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公开(公告)号:US07671988B2
公开(公告)日:2010-03-02
申请号:US11539878
申请日:2006-10-10
Applicant: Robert Dal Sasso , David Logan , William Phelan
Inventor: Robert Dal Sasso , David Logan , William Phelan
IPC: G01N21/00
CPC classification number: G01N21/53 , G01J3/10 , G01N2201/06153
Abstract: A device (10) is provided for measuring at least one characteristic (12) related to presence of particles. The device (10) includes a light source unit (16) for emitting light into a region (18) containing particles (20), with the light source being configured to emit light from a plurality of locations in a manner so that the emitted light follows a desired intensity distribution (22), the desired intensity distribution (22) being desired for the measurement of the at least one characteristic (12). In preferred embodiments the intensity distribution is Lambertian.
Abstract translation: 提供了一种用于测量与颗粒存在有关的至少一个特征(12)的装置(10)。 装置(10)包括用于将光发射到包含颗粒(20)的区域(18)中的光源单元(16),其中光源被配置为以多个位置发射光,使得发射的光 遵循期望的强度分布(22),期望强度分布(22)用于测量至少一个特征(12)。 在优选实施例中,强度分布是朗伯式。
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公开(公告)号:US20090263005A1
公开(公告)日:2009-10-22
申请号:US12490249
申请日:2009-06-23
Applicant: Yukio KURAMASU , Tetsuya NUKAMI
Inventor: Yukio KURAMASU , Tetsuya NUKAMI
IPC: G06K9/00
CPC classification number: G01N21/8806 , G01N33/205 , G01N2021/8816 , G01N2021/8896 , G01N2201/06153 , G01N2201/0636
Abstract: An impurity measuring device includes a table (T) on which a sample (S) is to be placed with its fracture surface (h) facing up, an illuminating means (7) for irradiating the fracture surface (h) with light (L) from a plurality of directions, an image sensing means for sensing an image of the fracture surface (h) irradiated with the light (L), continuous tone color image processing means for processing the sensed image into a continuous tone color image, and a binarizing means for binarizing the continuous tone color image through comparison between the result of the continuous tone color image processing and a threshold value. As the fracture surface (h) is irradiated with the light (L) from the plurality of directions, the image obtained by sensing the image of the fracture surface (h) is free from shading or optical irregularities caused by minute irregularities on the fracture surface (h). Therefore, impurities in the sample (S) can be accurately detected from the fracture surface (h) by subjecting the image to the continuous tone color image processing and binarization.
Abstract translation: 一种杂质测量装置,包括:台面(T),其表面(S)的断面(h)面朝上放置在所述台面(T)上;照射装置(7),用光(L)照射断裂面 从多个方向观察用于感测用光(L)照射的断裂面(h)的图像的图像感测装置,用于将感测图像处理成连续色调图像的连续色调图像处理装置,以及二值化 用于通过连续色调图像处理的结果与阈值之间的比较对连续色彩图像进行二值化的装置。 当从多个方向对光(L)照射断裂面(h)时,通过感测断裂面(h)的图像而获得的图像没有由断裂面上的微细凹凸引起的阴影或光学不规则 (H)。 因此,通过对图像进行连续色调图像处理和二值化处理,可以从断裂面(h)精确地检测样品(S)中的杂质。
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公开(公告)号:US20040179194A1
公开(公告)日:2004-09-16
申请号:US10811534
申请日:2004-03-29
Applicant: S.A.E. AFIKIM COMPUTERIZED DAIRY MANAGEMENT SYSTEM , AGRICULTURAL RESEARCH ORGANIZATION OF THE STATE OF ISRAEL MINISTRY OF AGRICULTURAL
Inventor: Zeev Schmilovitch , Gil Katz , Ephraim Maltz , Martin I. Kutscher , Moran Sarig , Ilan Halachmi , Aharon Hoffman , Haim Egozi , Eithan Uner
IPC: G01N021/01
CPC classification number: G01N21/05 , G01J3/10 , G01N21/3577 , G01N21/359 , G01N21/532 , G01N33/04 , G01N2201/06153
Abstract: An NIR spectroscopy fluid analyzing system using a series of LED's, each having its own preselected center wavelength, as illumination sources. These wavelengths have overlapping spectral widths, such that the measurement covers a broad spectrum. The LED's illuminate the fluid sample sequentially, and subsequently the transmission absorbance through the sample and the reflectance or scattering from the sample is measured for the wavelength range of each LED. The measurements are performed using photodetectors. The concentrations of component parts of the fluid are expressed in the form of a polynomial, which is a function of the measured transmitted and/or reflected intensities, and of empirical coefficients, which are extracted by prior statistical analysis on measured intensities obtained from a large number of test samples having known concentrations of the component. A novel sample chamber, capable of performing optical absorption measurements on a flowing sample of fluid, is described.
