SYSTEM AND METHOD FOR DETECTION AND MEASUREMENT OF INTERFACIAL PROPERTIES IN SINGLE AND MULTILAYER OBJECTS
    1.
    发明申请
    SYSTEM AND METHOD FOR DETECTION AND MEASUREMENT OF INTERFACIAL PROPERTIES IN SINGLE AND MULTILAYER OBJECTS 有权
    用于单层和多层物体界面性质的检测和测量的系统和方法

    公开(公告)号:US20120304756A1

    公开(公告)日:2012-12-06

    申请号:US13501250

    申请日:2010-10-13

    Abstract: A system for determining a material property at an interface between a first layer and a second layer includes a transmitter outputting electromagnetic radiation to the sample, a receiver receiving electromagnetic radiation that was reflected by or transmitted though the sample, and a data acquisition device. The data acquisition device is configured to digitize the electro-magnetic radiation reflected by or transmitted though the sample to yield waveform data, wherein the waveform data represents the radiation reflected by or transmitted though the sample, the waveform data having a first magnitude, a second magnitude and a third magnitude. The material property to be determined is generally the adhesive strength between the first and second layers.

    Abstract translation: 用于确定第一层和第二层之间的界面处的材料属性的系统包括向样品输出电磁辐射的发射器,接收被样品反射或透射的电磁辐射的接收器以及数据采集装置。 数据采集​​装置被配置为数字化由样本反射或透过样本的电磁辐射以产生波形数据,其中波形数据表示由样本反射或透射的辐射,波形数据具有第一幅度,第二幅度 数量级和第三级。 要确定的材料性质通常是第一层和第二层之间的粘合强度。

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