公开(公告)号：US08904228B2

公开(公告)日：2014-12-02

申请号：US13313898

申请日：2011-12-07

Applicant: Stephen Ray Cooper ,  Bryan James Thornley

Inventor： Stephen Ray Cooper ,  Bryan James Thornley

IPC: G06F11/00

CPC classification number: G06F11/1428

Abstract: In accordance with embodiments of the present disclosure, a method may comprise identifying one or more portions of the memory having defects. The method may also include storing one or more addresses in the memory defect list, each of the one or more addresses associated with a portion of the one or more identified portions. The method may further include indicating to components of an information handling system that the one or more identified portions are unusable such that the other components are prevented from allocating and using the one or more identified portions.

Abstract translation: 根据本公开的实施例，方法可以包括识别具有缺陷的存储器的一个或多个部分。 所述方法还可以包括将一个或多个地址存储在所述存储器缺陷列表中，所述一个或多个地址中的每一个与所述一个或多个识别的部分的一部分相关联。 该方法还可以包括向信息处理系统的组件指示所述一个或多个识别的部分不可用，使得其他组件被阻止分配和使用所述一个或多个所识别的部分。

公开(公告)号：US06842867B2

公开(公告)日：2005-01-11

申请号：US09770523

申请日：2001-01-26

Applicant: Stephen Ray Cooper

Inventor： Stephen Ray Cooper

IPC: G06F11/10 ,  G11C29/56 ,  G06F11/00

CPC classification number: G06F11/1052 ,  G11C29/56 ,  G11C2029/5606

Abstract: A method is provided for identifying in a computer system physical memory modules having failing or defective addresses. The transparent error correction function of the computer system is disabled and system memory is tested. If an error is detected, a coded data value that indicative of a single-bit error is written to the failing or defective memory address. The failing or defective memory address is read in and the incorrect data value in the memory address is detected. The address of the failing of defective memory address is recorded and mapped or correlated to a physical memory module.

Abstract translation: 提供了一种在计算机系统中识别具有故障或缺陷地址的物理存储器模块的方法。 计算机系统的透明纠错功能被禁用，系统内存被测试。 如果检测到错误，则将表示单位错误的编码数据值写入故障或缺陷存储器地址。 读出故障或缺陷的存储器地址，并检测存储器地址中的不正确的数据值。 故障存储器地址的故障地址被记录并映射或与物理存储器模块相关联。

公开(公告)号：US20130151890A1

公开(公告)日：2013-06-13

申请号：US13313898

申请日：2011-12-07

Applicant: Stephen Ray Cooper ,  Bryan James Thornley

Inventor： Stephen Ray Cooper ,  Bryan James Thornley

IPC: G06F11/16

CPC classification number: G06F11/1428

Abstract: In accordance with embodiments of the present disclosure, a method may comprise identifying one or more portions of the memory having defects. The method may also include storing one or more addresses in the memory defect list, each of the one or more addresses associated with a portion of the one or more identified portions. The method may further include indicating to components of an information handling system that the one or more identified portions are unusable such that the other components are prevented from allocating and using the one or more identified portions.

Abstract translation: 根据本公开的实施例，方法可以包括识别具有缺陷的存储器的一个或多个部分。 所述方法还可以包括将一个或多个地址存储在所述存储器缺陷列表中，所述一个或多个地址中的每一个与所述一个或多个识别的部分的一部分相关联。 该方法还可以包括向信息处理系统的组件指示所述一个或多个识别的部分不可用，使得其他组件被阻止分配和使用所述一个或多个所识别的部分。