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    CHEMICAL CHARACTERIZATION OF SURFACE FEATURES
    71.
    发明申请
    CHEMICAL CHARACTERIZATION OF SURFACE FEATURES 有权
    表面特征的化学特征

    公开(公告)号：US20160178513A1

    公开(公告)日：2016-06-23

    申请号：US15053946

    申请日：2016-02-25

    Applicant: Seagate Technology LLC

    Inventor： Joachim Walter Ahner ,  Samuel Kah Hean Wong ,  Maissarath Nassirou ,  Henry Luis Lott ,  David M. Tung ,  Florin Zavaliche ,  Stephen Keith McLaurin

    IPC: G01N21/47

    CPC classification number: G01N21/4738 ,  G01N21/95 ,  G01N2021/4764 ,  G01N2021/4792 ,  G01N2201/0635 ,  G01N2201/0683

    Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.

    Abstract translation: 本文提供的装置包括光学表征装置; 光子检测器阵列，其被配置为顺序地接收从制品的表面特征散射并随后由所述光学表征装置处理的物品的表面特征散射的第一组光子和第二组光子; 以及用于化学表征所述制品的表面特征的化学表征装置，其中所述化学表征装置被配置用于处理由所述光子检测器阵列接收的第一组光子和由所述光子检测器阵列接收的所述第二组光子。

    Method using laser ellipsometry for determining the quality of liquid product containing polyphenols
    73.
    发明授权
    Method using laser ellipsometry for determining the quality of liquid product containing polyphenols 有权
    使用激光椭圆偏光法测定含有多酚的液体产品的质量的方法

    公开(公告)号：US09354162B2

    公开(公告)日：2016-05-31

    申请号：US14141602

    申请日：2013-12-27

    Applicant: Paul Anthony Martino, Sr.

    Inventor： Paul Anthony Martino, Sr.

    IPC: G01J4/00 ,  G01N21/00 ,  G01N21/21 ,  G01N21/01

    CPC classification number: G01N21/211 ,  G01B11/0641 ,  G01N21/01 ,  G01N21/4133 ,  G01N2021/0106 ,  G01N2021/213 ,  G01N2201/06113 ,  G01N2201/0683

    Abstract: The objective is to develop a method for determining the quality of a liquid product containing polyphenols. The present invention is a method that is a significant improvement over existing methods that use conventional laboratory instrumentation to study the quality of liquid products. The method uses an adsorption cell with a small mirror as a reflecting surface and acts as a substrate for the adsorption of the liquid's polyphenols on its surface. The polyphenol's film thickness is measured by laser ellipsometry. Light from a monochromatic light source is reflected from the thin film of polyphenol, which changes the light's optical properties and are sensed using the principles of ellipsometry. The changes in state of polarized light are translated into graphical illustrations of measured and computed parameters that can be recognized and interpreted as distinctive properties of liquid product quality.

    Abstract translation: 目的是开发一种用于测定含有多酚的液体产品的质量的方法。 本发明是一种比使用常规实验室仪器研究液体产品质量的现有方法的显着改进方法。 该方法使用具有小反射镜的吸附单元作为反射面，作为表面吸附液体多酚的基板。 通过激光椭圆测量法测量多酚的膜厚度。 来自单色光源的光从多酚的薄膜反射，其改变光的光学性质并且使用椭偏仪的原理来感测。 偏振光状态的变化被转换为可以被识别和解释为液体产品质量的独特性质的测量和计算参数的图示。

    ACTIVE REAL-TIME CHARACTERIZATION SYSTEM
    74.
    发明申请
    ACTIVE REAL-TIME CHARACTERIZATION SYSTEM 有权
    主动实时特征系统

    公开(公告)号：US20160119557A1

    公开(公告)日：2016-04-28

    申请号：US14526246

    申请日：2014-10-28

    Applicant: The Boeing Company

    Inventor： Jeffrey H. Hunt ,  John H. Belk

    IPC: H04N5/33 ,  B64F5/00 ,  G01N21/95 ,  H04N5/225 ,  G01N21/88

    CPC classification number: H04N5/332 ,  B64F5/60 ,  G01N21/8806 ,  G01N21/95 ,  G01N2021/8472 ,  G01N2021/8845 ,  G01N2201/0683 ,  H04N5/2256

    Abstract: A system for providing active real-time characterization of an article under test is disclosed. An infrared light source, a first visible light source and a second visible light source each outputs and directs a beam of coherent light at a particular area on the article under test. A visible light camera and a visible light second harmonic generation camera, an infrared camera and an infrared second harmonic generation camera, a sum frequency camera and a third order camera are each configured to receive a respective predetermined return beam of light from the particular area on the article under test. A processor receives signals from the cameras and calculates in real time respective spectroscopic signals and compares each calculated signal with each other calculated signal and with a predetermined baseline signal to ensure that the article under test conforms to an expected value.

