2024-04-30

申请号：US17197070

申请日：2019-09-03

Applicant: TRUMPF Werkzeugmaschinen GmbH + Co. KG

Inventor： Manuel Kiefer ,  Willi Poenitz

IPC: G06V10/75 ,  G06T7/00 ,  G06V10/77

CPC classification number: G06V10/758 ,  G06T7/001 ,  G06V10/7715 ,  G06T2207/30136 ,  G06V2201/06

Abstract: The invention relates to a method and an apparatus (10) for recognizing an article. This involves at least one shot (14), in particular in the form of a photograph, of the article being produced. The shot (14) is used to ascertain shot features (22) by means of a shot extraction algorithm (20). Stored article data (12) are used to ascertain article features (28) and to compare them with the shot features (22) in order to output association information (36). There is in particular provision according to the invention for a user rating (42) to be provided to improve both the shot extraction algorithm (20) and the article extraction algorithm (26). Alternatively or additionally, there is in particular provision according to the invention for both the shot extraction algorithm (20) and the article extraction algorithm (26) to be produced on the basis of interconnected, preferably weighted, data aggregation routines.

公开(公告)号：US11969903B1

公开(公告)日：2024-04-30

申请号：US18488483

申请日：2023-10-17

Applicant: ZHEJIANG HENGYI PETROCHEMICAL CO., LTD. ,  ZHEJIANG SHUANGTU NEW MATERIALS CO., LTD.

Inventor： Xiantao Peng ,  Peng Wang ,  Dake Li ,  Feng Xu ,  Zheng Teng ,  Jianjun Sheng

IPC: B25J9/16 ,  G06T7/70 ,  G06V10/77 ,  G06V10/80 ,  G06V10/82

CPC classification number: B25J9/1692 ,  G06T7/70 ,  G06V10/7715 ,  G06V10/806 ,  G06V10/82 ,  G06T2207/20084 ,  G06V2201/06

Abstract: Provided is a control method, an electronic device and a storage medium. The method includes: obtaining a first target image collected by a first collection device and a second target image collected by a second collection device, in a case of it is determined that characteristic information of a mechanical gripper satisfies a first preset requirement; detecting a first center position of the mechanical gripper in the first target image and a second center position of a target spindle with yarn in the second target image; and generating a calibration instruction, in a case of it is determined that a target position relationship between the first center position and the second center position does not satisfy a second preset requirement, where the calibration instruction is used to calibrate a center position of the mechanical gripper or to calibrate a center position of the target spindle with yarn.

公开(公告)号：US11966171B2

公开(公告)日：2024-04-23

申请号：US17404566

申请日：2021-08-17

Applicant: Tokyo Electron Limited

Inventor： Anton J. Devilliers

IPC: G03F7/00 ,  G03F9/00 ,  G06T7/00 ,  G06T7/33 ,  G06T7/73 ,  G06V10/24 ,  H01L21/66 ,  H01L23/544 ,  G01N21/956 ,  H04N23/56

CPC classification number: G03F7/70633 ,  G03F7/70466 ,  G03F7/7065 ,  G03F7/70683 ,  G03F7/7085 ,  G03F9/7046 ,  G03F9/7073 ,  G03F9/7084 ,  G03F9/7088 ,  G06T7/001 ,  G06T7/337 ,  G06T7/74 ,  G06V10/245 ,  H01L22/20 ,  H01L23/544 ,  G01N21/95607 ,  G06T2207/10048 ,  G06T2207/10152 ,  G06T2207/30148 ,  G06V2201/06 ,  H01L2223/54426 ,  H04N23/56

Abstract: A method of processing a wafer is provided. The method includes providing a reference pattern for patterning a wafer. The reference pattern is independent of a working surface of the wafer. A placement of a first pattern on the working surface of the wafer is determined by identifying the reference pattern to align the first pattern. The first pattern is formed on the working surface of the wafer based on the placement.

公开(公告)号：US11922673B2

公开(公告)日：2024-03-05

申请号：US17354189

申请日：2021-06-22

Applicant: BOE Technology Group Co., Ltd.

Inventor： Tong Liu

IPC: G06V10/75 ,  G05B19/418 ,  G06F18/22 ,  G06F18/24 ,  G06T7/00 ,  G06T7/11 ,  G06T7/12 ,  G06T7/136 ,  G06T7/33 ,  G06T7/90

CPC classification number: G06V10/757 ,  G05B19/41875 ,  G06F18/22 ,  G06F18/24 ,  G06T7/001 ,  G06T7/11 ,  G06T7/12 ,  G06T7/136 ,  G06T7/337 ,  G06T7/90 ,  G05B2219/32368 ,  G06V2201/06

Abstract: Disclosed are a product inspection method and device, producing system and a computer storage medium. The method comprises: conducting image acquisition on a product assembly line to obtain a production line image; extracting a product image including a product to be inspected from the production line image; extracting an inspection point image in a part inspection area in the product image; inputting the inspection point image into an inspection model to obtain an inspection result; and determining that the product to be inspected in the product image has defects under the condition that the inspection result meets any of the following conditions.

公开(公告)号：US11869243B2

公开(公告)日：2024-01-09

申请号：US17059680

申请日：2019-05-31

Applicant: Araani NV

Inventor： Maggy Baetens ,  Maarten Callens ,  Tom Verdonck

IPC: G06V20/52 ,  G01N25/20 ,  G01K17/00

CPC classification number: G06V20/52 ,  G01K17/00 ,  G01N25/20 ,  G06V2201/06

Abstract: The invention relates to a method for detecting the heating activity in objects or materials, based on thermal only or thermal and visual data images. The method is based on a physics-based model of the underlying heating phenomena within materials or objects, while taking into account disturbing factors of natural phenomena such as weather conditions and day and night cycle. The invention also relates to a corresponding system for detecting the heating activity in objects or materials.

公开(公告)号：US11854180B2

公开(公告)日：2023-12-26

申请号：US16069426

申请日：2017-01-13

Applicant: Corning Incorporated

Inventor： Seth Thomas Nickerson ,  David John Worthey

IPC: G06T7/00 ,  B32B3/12 ,  G06F30/23 ,  G06V10/34 ,  G06V30/144 ,  G06F111/10 ,  G06F119/18

CPC classification number: G06T7/0004 ,  B32B3/12 ,  G06F30/23 ,  G06V10/34 ,  G06V30/144 ,  G06F2111/10 ,  G06F2119/18 ,  G06T2207/30108 ,  G06V2201/06 ,  Y02P90/02

Abstract: A non-contact method of characterizing the isostatic strength of a ceramic member or article includes capturing a digital image of the ceramic article, and then forming a two-dimensional representation of the ceramic article and the web therein based on the captured digital image. The method also includes performing finite-element analysis on the two-dimensional representation of the ceramic article using a select amount of simulated isostatic pressure to determine a maximum stress value within the two-dimensional representation of the web. The method further includes using the maximum stress value to characterize the isostatic strength of the ceramic article.