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公开(公告)号:US2896185A
公开(公告)日:1959-07-21
申请号:US53152355
申请日:1955-08-30
Applicant: DAYSTROM INC
Inventor: ELIAS BLANCO
IPC: H01C1/12
CPC classification number: H01C1/12
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公开(公告)号:US2886751A
公开(公告)日:1959-05-12
申请号:US61456956
申请日:1956-10-08
Applicant: DAYSTROM INC
Inventor: GILBERT ROSWELL W
IPC: G06G7/22
CPC classification number: G06G7/22
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公开(公告)号:US2884525A
公开(公告)日:1959-04-28
申请号:US56953356
申请日:1956-03-05
Applicant: DAYSTROM INC
Inventor: SIPPACH JR FREDERICH W , KURT STRAHLBERG
IPC: H03K4/12
CPC classification number: H03K4/12
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公开(公告)号:US2879690A
公开(公告)日:1959-03-31
申请号:US49687055
申请日:1955-03-25
Applicant: DAYSTROM INC
Inventor: FREDERICK DUNN JOHN
IPC: G01J1/42
CPC classification number: G01J1/4214
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85.Method and apparatus for testing electronic circuits and components 失效
Title translation: 用于测试电子电路和组件的方法和装置公开(公告)号:US2859343A
公开(公告)日:1958-11-04
申请号:US45701454
申请日:1954-09-20
Applicant: DAYSTROM INC
Inventor: LANGFORD ROBERT C , SIPPACH JR FREDERICH W
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公开(公告)号:US2857562A
公开(公告)日:1958-10-21
申请号:US59192356
申请日:1956-06-18
Applicant: DAYSTROM INC
Inventor: ERNST UMRATH
IPC: H02P7/00
CPC classification number: H02P7/00
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公开(公告)号:US2855567A
公开(公告)日:1958-10-07
申请号:US42362754
申请日:1954-04-16
Applicant: DAYSTROM INC
Inventor: LAMB ANTHONY H , CLARK ARTHUR D
IPC: G01R11/02
CPC classification number: G01R11/02
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公开(公告)号:US2854794A
公开(公告)日:1958-10-07
申请号:US53591755
申请日:1955-09-22
Applicant: DAYSTROM INC
Inventor: LUEDEMAN ROBERT T
IPC: G04D3/00
CPC classification number: G04D3/0058
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公开(公告)号:US2846658A
公开(公告)日:1958-08-05
申请号:US51354355
申请日:1955-06-06
Applicant: DAYSTROM INC
Inventor: BENDER FREDERICK M
IPC: G01R1/067
CPC classification number: G01R1/06788
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公开(公告)号:US2834361A
公开(公告)日:1958-05-13
申请号:US49352355
申请日:1955-03-10
Applicant: DAYSTROM INC
Inventor: ERBGUTH PAUL F K
IPC: G05B11/50
CPC classification number: G05B11/50 , Y10T137/2278 , Y10T137/2322 , Y10T137/2365
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