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1.
公开(公告)号:US08817265B2
公开(公告)日:2014-08-26
申请号:US14043553
申请日:2013-10-01
Applicant: 3M Innovative Properties Company
Inventor: John C. Hulteen , Kiran S. Kanukurthy , Neal A. Rakow , Andrzej F. Rybacha , Richard L. Rylander , Arthur Scheffler , Zeljko Zupanc
CPC classification number: G01N21/55 , B33Y80/00 , G01N21/274 , G01N21/783 , G01N21/8483 , G01N2021/3155
Abstract: Herein are disclosed optoelectronic methods and devices for detecting the presence of an analyte. Such methods and devices may comprise at least one sensing element that is responsive to the presence of an analyte of interest and that may be interrogated optically by the use of at least one light source and at least one light detector.
Abstract translation: 本文公开了用于检测分析物的存在的光电子方法和装置。 这样的方法和装置可以包括响应于感兴趣的分析物的存在并且可以通过使用至少一个光源和至少一个光检测器来光学询问的至少一个感测元件。
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2.
公开(公告)号:US20140036270A1
公开(公告)日:2014-02-06
申请号:US14043553
申请日:2013-10-01
Applicant: 3M INNOVATIVE PROPERTIES COMPANY
Inventor: John C. Hulteen , Kiran S. Kanukurthy , Neal A. Rakow , Andrzej F. Rybacha , Richard L. Rylander , Arthur Scheffler , Zeljko Zupanc
IPC: G01N21/55
CPC classification number: G01N21/55 , B33Y80/00 , G01N21/274 , G01N21/783 , G01N21/8483 , G01N2021/3155
Abstract: Herein are disclosed optoelectronic methods and devices for detecting the presence of an analyte. Such methods and devices may comprise at least one sensing element that is responsive to the presence of an analyte of interest and that may be interrogated optically by the use of at least one light source and at least one light detector.
Abstract translation: 本文公开了用于检测分析物的存在的光电子方法和装置。 这样的方法和装置可以包括响应于感兴趣的分析物的存在并且可以通过使用至少一个光源和至少一个光检测器来光学询问的至少一个感测元件。
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