公开(公告)号：US20110188632A1

公开(公告)日：2011-08-04

申请号：US12699528

申请日：2010-02-03

Applicant: Geoffrey Harding ,  Stephan Olesinski ,  Dirk Kosciesza ,  Helmut Rudolf Strecker

Inventor： Geoffrey Harding ,  Stephan Olesinski ,  Dirk Kosciesza ,  Helmut Rudolf Strecker

IPC: G01N23/201 ,  G21K1/02

CPC classification number: G21K1/025 ,  G01V5/0016 ,  G01V5/0025

Abstract: A detection system includes a multi-focus radiation source configured to generate X-ray radiation and a primary collimator defining a first row of apertures and a second row of apertures. The first row of apertures forms first X-ray beams within a first plane from the X-ray radiation, and the second row of apertures forms second X-ray beams within a second plane from the X-ray radiation. The first plane is different than the second plane. The detection system further includes a scatter detector including a first row of scatter detector elements and a second row of scatter detector elements. The first row of scatter detector elements is configured to detect scattered radiation from the first X-ray beams, and the second row of scatter detector elements is configured to detect scattered radiation from the second X-ray beams.

Abstract translation: 检测系统包括被配置为产生X射线辐射的多焦点辐射源和限定第一排孔和第二排孔的主准直器。 第一排孔从X射线辐射在第一平面内形成第一X射线束，并且第二排孔从X射线辐射在第二平面内形成第二X射线束。 第一个平面与第二个平面不同。 检测系统还包括散射检测器，其包括第一排散射检测器元件和第二排散射检测器元件。 第一排散射检测器元件被配置为检测来自第一X射线束的散射辐射，并且第二排散射检测器元件被配置为检测来自第二X射线束的散射辐射。

公开(公告)号：US20110135061A1

公开(公告)日：2011-06-09

申请号：US12993623

申请日：2009-05-20

Applicant: Andreas Thünemann

Inventor： Andreas Thünemann

IPC: G01N23/201 ,  B82Y35/00

CPC classification number: G01N23/201 ,  G01N15/0211 ,  G01N15/0227 ,  G01N2013/003 ,  G01N2015/0038

Abstract: The invention relates to a method and to an apparatus for analyzing nanoparticles, wherein the nanoparticles are first fractionated as a function of their particle size and subsequently analyzed, wherein small angle X-ray scattering is used for the analysis of the nanoparticles, and to a corresponding apparatus for carrying out the method according to the invention. The analysis by means of small angle X-ray scattering comprises the focussing of X-radiation onto the nanoparticles to be analyzed by means of a slit collimator and the analysis of the nanoparticles using a detector-to-sample distance of less than 50 cm.

Abstract translation: 本发明涉及一种用于分析纳米颗粒的方法和装置，其中首先将纳米颗粒作为其颗粒尺寸的函数进行分级，随后进行分析，其中使用小角度X射线散射来分析纳米颗粒，并使用 用于执行根据本发明的方法的相应装置。 通过小角度X射线散射的分析包括通过狭缝准直器将X射线聚焦到待分析的纳米颗粒上，并且使用小于50cm的检测器到样品的距离对纳米颗粒进行分析。

公开(公告)号：US20110135060A1

公开(公告)日：2011-06-09

申请号：US12993831

申请日：2009-05-20

Applicant: Edward James Morton

Inventor： Edward James Morton

IPC: G01N23/201

CPC classification number: G01V5/0025 ,  G01N23/20083 ,  G01N23/203 ,  G01N2223/053 ,  G01V5/0016

Abstract: This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements.

Abstract translation: 本发明提供一种用于扫描扫描区域中的物体的扫描系统。 扫描系统包括布置成以具有至少900keV的峰值能量的辐射照射物体的辐射源和布置成检测从物体散射的辐射的散射检测器，其中辐射源被布置成通过多个 在单次照射事件中要扫描的区域。 散射检测器包括多个检测元件，每个检测元件被布置成检测来自扫描区域的预定义部分的散射辐射，以及信号处理器，被布置成计算跨越多个检测器元件的散射强度。

公开(公告)号：US07912180B2

公开(公告)日：2011-03-22

申请号：US12388947

申请日：2009-02-19

Applicant: Yu Zou ,  Michael D. Silver ,  Satoru Ohishi ,  Kozo Sato

Inventor： Yu Zou ,  Michael D. Silver ,  Satoru Ohishi ,  Kozo Sato

IPC: G01N23/201 ,  G01N23/00

CPC classification number: A61B6/032 ,  A61B6/5282 ,  G06T5/003 ,  G06T5/50 ,  G06T2207/10081 ,  G06T2207/20224 ,  G06T2207/30004

Abstract: Scattered radiation is estimated by using a reduced image generated from a projection image, and the scattered radiation image of the projection image is acquired by enlargement processing. The scattered radiation correction of the projection image is executed by subtracting the obtained scattered radiation image from the projection image. In addition, when a primary X-ray image and a scattered radiation image in each projection direction are to be obtained by sequential approximation calculation, a primary X-ray image which has already been identified in an adjacent projection direction is used as a first estimated value (initially set value) in next sequential calculation.

