公开(公告)号：US20240187737A1

公开(公告)日：2024-06-06

申请号：US18439822

申请日：2024-02-13

Applicant: VIAVI Solutions Inc.

Inventor： Steven SAXE ,  William D. HOUCK

IPC: H04N23/698 ,  G01N21/31 ,  G02B5/20 ,  G03B11/00 ,  G06T7/00 ,  G06T7/30 ,  H04N5/265 ,  H04N23/55

CPC classification number: H04N23/698 ,  G01N21/314 ,  G02B5/201 ,  G02B5/208 ,  G03B11/00 ,  G06T7/30 ,  G06T7/97 ,  H04N5/265 ,  H04N23/55 ,  G01N2021/3155 ,  G01N2201/063 ,  G06T2207/10036 ,  G06T2207/10048 ,  G06T2207/20212

Abstract: An image capture device may include a first spectral filter and a second spectral filter arranged so that a panoramic image capture operation captures light filtered by the first spectral filter and light filtered by the second spectral filter in a same region of a combined image and one or more processors to: capture a plurality of images based on the panoramic image capture operation; extract first information and second information from the plurality of images, wherein the first information is associated with the first spectral filter and the second information is associated with the second spectral filter; identify an association between the first information and the second information based on a feature captured in the plurality of images via the first spectral filter and the second spectral filter; and store or provide information based on the association between the first information and the second information.

公开(公告)号：US20240142378A1

公开(公告)日：2024-05-02

申请号：US18320964

申请日：2023-05-19

Applicant: Quantum-Si Incorporated

Inventor： Ali Kabiri ,  Bing Shen ,  James Beach ,  Kyle Preston ,  Gerard Schmid

IPC: G01N21/64 ,  H01L27/146

CPC classification number: G01N21/6428 ,  G01N21/6402 ,  G01N21/6408 ,  H01L27/14625 ,  H01L27/14685 ,  G01N2021/6439 ,  G01N2201/06113 ,  G01N2201/063

Abstract: Apparatus and methods relating to photonic bandgap optical nanostructures are described. Such optical nanostructures may exhibit prohibited photonic bandgaps or allowed photonic bands, and may be used to reject (e.g., block or attenuate) radiation at a first wavelength while allowing transmission of radiation at a second wavelength. Examples of photonic bandgap optical nanostructures includes periodic and quasi-periodic structures, with periodicity or quasi-periodicity in one, two, or three dimensions and structural variations in at least two dimensions. Such photonic bandgap optical nanostructures may be formed in integrated devices that include photodiodes and CMOS circuitry arranged to analyze radiation received by the photodiodes.

公开(公告)号：US11925456B2

公开(公告)日：2024-03-12

申请号：US17061539

申请日：2020-10-01

Applicant: HyperSpectral Corp.

Inventor： David M. Palacios ,  Harry Hopper

IPC: A61B5/08 ,  A61B5/00 ,  A61B5/097 ,  A61B10/00 ,  G01J3/18 ,  G01J3/45 ,  G01N1/42 ,  G01N21/25 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/497

CPC classification number: A61B5/082 ,  A61B5/7282 ,  A61B10/00 ,  G01J3/18 ,  G01J3/45 ,  G01N1/42 ,  G01N21/255 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/497 ,  A61B5/097 ,  A61B2010/0087 ,  G01N2033/4975 ,  G01N2201/063

Abstract: A method comprising at least one light source configured to generate a light of at least one wavelength and project the light over an optical path, a sample device, the device containing a sample obtained from exhalation of a person, a vortex mask configured to receive the light after the light passes through at least a portion of the sample device, the vortex mask including a series of concentric circles etched in a substrate, the vortex mask configured to provide destructive interference of coherent light received from the at least one light source, a detector configured to detect and measure wavelength intensities from the light in the optical path, the wavelength intensities being impacted by the light passing through the sample, the detector receiving the light that remained after passing through the vortex mask, and a processor configured to provide measurement results based on the wavelength intensities.

公开(公告)号：US20240027366A1

公开(公告)日：2024-01-25

申请号：US17621237

申请日：2021-11-25

Applicant: Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd.