    Abstract translation: 公开了一种用于提供被测物品的主动实时表征的系统。 红外光源，第一可见光源和第二可见光源各自输出并引导被测物品上特定区域上的相干光束。 可见光摄像机和可见光二次谐波发生摄像机，红外摄像机和红外二次谐波发生摄像机，和频摄像机和三阶摄像机都被配置为从特定区域接收相应的预定的返回光束 被测文章。 处理器从摄像机接收信号并实时计算各自的光谱信号，并将每个计算的信号与每个其它计算的信号和预定的基线信号进行比较，以确保待测物品符合预期值。

    METHOD FOR DETECTING RESISTANCE OF A PHOTO RESIST LAYER
    76.
    发明申请
    METHOD FOR DETECTING RESISTANCE OF A PHOTO RESIST LAYER 有权
    检测耐光层电阻的方法

    公开(公告)号：US20160061722A1

    公开(公告)日：2016-03-03

    申请号：US14434187

    申请日：2014-08-15

    Applicant: BOE TECHNOLOGY GROUP CO., LTD.

    Inventor： Hui Tian

    IPC: G01N21/41 ,  H01L21/027 ,  H01L21/3115 ,  H01L21/3105 ,  G01N21/21 ,  H01L21/66

    CPC classification number: G01N21/41 ,  G01N21/211 ,  G01N2201/0683 ,  H01L21/0273 ,  H01L21/31058 ,  H01L21/31155 ,  H01L22/12

    Abstract: The present disclosure provides a method for detecting resistance of a photo resist layer. The method includes: providing a silicon wafer and measuring a refractive index of a surface of the silicon wafer as an initial refractive index of the surface of the silicon wafer; forming photo resist layers with different thicknesses on the surface of the silicon wafer; performing ion-implantation on the photo resist layers by predetermined amounts; peeling off the photo resist layers from the surface of the silicon wafer; and testing the refractive indexes of different areas on the surface of the silicon wafer after the ion-implantation, on which the photo resist layers with different thicknesses are located and determining the resistance of the photo resist layers with different thicknesses in contrast to the initial refractive index before the ion-implantation.

    Abstract translation: 本公开提供了一种用于检测抗蚀剂层的电阻的方法。 该方法包括：提供硅晶片并测量硅晶片的表面的折射率作为硅晶片表面的初始折射率; 在所述硅晶片的表面上形成具有不同厚度的光致抗蚀剂层; 在光致抗蚀剂层上进行预定量的离子注入; 从硅晶片的表面剥离光致抗蚀剂层; 并且在离子注入之后测试在硅晶片的表面上的不同区域的折射率，其上具有不同厚度的光致抗蚀剂层位于其上，并且确定与初始折射率相反的不同厚度的光致抗蚀剂层的电阻 离子注入前的指数。

    DETECTING APPARATUS
    77.
    发明申请
    DETECTING APPARATUS 审中-公开
    检测装置

    公开(公告)号：US20160033408A1

    公开(公告)日：2016-02-04

    申请号：US14425465

    申请日：2014-08-08

    Applicant: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.

    Inventor： Kenji NARUMI

    IPC: G01N21/64

    CPC classification number: G01N21/648 ,  G01N2201/06113 ,  G01N2201/0683

    Abstract: The present application discloses a detecting apparatus including: a light source for emitting excitation light; a storage portion in which a specimen is stored; a metal film which receives the excitation light to cause evanescent light for illuminating the specimen; a modulator for adjusting an incident angle of the excitation light on the metal film; a driver for generating a driving signal for driving the modulator; a detector for outputting a fluorescence signal in correspondence to intensity of fluorescence generated from the specimen under irradiation of the evanescent light; and an extractor which extracts a signal component from the fluorescence signal, the signal component deriving from the specimen. The incident angle changes in response to a change of the driving signal. The extractor extracts a synchronous signal component as the signal component, the synchronous signal component changing in synchronization with the change of the driving signal.