Abstract translation: 通过使用从投影图像生成的缩小图像来估计散射辐射，并且通过放大处理获取投影图像的散射辐射图像。 通过从投影图像中减去所获得的散射辐射图像来执行投影图像的散射辐射校正。 此外，当通过顺序近似计算要获得每个投影方向上的主X射线图像和散射辐射图像时，将已经在相邻投影方向上识别的主X射线图像用作第一估计 值（初始设定值）。

公开(公告)号：US07903785B2

公开(公告)日：2011-03-08

申请号：US12373278

申请日：2006-07-12

Applicant: Jung Ho Je ,  Jae Mok Yi

Inventor： Jung Ho Je ,  Jae Mok Yi

IPC: G01N23/201

CPC classification number: G01N23/20083 ,  G01N2223/1003 ,  G01N2223/413 ,  G01N2223/646

Abstract: Provided is a method of bright-field imaging using x-rays in a sample to reveal lattice defects as well as structural inhomogeneities, the method comprising: (a) disposing a sample on a holder in the Laue transmission geometry and setting the sample to a single reflection in the Bragg diffraction; (b) projecting a beam of monochromatic x-rays on the sample; and (c) obtaining transmitted radiographic images and reversed diffracted images of the projected beam of monochromatic x-rays by the sample, respectively.

Abstract translation: 提供了一种利用样品中的X射线进行亮场成像以显示晶格缺陷以及结构不均匀性的方法，该方法包括：（a）在Laue透射几何中将样品放置在支架上并将样品设置为 布拉格衍射中的单反射; （b）将一束单色x射线投射在样品上; 和（c）分别通过样本获得透射的放射线照相图像和反射衍射的单色X射线束的衍射图像。

公开(公告)号：US20110051894A1

公开(公告)日：2011-03-03

申请号：US12813049

申请日：2010-06-10

Applicant: Toshiyuki Takahara

Inventor： Toshiyuki Takahara

IPC: G01N23/201

CPC classification number: G01N23/223 ,  G01N2223/076

Abstract: An X-ray analysis apparatus including: a radiation source configured to irradiate an irradiation point on a sample with radiation; an X-ray detector configured to detect a characteristic X-ray emitted from the sample, and output a signal including energy information about the characteristic X-ray; an analyzer configured to analyze the signal; a sample stage configured to allow placement of the sample thereon; a shifting mechanism being capable of relatively shifting the sample on the sample stage and the radiation source and the X-ray detector with respect to each other; a height measuring mechanism being capable of measuring the height of the irradiation point on the sample; and a controller configured to control the shifting mechanism on the basis of the measured height of the irradiation point on the sample and adjust the distance of the sample with respect to the radiation source and the X-ray detector is used.

Abstract translation: 一种X射线分析装置，包括：被配置为用辐射照射样品上的照射点的辐射源; X射线检测器，被配置为检测从样本发射的特征X射线，并输出包括关于特征X射线的能量信息的信号; 分析器，被配置为分析所述信号; 样品台，其构造成允许样品放置在其上; 移动机构能够相对于彼此相对移动样品台上的样品和辐射源和X射线检测器; 高度测量机构能够测量样品上的照射点的高度; 以及控制器，其被配置为基于所测量的样品的照射点的高度来控制所述移动机构，并且调整所述样本相对于所述辐射源的距离，并且使用所述X射线检测器。

公开(公告)号：US20110019799A1

公开(公告)日：2011-01-27

申请号：US12841401

申请日：2010-07-22

Applicant: Daniel Shedlock

Inventor： Daniel Shedlock

IPC: G01N23/201

CPC classification number: G01N23/046 ,  G01N2223/419

Abstract: Systems and methods for scanning an object in an inspection space are disclosed. The systems and methods generally incorporate spatially separated and sequenced Compton x-ray backscatter imaging techniques in a plurality of perspective planes. Such processes as time-gating detectors, weighting scintillation detections, and preferentially accepting signals that originate from a point that is substantially orthogonal to a radiation detector and at least partially shielding out signals that do not originate from a point substantially orthogonal to the detector may be used to enhance the data acquisition process.

Abstract translation: 公开了用于在检查空间中扫描对象的系统和方法。 这些系统和方法通常在多个透视平面中包含空间分离和排序的康普顿x射线反向散射成像技术。 诸如时间选通检测器，加权闪烁检测和优先接收源自基本上与辐射检测器正交的点的信号并且至少部分屏蔽不是源于基本上正交于检测器的点的信号的过程可以是 用于增强数据采集过程。

