公开(公告)号：US4916721A

公开(公告)日：1990-04-10

申请号：US81964

申请日：1987-08-05

Applicant: Martin J. Carr ,  Alton D. Romig, Jr.

Inventor： Martin J. Carr ,  Alton D. Romig, Jr.

IPC: G21K1/06

CPC classification number: G21K1/06 ,  G21K2201/064 ,  G21K2201/067

Abstract: A non-planar, focusing mirror, to be utilized in both electron column instruments and micro-x-ray fluorescence instruments for performing chemical microanalysis on a sample, comprises a concave, generally spherical base substrate and a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on the base substrate. The thickness of each layer is an integral multiple of the wavelength being reflected and may vary non-uniformly according to a predetermined design. The chemical analytical instruments in which the mirror is used also include a predetermined energy source for directing energy onto the sample and a detector for receiving and detecting the x-rays emitted from the sample; the non-planar mirror is located between the sample and detector and collects the x-rays emitted from the sample at a large solid angle and focuses the collected x-rays to the sample.For electron column instruments, the wavelengths of interest lie above 1.5 nm, while for x-ray fluorescence instruments, the range of interest is below 0.2 nm. Also, x-ray fluorescence instruments include an additional non-planar focusing mirror, formed in the same manner as the previously described mThe invention described herein was made in the performance of work under contract with the Department of Energy, Contract No. DE-AC04-76DP00789, and the United States Government has rights in the invention pursuant to this contract.

Abstract translation: 在用于对样品进行化学微量分析的电子束仪器和微x射线荧光仪器中使用的非平面聚焦镜包括凹的，通常为球形的基底基底和预定数量的高原子的交替层 数字材料和低原子序数材料连续地形成在基底基板上。 每个层的厚度是被反射的波长的整数倍，并且可以根据预定的设计而不均匀地变化。 使用反射镜的化学分析仪器还包括用于将能量引导到样品上的预定能量源和用于接收和检测从样品发射的x射线的检测器; 非平面镜位于样品和检测器之间，并以大的立体角收集从样品发射的x射线，并将收集的x射线聚焦到样品。 对于电子柱仪器，感兴趣的波长在1.5nm以上，而对于x射线荧光仪器，感兴趣的范围低于0.2nm。 此外，x射线荧光仪器包括以与前述反射镜相同的方式形成并位于能量源和样品之间的附加非平面聚焦反射镜，以收集从光源发射的x射线并将其引导到 样品不损失强度。

公开(公告)号：US4882780A

公开(公告)日：1989-11-21

申请号：US309304

申请日：1989-01-03

Applicant: David B. Wittry

Inventor： David B. Wittry

IPC: G01N23/223 ,  G21K1/06

CPC classification number: G21K1/06 ,  G01N23/223 ,  G01N2223/076 ,  G21K2201/062 ,  G21K2201/064 ,  G21K2201/067

Abstract: A doubly-curved crystal for use in a scanning monochromator is oriented with respect to a reference plane containing source and image locations of the monochromator. The crystal has concave planes of lattice points and a concave crystal surface which satisfy Johannson geometric conditions within the reference plane for a Rowland circle of radius R. The planes of lattice points are substantially spherically curved to a radius of 2R, and the crystal surface is substantially toroidally curved with a radius of substantially 2R within a plane perpendicular to the reference plane. The crystal may be formed by plastically deforming a cylindrically curved crystal blank over a doubly-curved convex die.

Abstract translation: 用于扫描单色仪的双曲面晶体相对于包含单色仪的源和图像位置的参考平面定向。 晶体具有格子点的凹面和凹面结构，其对于半径为R的罗兰圆，在参考平面内满足约翰逊几何条件。格点的平面基本上球形弯曲为半径为2R，晶体表面为 在垂直于参考平面的平面内大致环形弯曲，半径大致为2R。 晶体可以通过将圆柱形弯曲的晶体坯料塑性变形在双曲形凸模上而形成。

公开(公告)号：US4807268A

公开(公告)日：1989-02-21

申请号：US833950

申请日：1986-02-26

Applicant: David B. Wittry

Inventor： David B. Wittry

IPC: G01N23/223 ,  G21K1/06 ,  G01N23/20

CPC classification number: G01N23/223 ,  G21K1/06 ,  G01N2223/076 ,  G21K2201/062 ,  G21K2201/064 ,  G21K2201/067

