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公开(公告)号:US20220334756A1
公开(公告)日:2022-10-20
申请号:US17235216
申请日:2021-04-20
Applicant: Micron Technology, Inc.
Inventor: Vamsi Pavan Rayaprolu , Kishore Kumar Muchherla , Ashutosh Malshe , Giuseppina Puzzilli , Saeed Sharifi Tehrani
IPC: G06F3/06
Abstract: Disclosed is a system that comprises a memory device and a processing device, operatively coupled with the memory device, to perform operations that include, receiving a read request to perform a read operation on a block of the memory device; determining whether an entry corresponding to the block is stored in a data structure associated with the memory device; responsive to the entry being stored in the data structure, incrementing a counter associated with the block to track a number of read operations performed on the block of the memory device; resetting a timer associated with the block to an initial value, wherein the timer is to track a period of time that elapses since the read operation was performed on the block of the memory device; determining that the counter and the timer satisfy a first criterion; and responsive to determining that the counter and the timer satisfy the first criterion, removing the entry corresponding to the block from the data structure associated with the memory device.
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公开(公告)号:US20220310190A1
公开(公告)日:2022-09-29
申请号:US17212531
申请日:2021-03-25
Applicant: Micron Technology, Inc.
Inventor: Gary F. Besinga , Renato C. Padilla , Tawalin Opastrakoon , Sampath K. Ratnam , Michael G. Miller , Christopher M. Smitchger , Vamsi Pavan Rayaprolu , Ashutosh Malshe
Abstract: A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including receiving a set of read offsets for a block of the memory device, the set of read offsets comprising a default read offset, selecting the default read offset from the set of read offsets based on one or more criteria, applying the default read offset to a read operation performed with respect to the block, determining that a second set of criteria associated with removing the default read offset is satisfied, and removing the default read offset responsive to determining that the second set of criteria is satisfied.
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公开(公告)号:US11437111B2
公开(公告)日:2022-09-06
申请号:US17122758
申请日:2020-12-15
Applicant: Micron Technology, Inc.
Inventor: Jeffrey S. McNeil, Jr. , Karl D. Schuh , Vamsi Pavan Rayaprolu , Giuseppina Puzzilli , Kishore K. Muchherla , Gil Golov , Todd A. Marquart , Jiangang Wu , Niccolo' Righetti , Ashutosh Malshe
Abstract: Instructions can be executed to adjust a trim at first intervals until a quantity of program/erase cycles (PEC) have occurred. The trim defines a valley width between data states. Instructions can be executed to adjust the trim at second intervals, greater than the first intervals, after the quantity of PEC have occurred.
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74.
公开(公告)号:US11379122B2
公开(公告)日:2022-07-05
申请号:US17178976
申请日:2021-02-18
Applicant: Micron Technology, Inc.
Inventor: Ashutosh Malshe , Kishore Kumar Muchherla , Vamsi Pavan Rayaprolu , Harish R. Singidi
Abstract: A set of memory cells in a data block of a memory component is sampled. A distribution statistic is generated for the data block based on a reliability statistic for each of the set of sampled memory cells. A determination is made based on the distribution statistic of whether the read disturb stress is uniformly or non-uniformly distributed across the data block. In response to a determination that the read disturb stress is non-uniformly distributed across the data block, a first subset of the data block is relocated to another data block of the memory component. The first subset of the data block is associated with a higher concentration of read disturb stress than other subsets of the data block.
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公开(公告)号:US20220199189A1
公开(公告)日:2022-06-23
申请号:US17393886
申请日:2021-08-04
Applicant: Micron Technology, Inc.
Inventor: Sri Rama Namala , Jung Sheng Hoei , Jianmin Huang , Ashutosh Malshe , Xiangang Luo
Abstract: Disclosed in some examples are methods, systems, devices, memory devices, and machine-readable mediums for using a non-defective portion of a block of memory on which there is a defect on a different portion. Rather than disable the entire block, the system may disable only a portion of the block (e.g., a first deck of the block) and salvage a different portion of the block (e.g., a second deck of the block).
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76.
公开(公告)号:US20220188226A1
公开(公告)日:2022-06-16
申请号:US17123244
申请日:2020-12-16
Applicant: Micron Technology, Inc.