公开(公告)号：US20100310037A1

公开(公告)日：2010-12-09

申请号：US12794160

申请日：2010-06-04

Applicant: Ge WANG ,  Wenxiang Cong

Inventor： Ge WANG ,  Wenxiang Cong

IPC: G01N23/201 ,  A61B6/03

CPC classification number: A61B6/06 ,  A61B6/032 ,  A61B6/4291 ,  A61B6/583

Abstract: The present invention relates to the field of x-ray imaging. More particularly, embodiments of the invention relate to methods, systems, and apparatus for imaging, which can be used in a wide range of applications, including medical imaging, security screening, and industrial non-destructive testing to name a few. Specifically provided as embodiments of the invention are systems for x-ray imaging comprising: a) a first collimator-and-detector assembly having a first operable configuration to provide at least one first dataset comprising primary x-ray signals as a majority component of its data capable of being presented as a first image of an object subjected to x-ray imaging; b) a second collimator-and-detector assembly having a second operable configuration or wherein the first collimator-and-detector assembly is adjustable to a second configuration to provide at least one second dataset comprising primary and dark-field x-ray signals as a majority component of its data capable of being presented as a second image of the object; and c) a computer operably coupled with the collimator-and-detector assemblies comprising a computer readable medium embedded with processing means for combining the first dataset and the second dataset to extract the dark-field x-ray signals and produce a target image having higher contrast quality than the images based on the first or second dataset alone. Such systems can be configured to comprise at least two collimator-and-detector assemblies or configurations differing with respect to collimator height, collimator aperture, imaging geometry, or distance between an object subjected to the imaging and the collimator-and-detector assembly.

Abstract translation: 本发明涉及X射线成像领域。 更具体地，本发明的实施例涉及用于成像的方法，系统和装置，其可以用于广泛的应用，包括医学成像，安全性筛选和工业非破坏性测试等等。 作为本发明的实施例具体提供的是用于x射线成像的系统，包括：a）第一准直仪和检测器组件，其具有第一可操作配置，以提供至少一个第一数据集，所述第一数据集包括主X射线信号作为其主要成分 能够被呈现为经受X射线成像的物体的第一图像的数据; b）具有第二可操作构型的第二准直器和检测器组件，或者其中第一准直器和检测器组件可调整到第二配置以提供包括主场和暗场x射线信号的至少一个第二数据集，作为 其数据的多数分量能够被呈现为对象的第二图像; 以及c）与所述准直仪和检测器组件可操作地耦合的计算机，包括嵌入有处理装置的计算机可读介质，所述处理装置用于组合所述第一数据集和所述第二数据集以提取所述暗场x射线信号并产生具有较高 对比质量比基于第一或第二数据集的图像单独。 这样的系统可以被配置为包括关于准直器高度，准直器孔径，成像几何形状或经受成像的物体与准直器和检测器组件之间的距离不同的至少两个准直器和检测器组件或构造。

公开(公告)号：US07760855B2

公开(公告)日：2010-07-20

申请号：US11906068

申请日：2007-09-28

Applicant: Ernst-Peter Rührnschopf ,  Philipp Bernhardt

Inventor： Ernst-Peter Rührnschopf ,  Philipp Bernhardt

IPC: G01N23/201

CPC classification number: A61B6/505 ,  A61B6/4035 ,  A61B6/4291 ,  A61B6/482 ,  A61B6/50 ,  A61B6/5282

Abstract: For scattered radiation correction in dual X-ray absorptiometry it is proposed to use the additional information supplied by the attenuation images in different energy ranges in a correction image area with homogeneous attenuation coefficients in order to determine the respective scattered radiation fraction. Toward that end, the inverse of the primary radiation function is considered and a search conducted for that scatter-to-primary ratio which leads to consistent mass per unit areas for the attenuation images recorded in different energy ranges.

Abstract translation: 对于双重X射线吸收测量中的散射辐射校正，建议在具有均匀衰减系数的校正图像区域中使用由不同能量范围内的衰减图像提供的附加信息，以确定相应的散射辐射分数。 为此，考虑了初级辐射函数的倒数，并且对于该分散原理比进行了搜索，这导致在不同能量范围内记录的衰减图像的每单位面积的质量一致。

公开(公告)号：US07756249B1

公开(公告)日：2010-07-13

申请号：US12388907

申请日：2009-02-19

Applicant: Geoffrey Harding

Inventor： Geoffrey Harding

IPC: G01N23/201

CPC classification number: H01J35/02

Abstract: A multi-focus x-ray source (MFXS) for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MFXS includes a plurality of focus points (N) defined along a length of the MFXS collinear with the y-axis. The MFXS is configured to generate the plurality of primary beams, and at least M coherent x-ray scatter detectors are configured to detect coherent scatter rays from the primary beams as the primary beams propagate through a section of the object positioned within the examination area when a spacing P between adjacent coherent x-ray scatter detectors satisfies the equation: P = W s · V M · U , where Ws is a lateral extent of the plurality of focus points, U is a distance from the y-axis to a top surface of the examination area, and V is a distance from the top surface to the line at the coordinate X=L.

Abstract translation: 用于多重反向风扇束x射线衍射成像（MIFB XDI）系统的多焦点x射线源（MFXS）。 MFXS包括沿着与y轴共线的MFXS的长度限定的多个聚焦点（N）。 MFXS被配置为产生多个主光束，并且至少M个相干X射线散射检测器被配置为当主光束传播通过位于检查区域内的物体的一部分时检测来自主光束的相干散射光线，当 相邻相干X射线散射探测器之间的间距P满足下式：P = W s·VM·U，其中Ws是多个聚焦点的横向范围，U是从y轴到顶面的距离 并且V是在坐标X = L处从顶面到线的距离。