公开(公告)号：US08326011B2

公开(公告)日：2012-12-04

申请号：US12125053

申请日：2008-05-21

Applicant: Josh Star-Lack ,  Mingshan Sun ,  John Milan Pavkovich

Inventor： Josh Star-Lack ,  Mingshan Sun ,  John Milan Pavkovich

IPC: G06K9/00 ,  G01N23/00 ,  G01N23/201 ,  G01B15/02

CPC classification number: G06T7/0012 ,  G06T11/005

Abstract: Several related inventions for estimating scattered radiation in radiographic projections are disclosed. Several of the inventions use scatter kernels of various forms, including symmetric and asymmetric forms. The inventions may be used alone or in various combinations with one another. The resulting estimates of scattered radiation may be used to correct the projections, which can improve the results of tomographic reconstructions. Still other inventions of the present application generate estimates of scattered radiation from shaded or partially shaded regions of a radiographic projection, which may be used to correct the projections or used to adjust the estimates of scattered radiation generated according to inventions of the present application that employ kernels.

Abstract translation: 公开了用于估计射线照相投影中的散射辐射的几个相关发明。 几个发明使用各种形式的散射核，包括对称和非对称形式。 本发明可以单独使用或以各种组合使用。 所得到的散射辐射估计可用于校正投影，这可以改善断层扫描重建的结果。 本申请的其他发明产生了放射线照相投影的阴影或部分阴影区域的散射辐射的估计，其可以用于校正投影或用于调整根据本申请的发明产生的散射辐射的估计 内核

公开(公告)号：US08229165B2

公开(公告)日：2012-07-24

申请号：US12373946

申请日：2007-07-27

Applicant: Malcolm John Alexander Strens

Inventor： Malcolm John Alexander Strens

IPC: G06K9/00 ,  G01N23/201

CPC classification number: G01T1/295

Abstract: A method of processing for a coded aperture imaging apparatus which is useful for target identification and tracking. The method uses a statistical scene model and, preferably using several frames of data, determines a likelihood of the position and/or velocity of one or more targets assumed to be in the scene. The method preferably applies a recursive Bayesian filter or Bayesian batch filter to determine a probability distribution of likely state parameters. The method acts upon the acquired data directly without requiring any processing to form an image.

Abstract translation: 一种用于编码孔径成像设备的方法，其对于目标识别和跟踪是有用的。 该方法使用统计场景模型，并且优选地使用几帧数据来确定假定在场景中的一个或多个目标的位置和/或速度的可能性。 该方法优选地应用递归贝叶斯滤波器或贝叶斯分块滤波器来确定可能的状态参数的概率分布。 该方法直接作用于获取的数据，而不需要任何处理来形成图像。

公开(公告)号：US20120148026A1

公开(公告)日：2012-06-14

申请号：US12965159

申请日：2010-12-10

Applicant: Morteza Safai

Inventor： Morteza Safai

IPC: G01N23/201 ,  H05G1/02

CPC classification number: G01N23/04 ,  G01N23/203

Abstract: The different advantageous embodiments provide an apparatus and a method for inspecting a surface of a work piece. In one advantageous embodiment, an apparatus comprising a number of tracks, a support structure, connection system, and controller is disclosed. The number of tracks are configured for placement along a path. The support structure is configured to move on the number of tracks. The X-ray system is moveably connected to the support structure. The X-ray system is configured to send a plurality of X-rays toward a work piece and is configured to move along an axis through the support structure. The connection system is configured to removably connect the number of tracks to the work piece using a vacuum applied to a surface of the work piece. The controller is configured to activate and deactivate the X-ray system based on an amount of vacuum applied to the surface of the work piece.

Abstract translation: 不同的有利实施例提供了用于检查工件表面的装置和方法。 在一个有利的实施例中，公开了一种包括多个轨道，支撑结构，连接系统和控制器的装置。 轨道的数量被配置为沿着路径放置。 支撑结构配置为在轨道数上移动。 X射线系统可移动地连接到支撑结构。 X射线系统被配置为向工件发送多个X射线，并且被配置为沿轴线移动通过支撑结构。 连接系统被构造成使用施加到工件的表面的真空可移除地将轨道数量连接到工件。 控制器被配置为基于施加到工件表面的真空量激活和去激活X射线系统。

公开(公告)号：US20120134473A1

公开(公告)日：2012-05-31

申请号：US12959356

申请日：2010-12-02

Applicant: Edward James Morton

Inventor： Edward James Morton

IPC: G01N23/201

CPC classification number: G01V5/0025 ,  G01N23/203 ,  G01V5/0008 ,  G01V5/0033 ,  G21K1/043

Abstract: The present application discloses an X-ray imaging apparatus for determining a surface profile of an object under inspection that is positioned at a distance from the apparatus. The X-ray imaging system has an X-ray source for producing a scanning beam of X-rays directed toward the object, a detector assembly for providing a signal representative of an intensity of X-rays backscattered from the object, and processing circuitry to determine a time difference between when the X-ray source is switched on and when the backscattered X-rays arrive at the detector assembly. The processing circuitry is adapted to output data representative of the surface profile of the object under inspection.