Inventor： Yali LIU ,  Yongzhen JIA

IPC: G01N21/95 ,  G01N21/88

CPC classification number: G01N21/9515 ,  G01N21/8851 ,  G01N2201/063 ,  G01N2021/8887 ,  G01N2021/9513

Abstract: The present application provides a detection method of a crease degree of a screen and a visual detection device, the detection method includes: providing detection rays and obliquely irradiating the detection rays onto a surface to be measured of a folding screen; acquiring detection rays reflected by the surface to be measured of the folding screen to obtain a corresponding light source reflection image; analyzing the light source reflection image to obtain an evaluation index of an crease degree of the folding screen; and evaluating the crease degree of the folding screen.

公开(公告)号：US11861966B2

公开(公告)日：2024-01-02

申请号：US17446790

申请日：2021-09-02

Applicant: WAVEFRONT TECHNOLOGY, INC.

Inventor： Christopher Chapman Rich ,  Joel Mikael Petersen ,  Roger Winston Phillips ,  John Michael Tamkin

IPC: G07D7/128 ,  G01N21/47 ,  G02B3/00 ,  G02B5/02 ,  B42D25/351 ,  B42D25/373 ,  B42D25/378 ,  B42D25/355 ,  B42D25/45 ,  B42D25/29 ,  G01N21/55 ,  B42D25/425 ,  B42D25/445 ,  B42D25/00 ,  B42D25/342 ,  B42D25/324 ,  B42D25/30 ,  B42D25/21 ,  B42D25/435 ,  B42D25/328 ,  B42D25/24 ,  B42D25/23 ,  B42D25/28

CPC classification number: G07D7/128 ,  B42D25/00 ,  B42D25/21 ,  B42D25/29 ,  B42D25/30 ,  B42D25/324 ,  B42D25/342 ,  B42D25/351 ,  B42D25/355 ,  B42D25/373 ,  B42D25/378 ,  B42D25/425 ,  B42D25/435 ,  B42D25/445 ,  B42D25/45 ,  G01N21/4738 ,  G01N21/55 ,  G02B3/005 ,  G02B3/0056 ,  G02B5/0278 ,  G02B5/0284 ,  B42D25/23 ,  B42D25/24 ,  B42D25/28 ,  B42D25/328 ,  G01N2201/063

Abstract: An optical device includes an array of lenses and a plurality of first and second segments disposed under the array of lenses. At a first viewing angle, the array of lenses presents a first image for viewing without presenting the second image for viewing, and at a second viewing angle different from the first viewing angle, the array of lenses presents for viewing the second image without presenting the first image for viewing. In some examples, individual ones of the first and second segments can comprise specular reflecting, transparent, diffusely reflecting, and/or diffusely transmissive features. In some examples, individual ones of the first and second segments can comprise transparent and non-transparent regions. Some examples can incorporate more than one region producing an optical effect.

公开(公告)号：US11796783B2

公开(公告)日：2023-10-24

申请号：US17506040

申请日：2021-10-20

Applicant: Applied Materials Israel Ltd.

Inventor： Elad Eizner ,  Amir Shoham

IPC: G02B21/06 ,  G02B5/30 ,  G01N21/47 ,  G01N21/95

CPC classification number: G02B21/06 ,  G01N21/47 ,  G01N21/9501 ,  G02B5/3025 ,  G01N2201/063

Abstract: An optical inspection system that may include an illumination optics configured to generate an illumination light beam and to illuminate a sample with the illumination light beam; at least one collection optics configured to collect light from the sample; at least one detector configured to detect at least one detected light beam outputted from the at least one collection optics; multiple polarizers that are configured to (a) set a polarization of the illumination light beam by selectively introducing, under a control of the control unit, at least one illumination optics polarization change, and (b) set a polarization of the at least one detected light beam by selectively introducing, under a control of the control unit, at least one collection optics polarization change. The multiple polarizers may include one or more illumination half-wave plates, one or more quarter-wave plates, and one or more inhomogeneous polarizers.

公开(公告)号：US11692947B2

公开(公告)日：2023-07-04

申请号：US17378049

申请日：2021-07-16

Applicant: Fasford Technology Co., Ltd.

