Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation
    1.
    发明授权
    Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation 失效
    基于使用椭圆偏振辐射的散射矩阵元素测量来表征粒子的非侵入性方法和装置

    公开(公告)号:US06721051B2

    公开(公告)日:2004-04-13

    申请号:US09956388

    申请日:2001-09-19

    CPC classification number: G01N21/47 G01N15/0211 G01N21/21

    Abstract: A non-intrusive method of characterizing particles through inverse analysis of experimental data based on measurements using elliptically polarized radiation is provided. A database of theoretical absorption and scattering data sets for particles is compiled. Optimum settings for an experimental test to gather an experimental absorption and scattering data set are determined and the experimental test is conducted. The experimental absorption and scattering data set is then compared to the theoretical absorption and scattering data sets of the database of theoretical absorption and scattering data sets in order to determine an absorption and scattering data set which differs the least from the experimental absorption and scattering data set in order to characterize the particles.

    Abstract translation: 提供了一种基于使用椭圆偏振辐射测量的实验数据的反分析来表征粒子的非侵入性方法。 编制了一个理论吸收和散射数据集的数据库。 确定用于采集实验吸收和散射数据集的实验测试的最佳设置,并进行实验测试。 然后将实验吸收和散射数据集与理论吸收和散射数据集的数据库的理论吸收和散射数据集进行比较,以确定与实验吸收和散射数据集最不同的吸收和散射数据集 以表征颗粒。

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