公开(公告)号：US20160377423A1

公开(公告)日：2016-12-29

申请号：US15191964

申请日：2016-06-24

Applicant: Hergen Eilers ,  Benjamin Richard Anderson ,  Ray Gunawidjaja ,  Patrick David Price

Inventor： Hergen Eilers ,  Benjamin Richard Anderson ,  Ray Gunawidjaja ,  Patrick David Price

IPC: G01B11/30

CPC classification number: H04L63/08 ,  G01N21/95623 ,  H04L9/00 ,  H04L9/3278

Abstract: Unique methods and systems are introduced herein for the determination of unique spatial light modulator based optical signatures of intrinsic and extrinsic scattering surface markers. These techniques can be used to authenticate semiconductor components and systems at various stages during the manufacturing process by measuring and cross correlating the surface marker's unique optical signature. In addition, these techniques can be used with extrinsic surface markers which are added to existing hardware (e.g. containers, locks, doors, etc.). These markers can then be measured for their unique optical signatures, which can be stored and used at a later time for cross-correlation to authenticate the surface marker and verify the hardware's provenance.

Abstract translation: 本文介绍了独特的方法和系统，用于确定基于独特的空间光调制器的本征和外在散射表面标记的光学特征。 这些技术可用于通过测量和交叉相关表面标记的独特光学特征来在制造过程中在各个阶段对半导体组件和系统进行认证。 此外，这些技术可以与添加到现有硬件（例如，容器，锁，门等））的外在表面标记一起使用。 然后可以测量这些标记物的独特光学特征，其可以在稍后的时间存储和使用以进行互相关以验证表面标记并验证硬件的来源。

公开(公告)号：US09762565B2

公开(公告)日：2017-09-12

申请号：US15191964

申请日：2016-06-24

Applicant: Hergen Eilers ,  Benjamin Richard Anderson ,  Ray Gunawidjaja ,  Patrick David Price

Inventor： Hergen Eilers ,  Benjamin Richard Anderson ,  Ray Gunawidjaja ,  Patrick David Price

IPC: G06K9/74 ,  H04L29/06 ,  H04L9/00 ,  G01N21/956

CPC classification number: H04L63/08 ,  G01N21/95623 ,  H04L9/00 ,  H04L9/3278

Abstract: Unique methods and systems are introduced herein for the determination of unique spatial light modulator based optical signatures of intrinsic and extrinsic scattering surface markers. These techniques can be used to authenticate semiconductor components and systems at various stages during the manufacturing process by measuring and cross correlating the surface marker's unique optical signature. In addition, these techniques can be used with extrinsic surface markers which are added to existing hardware (e.g. containers, locks, doors, etc.). These markers can then be measured for their unique optical signatures, which can be stored and used at a later time for cross-correlation to authenticate the surface marker and verify the hardware's provenance.