Abstract: A doubly-curved crystal for use in a scanning monochromator is oriented with respect to a reference plane containing source and image locations of the monochromator. The crystal has concave planes of lattice points and a concave crystal surface which satisfy Johannson geometric conditions within the reference plane for a Rowland circle of radius R. The planes of lattice points are substantially spherically curved to a radius of 2R, and the crystal surface is substantially toroidally curved with a radius of substantially 2R within a plane perpendicular to the reference plane. The crystal may be formed by plastically deforming a cylindrically curved crystal blank over a doubly-curved convex die.

Abstract translation: 用于扫描单色仪的双曲面晶体相对于包含单色仪的源和图像位置的参考平面定向。 晶体具有格子点的凹面和凹面结构，其对于半径为R的罗兰圆，在参考平面内满足约翰逊几何条件。格点的平面基本上球形弯曲为半径为2R，晶体表面为 在垂直于参考平面的平面内大致环形弯曲，半径大致为2R。 晶体可以通过将圆柱形弯曲的晶体坯料塑性变形在双曲形凸模上而形成。

公开(公告)号：US4553253A

公开(公告)日：1985-11-12

申请号：US704131

申请日：1984-06-20

Applicant: Helmuth Petersen

Inventor： Helmuth Petersen

IPC: G01J3/18 ,  G02B5/18 ,  G21K1/06 ,  G02B27/44

CPC classification number: G01J3/1804 ,  G21K1/06 ,  G21K2201/064

Abstract: A plane-grating monochromator is described which is particularly well suited for wavelengths in the range from approximately 1 to 15 nanometers and contains as its primary optical elements a diffraction grating (16) and an ellipsoid mirror (20). If both the entry aperture and the exit aperture are intended to be stationary, then a pivotable mirror (14) preceding them is provided. The present plane-grating monochromator is distinguished by an accurate image, virtually free of distortion, and correspondingly high resolution as well as by simple optics; it includes only two or three optical elements, and a kinematically simple adjusting mechanism for the optical elements suffices for adjusting the wavelength.

Abstract translation: 描述了一种平面光栅单色仪，其特别适用于约1至15纳米范围内的波长，并且包含作为其主要光学元件的衍射光栅（16）和椭圆面镜（20）。 如果入口孔和出口孔都要静止，则提供它们之前的可枢转镜（14）。 本平面光栅单色仪的特征在于准确的图像，实际上没有失真，相应的高分辨率以及简单的光学元件; 它仅包括两个或三个光学元件，并且用于光学元件的运动学上简单的调节机构足以调节波长。

公开(公告)号：US4461018A

公开(公告)日：1984-07-17

申请号：US385993

申请日：1982-06-07

Applicant: Gene E. Ice ,  Cullie J. Sparks, Jr.

Inventor： Gene E. Ice ,  Cullie J. Sparks, Jr.

IPC: G21K1/06 ,  G01N23/20

CPC classification number: G21K1/06 ,  G21K2201/062 ,  G21K2201/064

Abstract: The invention is a new type of diffraction crystal designed for sagittally focusing photons of various energies. The invention is based on the discovery that such focusing is not obtainable with conventional crystals because of distortion resulting from anticlastic curvature. The new crystal comprises a monocrystalline base having a front face contoured for sagittally focusing photons and a back face provided with rigid, upstanding, stiffening ribs restricting anticlastic curvature. When mounted in a suitable bending device, the reflecting face of the crystal can be adjusted to focus photons having any one of a range of energies.