    Abstract translation: 本申请公开了一种检测装置，包括：用于发射激发光的光源; 存储部，其中存储有试样; 接收激发光以引起ev逝光照射样品的金属膜; 用于调节所述金属膜上的激发光的入射角的调制器; 用于产生用于驱动调制器的驱动信号的驱动器; 检测器，用于输出与所述ev逝光照射下从样本产生的荧光强度对应的荧光信号; 以及从所述荧光信号中提取信号成分的提取器，所述信号成分来自所述样本。 入射角随着驾驶信号的变化而变化。 提取器提取同步信号分量作为信号分量，同步信号分量与驱动信号的变化同步地改变。

    SIMPLE SUGAR CONCENTRATION SENSOR AND METHOD
    78.
    发明申请
    SIMPLE SUGAR CONCENTRATION SENSOR AND METHOD 审中-公开
    简单的葡萄糖浓度传感器和方法

    公开(公告)号：US20150342507A1

    公开(公告)日：2015-12-03

    申请号：US14822524

    申请日：2015-08-10

    Applicant: K Sciences GP, LLC

    Inventor： Valentin Korman

    IPC: A61B5/145 ,  A61B5/1455 ,  A61B5/00 ,  G01N21/21

    CPC classification number: A61B5/14532 ,  A61B5/1455 ,  A61B5/14558 ,  A61B5/6815 ,  A61B5/7225 ,  A61B2560/0443 ,  A61B2562/0238 ,  G01N21/21 ,  G01N2201/062 ,  G01N2201/0683

    Abstract: A glucose sensor comprising an optical energy source having an emitter with an emission pattern; a first polarizer intersecting the emission pattern; a second polarizer spaced a distance from the first polarizer and intersecting the emission pattern, the second polarizer rotated relative to the first polarizer by a first rotational amount Θ; a first optical detector intersecting the emission pattern; a second optical detector positioned proximal to the second polarizer, the first polarizer and the second polarizer being positioned between the optical energy source and the second optical detector, the second optical detector intersecting the emission pattern; a compensating circuit coupled to the second optical detector; and a subtractor circuit coupled to the compensating circuit and the first optical detector.

    Abstract translation: 一种葡萄糖传感器，包括具有发射器的光能源，其具有发射图案; 与发射图案相交的第一偏振片; 与第一偏振器间隔开一定距离并与发射图案相交的第二偏振器，第二偏振器相对于第一偏振器相对于第一偏转器旋转第一旋转量Θ; 与发射图案相交的第一光学检测器; 位于第二偏振器附近的第二光学检测器，第一偏振器和第二偏振器位于光能源和第二光学检测器之间，第二光学检测器与发射图案相交; 耦合到所述第二光学检测器的补偿电路; 以及耦合到所述补偿电路和所述第一光学检测器的减法器电路。

    APPARATUS AND METHOD FOR SIMULTANEOUSLY MEASURING CHARACTERISTICS OF MOLECULAR JUNCTIONS AND REFRACTIVE INDEX OF BUFFER SOLUTION
    80.
    发明申请
    APPARATUS AND METHOD FOR SIMULTANEOUSLY MEASURING CHARACTERISTICS OF MOLECULAR JUNCTIONS AND REFRACTIVE INDEX OF BUFFER SOLUTION 审中-公开
    用于同时测量分子结构特征和缓冲溶液折射指数的装置和方法

    公开(公告)号：US20150253243A1

    公开(公告)日：2015-09-10

    申请号：US14432066

    申请日：2013-09-27

    Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

    Inventor： Hyun Mo Cho ,  Yong Jai Cho ,  Won Chegal

    IPC: G01N21/21 ,  G01N21/41

    CPC classification number: G01N21/211 ,  G01N21/05 ,  G01N21/253 ,  G01N21/41 ,  G01N2201/06113 ,  G01N2201/0683

    Abstract: An apparatus and method for simultaneously measuring, in an immersion microchannel environment, the characteristics of molecular junctions such as a low-molecular-weight biomaterial and the like and the refractive index of a buffer solution by using ellipsometry. Specifically, disclosed is an apparatus for simultaneously measuring, with high sensitivity, the change in refractive index of a buffer solution and the junction dynamic characteristics of a biomaterial by allowing polarized incident light to be received at a biomaterial adsorption layer, which is formed on a substrate such as a semiconductor and the like, so as to meet an anti-reflection condition of a P-wave by using a prism structure and a microchannel; and a measurement method using the same.

    Abstract translation: 在浸入微通道环境中同时测量低分子量生物材料等分子结的特性以及使用椭偏仪测定缓冲溶液的折射率的装置和方法。 具体地说，公开了一种用于以高灵敏度同时测量缓冲溶液的折射率的变化和生物材料的结合动力学特性的装置，该方法是允许偏振的入射光被接收在生物材料吸附层上 基板如半导体等，以便通过使用棱镜结构和微通道来满足P波的抗反射条件; 以及使用其的测定方法。

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