Abstract:
The invention relates to an apparatus and a method for determining the energy of a laser. In particular, the invention relates to an initial determination of a laser energy and the monitoring of the laser energy preferably of an excimer laser for use in a refractive laser system for treatment of any eye. An apparatus for determining an energy of an excimer laser comprises a tool comprising an area being ablated with a plurality of laser pulses of said excimer laser using at least one predetermined multi spot ablation pattern, said ablation area comprising a specific ablation area being as large as the ablation area or smaller, an image capturing means for capturing at least one image comprising at least said specific ablation area of the tool; an analyzing means for analyzing said at least one image, wherein the size of the specific ablation area provides a measure of the energy of the excimer laser.
Abstract:
The drawing apparatus of the present inventions includes a detector having a size for which the detector can simultaneously detect two adjacent charged particle beams among a plurality of charged particle beams, and configured to detect an intensity of a charged particle beam incident thereon. A controller is configured to perform a control of a position of the detector and a control of a blanking deflector array such that one of two adjacent charged particle beams is in a blanking state and the other is in a non-blanking state on the detector that is moved, and each of the plurality of charged particle beams becomes in a blanking state and a non-blanking state sequentially, to cause the detector to perform an output in parallel with the control, and to inspect a defect in each blanking deflector in the blanking deflector array based on the output.
Abstract:
A hazardous area in the region surrounding a reel transport of a reel changer is secured. A contactless protective device is located at the access boundaries of the region. This protective device can be deactivated for feeding and/or removing a known object and comprises an evaluation unit. The protective device is configured as a light curtain that is comprised of a plurality of light beams that run in parallel to each other. The evaluation unit includes an assembly for detecting the sequence of the interruption of the light beams during the feeding and/or the removal of an object. Based on the detected sequence of interruption of the light beams, a known object, that is permitted to access the hazardous area, is detected. The protective device is deactivated in this situation. Securing the hazardous area further includes the provision of a second contactless protective device that is permanently active.
Abstract:
The invention relates to a charged particle system such as a multi beam lithography system, comprising a manipulator device for manipulation of one or more charged particle beams, wherein the manipulator device comprises at least one through opening in the plane of the planar substrate for passing at least one charged particle beam there through. Each through opening is provided with electrodes arranged in a first set of multiple first electrodes along a first part of a perimeter of said through opening and in a second set of multiple second electrodes along a second part of said perimeter. An electronic control circuit is arranged for providing voltage differences the electrodes in dependence of a position of the first and second electrode along the perimeter of the through opening.
Abstract:
Provided are an imaging device unit and a photographing apparatus. The imaging device unit includes an imaging device having an imaging plane on which an optical image of a subject is formed, wherein the imaging unit is configured to convert the optical image into an electrical signal; an optical unit disposed nearer to the subject than the imaging device; a plate that is mounted on a boundary portion of the optical unit, wherein at least an outer portion of the plate extends over an outer edge of the optical unit; a piezoelectric element that is mounted on the plate and configured to vibrate the plate and the optical unit; and a supporting frame that supports the at least outer portion of the plate extending over the outer edge of the optical unit.
Abstract:
An image display device is provided, by which variations in drive sensitivity of a scan mirror is corrected. Processing executed by a CPU in a laser projector includes the steps of: driving a scanner mirror in a vertical direction; allowing at least one of a green laser and red/blue lasers to emit light; calculating stay time in a light-receiving region in a photoreceptor; comparing the calculated stay time with ideal stay time Tideal; decreasing a tilt of a drive signal for driving the scanner mirror in the vertical direction if the calculated stay time is shorter than the stay time Tideal; and increasing the tilt of the drive signal if the calculated stay time is longer than the stay time Tideal.
Abstract:
A system for analyzing smoke has a plurality of units, wherein each unit includes an optical emitter for alternately directing horizontally and vertically polarized light along a beam path, and into a smoke cloud, to generate scattered light. A horizontally polarized detector and a vertically polarized detector are positioned at different locations, but at a same distance and scattering angle relative to the beam path. Each unit has a different wavelength. A computer receives signals from the detectors of all units, in response to each emitter, for analysis of the smoke.
Abstract:
According to one embodiment, an electron beam irradiation apparatus comprises an objective lens configured to irradiate a specimen surface with an electron beam, an electron detector which is provided between the objective lens and the specimen surface and which is configured to detect reflected electrons or secondary electrons emitted from the specimen surface, and an antireflection mechanism which is provided between the electron detector and the specimen surface. The antireflection mechanism has a plurality of holes following spiral trajectories of reflected electrons or secondary electrons emitted from the specimen surface and is configured to prevent the reflected electrons or secondary electrons from being re-reflected toward the specimen surface and to direct a part of the reflected electrons or secondary electrons to the electron detector.
Abstract:
Systems and methods are provided to perform efficient, automatic cyclotron initialization, calibration, and beam adjustment. A process is provided that allows the automation of the initialization of a cyclotron after overnight or maintenance imposed shutdown. In one embodiment, five independent cyclotron system states are defined and the transition between one state to another may be automated, e.g., by the control system of the cyclotron. According to these embodiments, it is thereby possible to achieve beam operation after shutdown with minimal manual input. By applying an automatic procedure, all active devices of the cyclotron (e.g., RF system, extraction deflectors, ion source) are respectively ramped to predefined parameters.
Abstract:
Provided is a gas field ionization ion source capable of emitting heavy ions with high brightness which are suitable for processing a sample. The gas field ionization ion source according to the present invention includes a temperature controller individually controlling the temperature of the tip end of an emitter electrode (1) and the temperature of a gas injection port part (3) of a gas supply unit.