Inventor： Yuta Ono ,  Hideharu Kobashi ,  Koji Hosaka ,  Masaaki Yoshiyama

IPC: G01N21/95 ,  G01N21/88 ,  G06T7/00

CPC classification number: G01N21/9505 ,  G01N21/8806 ,  G06T7/0002 ,  G01N2021/8825 ,  G01N2201/063

Abstract: A die bonding apparatus includes a first illumination device for irradiating a die with light along an optical axis of a photographing device, and a second illumination device that is located above the first illumination device and irradiates the die with light having a predefined angle with respect to the optical axis. The second illumination device includes a second light emitting section, and a light path control member that limits a light path of second irradiation light emitted from the second light emitting section. The second illumination device is disposed in such a way that the second irradiation light, the light path of which is limited by the light path control member, passes through the cylinder of the first illumination device, and the top surface of the die is irradiated with the second irradiation light.

公开(公告)号：US11644420B2

公开(公告)日：2023-05-09

申请号：US17077273

申请日：2020-10-22

Applicant: Ford Global Technologies, LLC

Inventor： Avrokin Surnilla ,  David Michael Herman ,  John Craig Elson ,  Scott Andrew Amman ,  Nikhitha Bekkanti ,  Michael Monforton

IPC: G01N21/55 ,  B60R11/04 ,  B60R16/037 ,  B60R11/00 ,  G06N20/00

CPC classification number: G01N21/55 ,  B60R11/04 ,  B60R16/037 ,  G06N20/00 ,  B60R2011/0003 ,  G01N2201/063

Abstract: A system, comprising a processor and a memory. The memory stores instructions executable by the processor to determine, from an image including a portion of a surface of a human body, a reflected light intensity from the body surface portion, determine, a skin reflectance of the body surface portion based on a location of the body surface, a light source, and an image sensor location, and to determine, for the body surface portion, an incoming radiance, based on the skin reflectance and the reflected light intensity.

公开(公告)号：US20190212536A1

公开(公告)日：2019-07-11

申请号：US16325733

申请日：2017-08-16

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Florian Fahrbach

IPC: G02B21/00 ,  G01N21/64

CPC classification number: G02B21/0032 ,  G01N21/6458 ,  G01N2021/6463 ,  G01N2201/063 ,  G02B21/0076 ,  G02B21/367

Abstract: A light sheet microscope includes an illuminator having a beam source which is designed to direct an illumination beam propagating along an illumination axis onto a sample. A light-sheet generator is designed to generate a light-sheet-like illumination light distribution illuminating the sample in a partial area from the illumination beam. A detection unit has a detector which is designed to capture detection light originating from the partial area of the sample illuminated with the illumination light distribution. The illuminator comprises a beam modulator adapted to illuminate the illumination beam along the illumination axis in such a way that light exposure of the partial area of the sample illuminated by the illumination light distribution varies along the illumination axis.

公开(公告)号：US10054551B2

公开(公告)日：2018-08-21

申请号：US15134278

申请日：2016-04-20

Applicant: APPLIED MATERIALS ISRAEL LTD.

Inventor： Boris Golberg ,  Ron Naftali

IPC: G01N21/88

CPC classification number: G01N21/8851 ,  G01N2201/063 ,  G01N2201/105

Abstract: An inspection system that may include an illumination module that may be configured to scan a sample during multiple scan iterations; wherein during each scan iteration the illumination module scans each beam of a plurality of spaced apart beams along a scan line; a mechanical stage that may be configured to move the sample during the multiple scan iterations; a detection module; and a processor; wherein when the inspection system operates in an interlaced mode, the mechanical stage may be configured to move at a first speed thereby preventing a substantial overlap between scan lines obtained during the multiple scan iterations; wherein when the inspection system operates in a non-interlaced mode: the mechanical stage may be configured to move at a second speed that differs from the first speed thereby introducing an overlap between scan lines of different beams that may be obtained during different scan iterations; the detection module may be configured to generate detection signals in response to a detection of radiation emitted from the sample as a result of each scan line; and wherein the processor may be configured to independently process detection signals relating to different scan lines.