公开(公告)号：US20130063726A1

公开(公告)日：2013-03-14

申请号：US13635276

申请日：2011-03-11

Applicant: Tanya Mary Monro ,  Alexandre Guy Michel Francois ,  Jonathan Boehm

Inventor： Tanya Mary Monro ,  Alexandre Guy Michel Francois ,  Jonathan Boehm

IPC: G01N21/55

CPC classification number: G01N21/648 ,  G01N21/553 ,  G01N21/7703 ,  G01N2201/06193 ,  G02B6/02042 ,  G02B6/02385 ,  G02B6/0239

Abstract: The present disclosure provides a method of characterising a dielectric material. The method comprises the step of providing a light source, a light collector and a sensor. The sensor is arranged so that an evanescent field of light penetrates through a surface of the sensor and surface plasmons are generated at the surface of the sensor when suitable light is directed along at least a portion of the sensor. The method also includes the step of exposing the surface of the sensor to the dielectric material so that an interface is formed between the surface and the dielectric material. Further, the method comprises guiding light along at least a portion of the sensor to generate the surface plasmons. In addition, the method comprises the step of collecting an intensity of light from the interface as a function of a spectral parameter of the light. Further, the present disclosure provides an apparatus for characterising the dielectric material in accordance with the method.

Abstract translation: 本公开提供了表征电介质材料的方法。 该方法包括提供光源，集光器和传感器的步骤。 传感器布置成使得消逝的光线穿过传感器的表面，并且当合适的光沿着传感器的至少一部分被引导时，在传感器的表面处产生表面等离子体激元。 该方法还包括将传感器的表面暴露于介电材料的步骤，使得在表面和电介质材料之间形成界面。 此外，该方法包括沿着传感器的至少一部分引导光以产生表面等离子体激元。 此外，该方法包括作为光的光谱参数的函数从界面收集光强度的步骤。 此外，本公开提供了一种根据该方法表征电介质材料的装置。