Abstract translation: 使用一系列LED(每个具有其自己的预选中心波长)作为照明源的NIR光谱流体分析系统。 这些波长具有重叠的光谱宽度,使得测量覆盖广谱。 LED依次照射流体样品,随后在每个LED的波长范围内测量通过样品的透射吸光度和来自样品的反射或散射。 使用光电检测器进行测量。 流体的组成部分的浓度以多项式的形式表示,多项式是测量的透射和/或反射强度以及经验系数的函数,经验系数是通过先前的统计分析提取的,从大尺寸 具有已知浓度组分的测试样品的数量。 描述了能够对流动的流体样品进行光学吸收测量的新型样品室。
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公开(公告)号:US20030098969A1
公开(公告)日:2003-05-29
申请号:US09996625
申请日:2001-11-28
Inventor: Gil Katz , Ze?apos;ev Schmilovitz , Ephraim Maltz , Martin I. Kutscher , Moran Sarig , Ilan Halachmi , Aharon Hoffman , Haim Egozi , Eithan Unar
IPC: G01N021/59
CPC classification number: G01N21/31 , G01J3/10 , G01N21/05 , G01N21/359 , G01N21/532 , G01N33/04 , G01N2201/06153
Abstract: An NIR spectroscopy fluid analyzing system, using a series of LED's, each having its own preselected center wavelength, as illumination sources. These wavelengths have overlapping spectral widths, such that the measurement covers a broad spectrum. The LED's illuminate the fluid sample sequentially, and the transmission absorbence through the sample, and the reflectance or scattering from the sample is measured for the wavelength range of each LED. The measurements are performed using photodetectors. The concentrations of component parts of the fluid are expressed in the form of a polynomial, which is a function of the measured transmitted and/or reflected intensities, and of empirical coefficients, which are extracted by prior statistical analysis on measured intensities obtained from a large number of test samples having known concentrations of the component. A novel sample chamber, capable of performing optical absorption measurements on a flowing sample of fluid is described.
Abstract translation: NIR光谱流体分析系统,使用一系列LED,每个具有其自己的预选中心波长作为照明源。 这些波长具有重叠的光谱宽度,使得测量覆盖广谱。 LED依次照射流体样品,透过样品的透射吸收,并对每个LED的波长范围测量样品的反射或散射。 使用光电检测器进行测量。 流体的组成部分的浓度以多项式的形式表示,多项式是测量的透射和/或反射强度以及经验系数的函数,经验系数是通过先前的统计分析提取的,从大尺寸 具有已知浓度组分的测试样品的数量。 描述了能够对流动的流体样品进行光学吸收测量的新型样品室。
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公开(公告)号:US5394246A
公开(公告)日:1995-02-28
申请号:US271554
申请日:1994-07-07
Applicant: Kenji Sugawara
Inventor: Kenji Sugawara
CPC classification number: H01L24/85 , G01N21/8806 , G01R31/2853 , G01R31/311 , H01L24/48 , H01L24/78 , G01N2021/8822 , G01N2021/8887 , G01N2201/06153 , G01N2201/102 , H01L2224/05554 , H01L2224/05599 , H01L2224/45144 , H01L2224/48245 , H01L2224/48247 , H01L2224/48599 , H01L2224/73265 , H01L2224/78 , H01L2224/859 , H01L2924/00014 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01019 , H01L2924/01033 , H01L2924/01039 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/3025
Abstract: An apparatus for inspecting wires bonded between the pads of a semiconductor chip and the leads of a lead frame including: an illuminating assembly that emits lights, via LED's that are arranged in a ring-shape, onto the object of inspection such as the ball at the end of a bonded wire; an optical assembly that images the object of inspection which is illuminated by the illumination assembly, and cameras that photograph the image taken in by the optical assembly. When the ball, particularly its shape, is inspected, a dark field illumination circumstance is created by the illuminating assembly so that only the ball can appear bright. In this case, a diaphragm of the optical assembly is also adjusted so as to create a shallow focal depth for the ball.
Abstract translation: 一种用于检查接合在半导体芯片的焊盘和引线框的引线之间的引线的装置,包括:照亮组件,其通过LED被布置成环形,发光到检查对象上,例如球 接合线的末端; 对由照明组件照明的检查对象进行成像的光学组件,以及照相由光学组件拍摄的图像的照相机。 当检查球,特别是其形状时,照明组件产生暗场照明环境,使得只有球可以看起来明亮。 在这种情况下,还调整光学组件的光阑以产生球的浅焦深。
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公开(公告)号:US4882498A
公开(公告)日:1989-11-21
申请号:US336642
申请日:1989-04-07
Applicant: Don W. Cochran , James R. Austin
Inventor: Don W. Cochran , James R. Austin
IPC: G01N21/84 , G01N21/88 , G01N21/954 , G01N21/956
CPC classification number: G01N21/8806 , G01N2021/8455 , G01N2021/8887 , G01N2021/95615 , G01N21/909 , G01N2201/06153 , G01N2201/102
Abstract: An engineered lighting system for use in an inspection system is comprised of an array of light emitting diodes. A specimen is brought into the viewing area, and a current pulse is provided to the diodes of the array to selectively flash all or a portion of the diodes of the array. Reflected light from the specimen is sensed and a digitized image is generated therefrom. An illumination level of the digitized image is adjustable, in whole or in part, by varying the effective lighting intensity of one or more of the diodes of the array during a flash period. The digitized image of the specimen is compared to data indicative of acceptability of the specimen, and acceptance or rejection of the specimen is decided on a basis of a comparison therebetween.
Abstract translation: 用于检查系统的工程照明系统由发光二极管阵列组成。 将样本带入观察区域,并且向阵列的二极管提供电流脉冲以选择性地闪烁阵列的二极管的全部或一部分。 检测到来自样本的反射光并从其中产生数字化图像。 通过在闪光期间改变阵列的一个或多个二极管的有效照明强度,数字化图像的照明水平可以全部或部分地调整。 将样本的数字化图像与指示样品可接受性的数据进行比较,并且基于它们之间的比较来确定样品的接受或排除。
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