公开(公告)号：US20240255441A1

公开(公告)日：2024-08-01

申请号：US18418249

申请日：2024-01-20

Applicant: UTPVISION S.R.L.

Inventor： Roberto Finazzi ,  Sergio Sigala

IPC: G01N21/952 ,  G01M13/005 ,  G01N21/88

CPC classification number: G01N21/952 ,  G01N21/8806 ,  G01M13/005 ,  G01N2201/0634

Abstract: An apparatus for detecting surface defects in objects comprises one or more illuminating devices configured to emit at least a light radiation and illuminate an object to be inspected. The detection apparatus is further configured to measure the light radiation received by the object, and also comprises one or more image acquisition devices configured to acquire one or more images of the object, when illuminated by the illuminating device, and a data processor configured to process the images acquired by the image acquisition device and provide detection data indicative of the presence of surface defects on the object.

公开(公告)号：US20230049391A1

公开(公告)日：2023-02-16

申请号：US17795139

申请日：2021-02-11

Applicant: UTPVISION S.R.L.

Inventor： Roberto Finazzi ,  Sergio Sigala

IPC: G01N21/88 ,  G06T7/00 ,  G06V10/141

Abstract: The present invention relates to a device (1) for detecting surface defects in an object (100), for example an industrial gasket. The detection device comprises lighting means (2) configured to illuminate said object with a first light radiation (L1) having a first lighting direction (D1) or with a second light radiation (L2) having a second lighting direction (D2). According to the invention, the detection device comprises acquisition means (30) configured to acquire a plurality of B/W images of said object, when illuminated by said lighting means.