Low profile, current-driven relay for integrated circuit tester
    1.
    发明授权
    Low profile, current-driven relay for integrated circuit tester 失效
    集成电路测试仪的薄型,电流驱动继电器

    公开(公告)号:US06329892B1

    公开(公告)日:2001-12-11

    申请号:US09491080

    申请日:2000-01-20

    Abstract: A relay includes contacts residing within a glass tube. A coil surrounding the tube and a switch are connected in parallel between two terminals of the relay. A current source supplies a current to the coil and switch. When the switch is open, substantially all of the current passes through the coil and the coil produces a sufficient amount of magnetic flux to close the relay's contacts. When the switch closes, it shunts a sufficient amount of the current away from the coil to reduce the magnetic flux it produces below the level needed to keep the contacts closed. The current source is sized so that the coil requires relatively few turns, thereby allowing the relay to be relatively thin. The coil is formed by a conductor embedded in an insulating substrate surrounding the tube.

    Abstract translation: 继电器包括位于玻璃管内的触点。 围绕管的线圈和开关并联在继电器的两个端子之间。 电流源向线圈提供电流并切换。 当开关断开时,基本上所有的电流通过线圈和线圈产生足够的磁通量来闭合继电器的触点。 当开关闭合时,它分流足够量的电流远离线圈,以将其产生的磁通降低到保持触点闭合所需的水平以下。 电流源的尺寸使得线圈需要相对较少的匝数,从而允许继电器相对较薄。 线圈由嵌入围绕管的绝缘基板中的导体形成。

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