Abstract:
A direct digital frequency synthesizer having a multi-modulus divider, a numerically controlled oscillator and a programmable delay generator. The multi-modulus divider receives an input clock having an input pulse frequency fosc and outputs some integer fraction of those pulses at an instantaneous frequency fVp that is some integer fraction (1/P) of the input frequency. The multi-modulus divider selects between at least two ratios of P(1/P or 1/P+1) in response to a signal from the numerically controlled oscillator. The numerically controlled oscillator receives a value which is the accumulator increment (i.e. the number of divided pulse edges) required before an overflow occurs that causes the multi-modulus divider to change divider ratios in response to receiving an overflow signal. The numerically controlled oscillator also outputs both the overflow signal and a delay signal to the delay generator that further controls the frequency of the multi-modulus divider output signal (Vp) to provide an output signal (VD) with an fOUT that has improved phase and timing jitter performance over prior art direct digital frequency synthesizer architectures.
Abstract:
An N×M crosspoint switch allows a signal from any one of the N inputs to be routed to one or more of the M crosspoint switch outputs. The switches within the crosspoint switch can be configured as voltage mode or current mode switches. In voltage mode switching an input to the crosspoint switch is provided to an input device, such as an amplifier, having a low output impedance. The output of the low impedance device is provided to a switch that connects the output of the low impedance device to a high input impedance device, such as a band translation device. In current mode switching, the low impedance output of the input device is connected to selectively activated high isolation transconductance devices having high input impedances. The outputs of the transconductance devices are connected to low impedance devices that operate as summing nodes.
Abstract:
Methods and circuits to measure the speed of silicon test structures using direct current test equipment. Each test structure comprises an oscillator and a detector. Oscillations started by a direct current input signal are rectified by the detector into a direct current output signal. Start of oscillations cause a jump in the output signal and that point is correlated with the input signal strength which in turn is correlated to the speed of the test circuits. By knowing the speed of the test circuits the quality of the manufacturing process can be checked. Direct current greatly simplifies measurement so that 100% testing can be performed.
Abstract:
An N×M crosspoint switch allows a signal from any one of the N inputs to be routed to one or more of the M crosspoint switch outputs. The switches within the crosspoint switch can be configured as voltage mode or current mode switches. In voltage mode switching an input to the crosspoint switch is provided to an input device, such as an amplifier, having a low output impedance. The output of the low impedance device is provided to a switch that connects the output of the low impedance device to a high input impedance device, such as a band translation device. In current mode switching, the low impedance output of the input device is connected to selectively activated high isolation transconductance devices having high input impedances. The outputs of the transconductance devices are connected to low impedance devices that operate as summing nodes.
Abstract:
An N×M crosspoint switch allows a signal from any one of the N inputs to be routed to one or more of the M crosspoint switch outputs. The switches within the crosspoint switch can be configured as voltage mode or current mode switches. In voltage mode switching an input to the crosspoint switch is provided to an input device, such as an amplifier, having a low output impedance. The output of the low impedance device is provided to a switch that connects the output of the low impedance device to a high input impedance device, such as a band translation device. In current mode switching, the low impedance output of the input device is connected to selectively activated high isolation transconductance devices having high input impedances. The outputs of the transconductance devices are connected to low impedance devices that operate as summing nodes.
Abstract:
A direct digital frequency synthesizer having a multi-modulus divider, a numerically controlled oscillator and a programmable delay generator. The multi-modulus divider receives an input clock having an input pulse frequency fosc and outputs some integer fraction of those pulses at an instantaneous frequency fVp that is some integer fraction (1/P) of the input frequency. The multi-modulus divider selects between at least two ratios of P (1/P or 1/P+1) in response to a signal from the numerically controlled oscillator. The numerically controlled oscillator receives a value which is the accumulator increment (i.e. the number of divided pulse edges) required before an overflow occurs that causes the multi-modulus divider to change divider ratios in response to receiving an overflow signal. The numerically controlled oscillator also outputs both the overflow signal and a delay signal to the delay generator that further controls the frequency of the multi-modulus divider output signal (Vp) to provide an output signal (VD) with an fout that has improved phase and timing jitter performance over prior art direct digital frequency synthesizer architectures.