Abstract translation: 本申请公开了一种用于确定被检查物体的表面轮廓的X射线成像装置，其位于距离该装置一定距离处。 X射线成像系统具有用于产生朝向物体的X射线的扫描光束的X射线源，用于提供表示从物体反向散射的X射线的强度的信号的检测器组件，以及处理电路 确定当X射线源接通时和反向散射X射线到达检测器组件时的时间差。 处理电路适于输出表示检查对象的表面轮廓的数据。

公开(公告)号：US20120087473A1

公开(公告)日：2012-04-12

申请号：US13264222

申请日：2010-04-12

Applicant: Kazuhiko Omote ,  Yohiyasu Ito

Inventor： Kazuhiko Omote ,  Yohiyasu Ito

IPC: G01N23/201 ,  G01B15/04

CPC classification number: G01B15/04

Abstract: There is provided a surface microstructure measurement method, a surface microstructure measurement data analysis method, and an X-ray scattering measurement device which can accurately measure a microstructure on a surface and which can evaluate a three-dimensional structural feature. In the surface microstructure measurement method, the specimen surface is irradiated with X-ray at a grazing incident angle and a scattering intensity is measured; a specimen model with a microstructure on a surface in which one or more layers is formed in a direction perpendicular to the surface and unit structures are periodically arranged in a direction parallel to the surface within the layers is assumed; a scattering intensity of X-ray scattered by the microstructure is calculated in consideration of effects of refraction and reflection caused by the layer; and the scattering intensity of X-ray calculated by the specimen model is fitted to the measured scattering intensity. Then, as a result of the fitting, an optimum value of a parameter for specifying the shape of the unit structures is determined. Therefore, it is possible to accurately measure a microstructure.

Abstract translation: 提供了可以精确地测量表面上的微结构并且可以评估三维结构特征的表面微结构测量方法，表面微结构测量数据分析方法和X射线散射测量装置。 在表面微结构测定方法中，以放射入射角对X射线照射试样表面，测定散射强度; 在垂直于表面的方向上形成一个或多个层的表面上的微结构的样本模型和单元结构在与层内的表面平行的方向上周期性地布置; 考虑到由该层引起的折射和反射的影响，计算由微结构散射的X射线的散射强度; 并且通过样本模型计算的X射线的散射强度适合于测量的散射强度。 然后，作为拟合的结果，确定用于指定单位结构的形状的参数的最佳值。 因此，可以精确地测量微结构。

公开(公告)号：US08149988B2

公开(公告)日：2012-04-03

申请号：US12731695

申请日：2010-03-25

Applicant: William Bertozzi ,  Robert J. Ledoux

Inventor： William Bertozzi ,  Robert J. Ledoux

IPC: G01N23/04 ,  G01N23/201

CPC classification number: G01N23/20066 ,  G01N23/223 ,  G01N2223/076

Abstract: Methods and systems for detecting potential items of interest in target samples, using nuclear resonance fluorescence, utilize incident photon spectra that are narrower than traditional bremsstrahlung spectra but overlap nuclear resonances in elements of interest for purposes of detection, such as but not limited to the detection of threats in luggage or containers being scanned.

Abstract translation: 用于使用核共振荧光检测目标样品中的潜在目标项目的方法和系统利用比传统的bre致辐射谱更窄的入射光子光谱，但重叠感兴趣元素中的核共振用于检测目的，例如但不限于检测 正在扫描的行李或容器中的威胁。

公开(公告)号：US08122097B2

公开(公告)日：2012-02-21

申请号：US13083277

申请日：2011-04-08

Applicant: Daniel Gross ,  Erwin Gross

Inventor： Daniel Gross ,  Erwin Gross

IPC: G06F15/16 ,  G01N23/201

CPC classification number: H04L51/22 ,  H04L51/00 ,  H04L51/18

Abstract: A communication system is provided in which users associate handling data identifying how messages are to be processed with contact data. Handling data for the identified contacts in the contact data is then dispatched to those contacts. Subsequently when messages are dispatched from the locations identified by the contact data a sender of a message selects handling data to be associated with a message being dispatched. Upon receipt of a message associated with handling data the message is then processed in the manner identified by the handling data.