Inventor: Gary F. Besinga , Renato C. Padilla , Tawalin Opastrakoon , Sampath K. Ratnam , Michael G. Miller , Christopher M. Smitchger , Vamsi Pavan Rayaprolu , Ashutosh Malshe
Abstract: An amount of threshold voltage distribution shift is determined. The threshold voltage distribution shift corresponds to an amount of time after programming of a reference page of a block of a memory device. A program-verify voltage is adjusted based on the amount of threshold voltage distribution shift to obtain an adjusted program-verify voltage. Using the adjusted program-verify voltage, a temporally subsequent page of the block is programmed at a time corresponding to the amount of time after the programming of the reference page.
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公开(公告)号:US11354052B2
公开(公告)日:2022-06-07
申请号:US17002070
申请日:2020-08-25
Applicant: Micron Technology, Inc.
Inventor: Xiangang Luo , Jianmin Huang , Ashutosh Malshe
IPC: G06F3/06
Abstract: An apparatus can include a media management threshold component. The media management threshold component can determine a first threshold quantity of blocks for a first memory mode in the memory device. The media management threshold component can determine a second threshold quantity of blocks for a second memory mode in the memory device. The media management threshold component can determine a logical saturation of the memory device. The media management threshold component can cause performance of a media management operation based on the determined first threshold quantity, the determined second threshold quantity, and a percentage of the determined logical saturation to a total logical saturation of the memory device.
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公开(公告)号:US11301146B2
公开(公告)日:2022-04-12
申请号:US16889712
申请日:2020-06-01
Applicant: Micron Technology, Inc.
Inventor: Vamsi Pavan Rayaprolu , Sampath K. Ratnam , Kishore Kumar Muchherla , Harish R. Singidi , Ashutosh Malshe , Gianni S. Alsasua
IPC: G06F3/06
Abstract: A memory block of a non-volatile memory device is identified. The memory block has a first region and a second region, where a storage density of the first region is larger than the second region. Data is programmed at the first region of the memory block. An attribute of the memory block based on a sensor is received during programming of the data at the memory block. The attribute characterizes the data being programmed at the first region. The attribute is stored at a volatile during programming of the data at the memory block. The attribute is stored on a memory page of the second region responsive to the programming of the data at the first region being complete.
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公开(公告)号:US20220068406A1
公开(公告)日:2022-03-03
申请号:US17001769
申请日:2020-08-25
Applicant: Micron Technology, Inc.
Inventor: Vamsi Pavan Rayaprolu , Karl D. Schuh , Jeffrey S. McNeil Jr. , Kishore K. Muchherla , Ashutosh Malshe , Jiangang Wu
Abstract: A system includes a memory device including a plurality of groups of memory cells and a processing device that is operatively coupled to the memory device. The processing device is to receive a request to determine a reliability of the plurality of groups of memory cells. The processing device is further to perform, in response to receipt of the request, a scan operation on a sample portion of the plurality of groups of memory cells to determine a reliability of the sample portion that is representative of the reliability of the plurality of groups of memory cells.
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公开(公告)号:US11250918B2
公开(公告)日:2022-02-15
申请号:US17035149
申请日:2020-09-28
Applicant: Micron Technology, Inc.
Inventor: Ashutosh Malshe , Harish Reddy Singidi , Kishore Kumar Muchherla , Michael G. Miller , Sampath Ratnam , Xu Zhang , Jie Zhou
Abstract: Devices and techniques for initiating and controlling preemptive idle time read scans in a flash based storage system are disclosed. In an example, a memory device includes a NAND memory array and a memory controller to schedule and initiate read scans among multiple locations of the memory array, with such read scans being preemptively triggered during an idle (background) state of the memory device, thus reducing host latency during read and write operations in an active (foreground) state of the memory device. In an example, the optimization technique includes scheduling a read scan operation, monitoring an active or idle state of host IO operations, and preemptively initiating the read scan operation when entering an idle state, before the read scan operation is scheduled to occur. In further examples, the read scan may preemptively occur based on time-based scheduling, frequency-based conditions, or event-driven conditions triggering the read scan.
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