-
公开(公告)号:US2902648A
公开(公告)日:1959-09-01
申请号:US46292854
申请日:1954-10-18
Applicant: DAYSTROM INC
Inventor: LANGFORD ROBERT C , STUART DAVIS ERWIN
IPC: G01R23/00
CPC classification number: G01R23/00
-
公开(公告)号:US3077560A
公开(公告)日:1963-02-12
申请号:US77312658
申请日:1958-10-02
Applicant: DAYSTROM INC
Inventor: LANGFORD ROBERT C , SIPPACH JR FREDERICK W
-
公开(公告)号:US2962685A
公开(公告)日:1960-11-29
申请号:US78760259
申请日:1959-01-19
Applicant: DAYSTROM INC
Inventor: LANGFORD ROBERT C
-
公开(公告)号:US2953148A
公开(公告)日:1960-09-20
申请号:US49282355
申请日:1955-03-08
Applicant: DAYSTROM INC
Inventor: LANGFORD ROBERT C , PELT STANLEY M VAN
IPC: F15C3/14
CPC classification number: F15C3/14 , Y10T137/2322 , Y10T137/2365 , Y10T137/2409
-
5.Method and apparatus for testing electronic circuits and components 失效
Title translation: 用于测试电子电路和组件的方法和装置公开(公告)号:US2859343A
公开(公告)日:1958-11-04
申请号:US45701454
申请日:1954-09-20
Applicant: DAYSTROM INC
Inventor: LANGFORD ROBERT C , SIPPACH JR FREDERICH W
-
-
-
-