Abstract translation: 本发明是为各种能量的矢量聚焦光子而设计的新型衍射晶体。 本发明基于以下发现：由于由反弹性曲率引起的变形，这种聚焦不能用常规晶体获得。 新晶体包括具有用于垂直聚焦光子的前表面的单晶基底和设置有限制反弹性曲率的刚性，直立的加强肋的后表面。 当安装在合适的弯曲装置中时，可以调整晶体的反射面以聚焦具有一定能量范围的光子。

公开(公告)号：US4446568A

公开(公告)日：1984-05-01

申请号：US270968

申请日：1981-06-05

Applicant: Arthur R. Williams ,  William L. Johnson

Inventor： Arthur R. Williams ,  William L. Johnson

IPC: G01N23/207 ,  G21K1/06 ,  G01N23/02 ,  G01N23/20 ,  G01N23/22

CPC classification number: G21K1/06 ,  G01N23/207 ,  G21K2201/062 ,  G21K2201/064

Abstract: A versatile focusing radiation analyzer for EXAFS, fluorescence EXAFS, Raman or modified Compton scattering, diffraction, Rayleigh scattering and other experiments is comprised of a concave focusing element (10) placed at the end of a central arm (11) pivoted at the center (24) of a circle (21). Side arms (12, 13) are also pivoted at the center (24). A platform (17) supports an X-ray source (50, 61, 66) or a sample (16) at the end of one side arm (12) while a platform (23) supports a detector (22, 63, 66), sample (51) and detector (52) or Mossbauer source (80). Constraining bars (14, 15) attached to the side arms and to a slide (29) in a slot (30) cause one side arm (13) to maintain an angle (.theta.) with the center arm equal to the angle of the other side arm (12) with the center arm as the center arm is driven relative to that side arm by suitable means (25-28). Rods (31, 32) or belts (36, 38) with pulleys (35, 37) maintain the optical axis of the elements on the platforms (17, 23) directed to the center of the focusing element (10) as the angle (.theta.) is varied. The focusing element (10) may be a single crystal bent and polished to a Johanssen focusing configuration, or a sample bent to the same configuration, depending on the experiment. A small focusing crystal (20) may be used to select one of the characteristic lines of the X-ray source (19). The acquisition time of a complete scan of the angle .theta. may be reduced without increasing the source intensity or sacrificing resolution due to the focusing geometry of the concave element.

Abstract translation: 用于EXAFS，荧光EXAFS，拉曼或改进的康普顿散射，衍射，瑞利散射和其他实验的通用聚焦辐射分析仪包括设置在中心臂（11）的中心枢转的端部处的凹形聚焦元件（10） 24）。 侧臂（12,13）也在中心（24）枢转。 平台（17）在一个侧臂（12）的端部处支撑X射线源（50,61,66）或样品（16），而平台（23）支撑检测器（22,63,66） ，样品（51）和检测器（52）或Mössbauer源（80）。 附接到侧臂和狭槽（30）中的滑块（29）的约束条（14,15）使得一个侧臂（13）保持与中心臂的角度（θ）等于另一个的角度 以臂为中心的侧臂（12）通过合适的装置（25-28）相对于该侧臂被驱动。 具有滑轮（35,37）的杆（31,32）或带（36,38）将导向于聚焦元件（10）中心的平台（17,23）上的元件的光轴保持为角度 theta）变化。 根据实验，聚焦元件（10）可以是被弯曲并抛光到Johanssen聚焦配置的单晶或弯曲成相同配置的样品。 可以使用小的聚焦晶体（20）来选择X射线源（19）的特征线之一。 可以减小角度θ的完整扫描的采集时间，而不会由于凹入元件的聚焦几何形状而增加源强度或牺牲分辨率。

公开(公告)号：US4426719A

公开(公告)日：1984-01-17

申请号：US234510

申请日：1981-02-12

Applicant: Benjamin S. Fraenkel

Inventor： Benjamin S. Fraenkel

IPC: G01N23/20 ,  G21K1/06 ,  G01B15/00

CPC classification number: G21K1/06 ,  G01N23/20 ,  G21K2201/062 ,  G21K2201/064

Abstract: The present method and apparatus produces undistorted x-ray images of sources emitting x-rays and especially of certain areas emitting x-rays. Stigmatic monochromatic x-ray images, and x-ray spectra with a spatial resolution along the lines of the spectrum are produced. The device comprises, in combination, an x-ray diffraction crystal capable of simultaneous reflection, and an x-ray point intensity measuring system, the arrangement being such that the reflection plane of the crystal makes an angle with the plane of the intensity measurement system of 90 degrees of angle minus the Bragg angle for a forbidden reflection of the crystal, and where the x-ray radiation incident on the crystal makes a Bragg angle with the plane of the forbidden reflection, the azimuthal arrangement allowing simultaneous reflection. A source of x-rays forms, by means of double reflection from a plane crystal of adequate size, a plurality of undistorted spectral images, each of which corresponds to a given wavelength of the x-ray emitter. When x-rays from a suitable source are incident on a crystal of suitable curvature, and by double reflection, a spectrum is obtained, each line corresponding to a given wavelength, the variation of density along each line being indicative of the spatial distribution of the emitter of each line in the direction of such line.