Abstract translation: 提供了一种通信系统，其中用户将识别消息的处理数据与联系人数据相关联。 然后将联系人数据中识别的联系人的数据处理到这些联系人。 随后，当从由联系人数据标识的位置发送消息时，消息的发送者选择与要分派的消息相关联的处理数据。 在接收到与处理数据相关联的消息时，以处理数据标识的方式处理该消息。

公开(公告)号：US20120008747A1

公开(公告)日：2012-01-12

申请号：US13260380

申请日：2010-03-15

Applicant: Ewald Roessl ,  Thomas Koehler ,  Gerhard Martens

Inventor： Ewald Roessl ,  Thomas Koehler ,  Gerhard Martens

IPC: G01N23/201 ,  G01N23/04

CPC classification number: G21K7/00 ,  A61B6/4291 ,  A61B6/484 ,  A61B6/502

Abstract: The invention relates to an X-ray differential phase-contrast imaging system which has three circular gratings. The circular gratings are aligned with the optical axis of the radiation beam and a phase stepping is performed along the optical axis with the focal spot, the phase grating and/or the absorber grating. The signal measured is the phase-gradient in radial direction away from the optical axis.

Abstract translation: 本发明涉及一种具有三个圆形光栅的X射线差分相位对比成像系统。 圆形光栅与辐射束的光轴对准，并且沿着光轴与焦斑，相位光栅和/或吸收光栅一起执行相位步进。 测量的信号是远离光轴的径向相位梯度。

公开(公告)号：US20120002788A1

公开(公告)日：2012-01-05

申请号：US13142511

申请日：2010-12-29

Applicant: Yigang Yang ,  Tiezhu Li ,  Qinjian Zhang ,  Yi Zhang ,  Yingkang Jin ,  Qinghao Chen ,  Yuanjing Li ,  Yinong Liu

Inventor： Yigang Yang ,  Tiezhu Li ,  Qinjian Zhang ,  Yi Zhang ,  Yingkang Jin ,  Qinghao Chen ,  Yuanjing Li ,  Yinong Liu

IPC: G01N23/201

CPC classification number: G01V5/0025

Abstract: The present invention discloses an article inspection device, comprising: a x-ray machine, a collimation unit, a transmission detector array and at least one scattering detector array. Each of the at least one scattering detector array comprising a plurality of same scattering detector modules arranged in a matrix of i-rows and j-columns. A transmission cross section of the article transmitted by the x-rays is divided into a plurality of same sub-regions arranged in a matrix of i-rows and j-columns. The plurality of scattering detector modules arranged in i-rows and i-columns correspond to the plurality of sub-regions arranged in i-rows and j-columns one by one for detecting pair production effect annihilation photons and Compton-effect scattering photons from the respective sub-regions. Obtaining atomic numbers of the respective sub-regions based on a ratio of the pair production effect annihilation photon count to the Compton-effect scattering photon count, so as to form a three-dimensional image of the article. In addition, the present invention further discloses an article inspection method.

Abstract translation: 本发明公开了一种物品检查装置，包括：x射线机，准直单元，透射检测器阵列和至少一个散射检测器阵列。 所述至少一个散射检测器阵列中的每一个包括以i行和j列的矩阵排列的多个相同的散射检测器模块。 通过X射线透射的物品的透射截面被划分成以i行和j列的矩阵排列的多个相同的子区域。 布置在i行和i列中的多个散射检测器模块对应于一排一列地排列在i行和j列中的多个子区域，用于检测来自该对象的生成效应湮灭光子和康普顿效应散射光子 各分区域。 基于对生产效应湮灭光子计数与康普顿效应散射光子计数的比率来获得各个子区域的原子序数，以形成物品的三维图像。 此外，本发明还公开了一种物品检查方法。

公开(公告)号：US20110261929A1

公开(公告)日：2011-10-27

申请号：US13176176

申请日：2011-07-05

Applicant: Ronald Steven McNabb, JR. ,  Nicholas Danvers Penrose Gillett

Inventor： Ronald Steven McNabb, JR. ,  Nicholas Danvers Penrose Gillett

IPC: G01N23/04 ,  G01N23/201

CPC classification number: G01T7/005 ,  A61B6/483 ,  G01N23/04 ,  G01N23/20083 ,  G01V5/0016

Abstract: An object within a region is exposed to a first beam of penetrating radiation. The first beam of penetrating radiation is sensed on a side opposite the region from a source of the first beam. An attenuation of the first beam caused by passing the first beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of a second of beam of penetrating radiation is adjusted based on the determined attenuation.

Abstract translation: 区域内的物体暴露于第一穿透辐射束。 第一束穿透辐射在与第一光束的源相反的一侧被感测。 确定通过使第一光束通过物体而导致的第一光束的衰减，将衰减与阈值衰减进行比较。 如果衰减超过阈值衰减，则根据所确定的衰减来调整穿透辐射束的第二束参数。