公开(公告)号：US11836036B2

公开(公告)日：2023-12-05

申请号：US17439020

申请日：2020-03-09

Applicant: ABB Schweiz AG

Inventor： Abhilash Gopalakrishnan ,  Jithin Kizhakey Putanvetil ,  Manigandan P ,  Arinjai Gupta ,  Martin Nykvist

IPC: G06F11/00 ,  G06F11/07 ,  G06F11/30 ,  G06F18/2415

CPC classification number: G06F11/079 ,  G06F11/0772 ,  G06F11/3006 ,  G06F18/24155

Abstract: A method for detecting a fault in an intelligent electronic device that includes components uses a Bayesian network. The method includes detecting a failure event in the components, obtaining a first list of cause of failures in the component using a fault tree model, computing probability of the cause of failures to obtain a second list of probable causes of failure by monitoring of information about the elements identified in the first list, identifying a root cause of failure associated with the element comprised in the component using the Bayesian network based on the second list, and initiating a function. The function may be one of restarting the element having the root cause of failure, a filtering operation for input data provided to that element; and providing an alert in the human machine interface associated with the intelligent electronic device.

公开(公告)号：US20220147410A1

公开(公告)日：2022-05-12

申请号：US17439020

申请日：2020-03-09

Applicant: ABB Schweiz AG

Inventor： Abhilash Gopalakrishnan ,  Jithin Kizhakey Putanvetil ,  Manigandan P ,  Arinjai Gupta ,  Martin Nykvist

IPC: G06F11/07 ,  G06F11/30 ,  G06K9/62

Abstract: A method for detecting a fault in an intelligent electronic device that includes components uses a Bayesian network. The method includes detecting a failure event in the components, obtaining a first list of cause of failures in the component using a fault tree model, computing probability of the cause of failures to obtain a second list of probable causes of failure by monitoring of information about the elements identified in the first list, identifying a root cause of failure associated with the element comprised in the component using the Bayesian network based on the second list, and initiating a function. The function may be one of restarting the element having the root cause of failure, a filtering operation for input data provided to that element; and providing an alert in the human machine interface associated with the intelligent electronic device.