Abstract translation: 本发明的方法和装置产生发射X射线，特别是发射X射线的某些区域的源的未失真的x射线图像。 产生单色单色X射线图像和具有沿谱线的空间分辨率的X射线光谱。 该装置组合包括能够同时反射的x射线衍射晶体和x射线点强度测量系统，该结构使得晶体的反射平面与强度测量系统的平面成一角度 90度角减去晶体的禁止反射的布拉格角，并且入射到晶体上的X射线辐射与禁止反射的平面形成布拉格角，方位角排列允许同时反射。 X射线源通过来自适当尺寸的平面晶体的双反射形成多个未失真的光谱图像，每个光束图像对应于x射线发射器的给定波长。 当来自合适的源的X射线入射到具有合适曲率的晶体上时，并且通过双反射获得光谱，每条线对应于给定波长，沿着每条线的密度变化表示的是空间分布 每行的发射器在这条线的方向上。

公开(公告)号：US4195914A

公开(公告)日：1980-04-01

申请号：US930319

申请日：1978-08-02

Applicant: John L. Hughes

Inventor： John L. Hughes

IPC: G02B17/06 ,  G21K1/06 ,  H05H1/22 ,  G02B5/10

CPC classification number: G21B1/23 ,  G02B19/0023 ,  G02B19/0047 ,  G21K1/06 ,  G21K2201/064

Abstract: An evacuated chamber utilizing an arrangement of three mirrors for accurately focussing a large diameter, high power pulsed laser beam or continuous wave laser beam either in a small focal volume or onto the surface of a target placed inside the chamber is described. The invention enables the production of an intense photon distribution within a center-of-momentum region or the uniform irradiation of laser fusion pellets.

Abstract translation: 描述了使用三个反射镜的布置的真空室，用于将小直径体积中的大直径，大功率脉冲激光束或连续波激光束精确地聚焦在放置在腔室内的靶的表面上。 本发明使得能够在动量中心区域内产生强光子分布或激光熔融颗粒的均匀照射。

公开(公告)号：US4192994A

公开(公告)日：1980-03-11

申请号：US943089

申请日：1978-09-18

Applicant: Sidney O. Kastner

Inventor： Sidney O. Kastner

IPC: G02B5/18 ,  G21K1/06 ,  G01N23/20

CPC classification number: G21K1/06 ,  G02B5/1838 ,  G02B5/1861 ,  G21K2201/064

Abstract: There is disclosed herein an aspheric grating which is operable to image local or distant point sources sharply in a designated wavelength, i.e. produce a perfectly stigmatic image in the given wavelength at grazing angles of incidence. The grating surface comprises a surface of revolution defined by a curve which does not have a constant radius of curvature but is defined by a non-linear differential equation specified in terms of the diffraction condition expressed as (m.lambda./.sigma.).sup.2 =A>O where m is the diffraction order, .lambda. is the wavelength and .sigma. is the grating surface ruling interval.

Abstract translation: 这里公开了一种非球面光栅，其可操作以以指定的波长锐利地对局部或远距离的点光源进行成像，即，以掠射入射角度在给定波长内产生完美的图像。 光栅表面包括由曲线限定的旋转表面，该曲线不具有恒定的曲率半径，而是由表示为（mλ/ sigma）2 = A>的衍射条件所指定的非线性微分方程定义。 O，其中m是衍射级，λ是波长，sigma是光栅表面刻划间隔。

公开(公告)号：US3543024A

公开(公告)日：1970-11-24

申请号：US3543024D

申请日：1967-02-03

Applicant: KANTOR FREDERICK W

Inventor： KANTOR FREDERICK W

IPC: G21K1/06 ,  G01T1/00

CPC classification number: G21K1/06 ,  G21K2201/064 ,  G21K2201/067 ,  G21K2201/068